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Collection
Resource type
Journal article(10)
Keyword
dislocation (10)
ELO (5)
HVPE (5)
α-Ga2O3 (5)
Ga2O3 (3)
InGaN (1)
Silicon (1)
atom probe tomography (1)
etching (1)
network analysis (1)
(more)
License
In Copyright (4)
Creative Commons BY Attribution 4.0 International (3)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (2)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/pdf (10)
File type: application/pdf
Keyword: dislocation
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10 records found.
Dislocation cluster generation behavior in multicrystalline silicon investigated using twin network analysis
Journal article
Creator
Kazuma Torii
(author) (
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)
a Graduate School of Engineering, Nagoya University
Kazuma Torii
;
Takuto Kojima
(author) (
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)
Takuto Kojima
;
Kentaro Kutsukake
(author) (
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)
Kentaro Kutsukake
;
Hiroaki Kudo
(author) (
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)
Hiroaki Kudo
;
Noritaka Usami
(author) (
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)
Noritaka Usami
Keyword
Silicon
,
dislocation
,
twin grain boundary
,
network analysis
Date published
2025-12-31
Updated at
2025-07-16 16:14:54 +0900
Epitaxial Lateral Overgrowth of c-plane α-Ga2O3 using a stripe mask with ultra-narrow windows
Journal article
Creator
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
Research Center for Electronic and Optical Materials/Functional Materials Field/Ultra-wide Bandgap Semiconductors Group, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Takashi Shinohe
(author) (
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)
FLOSFIA INC.
Takashi Shinohe
Keyword
Ga2O3
,
dislocation
,
HVPE
,
ELO
Date published
2025-05-19
Updated at
2025-05-21 16:30:09 +0900
Epitaxial lateral overgrowth of
m
-plane α-Ga
2
O
3
by halide vapor phase epitaxy
Journal article
Creator
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Takashi Shinohe
(author) (
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)
https://orcid.org/0009-0000-5559-1432
(unauthenticated)
Takashi Shinohe
Keyword
Ga2O3
,
dislocation
,
ELO
,
HVPE
Date published
2025-12-31
Updated at
2025-04-23 12:30:12 +0900
Luminescence properties of dislocations in α-Ga
2
O
3
Journal article
Creator
Mugove Maruzane
(author) (
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)
https://orcid.org/0009-0004-9207-0424
(unauthenticated)
Mugove Maruzane
;
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Olha Makydonska
(author) (
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)
https://orcid.org/0009-0008-5562-2137
(unauthenticated)
Olha Makydonska
;
Paul R Edwards
(author) (
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)
https://orcid.org/0000-0001-7671-7698
(unauthenticated)
Paul R Edwards
;
Robert W Martin
(author) (
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)
https://orcid.org/0000-0002-6119-764X
(unauthenticated)
Robert W Martin
;
Fabien C-P Massabuau
(author) (
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)
https://orcid.org/0000-0003-1008-1652
(unauthenticated)
Fabien C-P Massabuau
Keyword
Ga2O3
,
dislocation
Date published
2025-01-20
Updated at
2024-11-13 08:31:40 +0900
Elimination of threading dislocations in α-Ga2O3 by double layered epitaxial lateral overgrowth
Journal article
Creator
Katsuaki Kawara
(author) (
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)
Katsuaki Kawara
;
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Mitsuru Okigawa
(author) (
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)
Mitsuru Okigawa
;
Takashi Shinohe
(author) (
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)
Takashi Shinohe
Keyword
α-Ga2O3
,
dislocation
,
ELO
Date published
2020-07-01
Updated at
2024-01-22 09:40:04 +0900
Visualization of threading dislocations in an α-Ga2O3 epilayer by HCl gas etching
Journal article
Creator
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Shingo Yagyu
(author) (
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)
Shingo Yagyu
;
Takashi Shinohe
(author) (
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)
Takashi Shinohe
Keyword
α-Ga2O3
,
dislocation
,
etching
Date published
2021-10-19
Updated at
2024-01-22 09:38:31 +0900
Epitaxial lateral overgrowth of r-plane α-Ga2O3 with stripe masks along -12-10>
Journal article
Creator
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Shingo Yagyu
(author) (
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)
Shingo Yagyu
;
Takashi Shinohe
(author) (
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)
Takashi Shinohe
Keyword
α-Ga2O3
,
HVPE
,
dislocation
,
ELO
Date published
2021-11-07
Updated at
2024-01-30 16:49:49 +0900
Reduction of dislocation density in α-Ga2O3 epilayers via rapid growth at low temperatures by halide vapor phase epitaxy
Journal article
Creator
Yuichi Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yuichi Oshima
;
Hiroyuki Ando
(author) (
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)
Hiroyuki Ando
;
Takashi Shinohe
(author) (
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)
Takashi Shinohe
Keyword
α-Ga2O3
,
dislocation
,
HVPE
Date published
2023-06-01
Updated at
2024-06-23 08:30:11 +0900
Epitaxial lateral overgrowth of α-Ga2O3 by halide vapor phase epitaxy
Journal article
Creator
Y. Oshima
(author) (
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)
https://orcid.org/0000-0001-8293-4891
NIMS Researchers Directory SAMURAI
Y. Oshima
;
K. Kawara
(author) (
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)
K. Kawara
;
T. Shinohe
(author) (
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)
T. Shinohe
;
T. Hitora
(author) (
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)
T. Hitora
;
M. Kasu
(author) (
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)
M. Kasu
;
S. Fujita
(author) (
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)
S. Fujita
Keyword
α-Ga2O3
,
HVPE
,
ELO
,
dislocation
Date published
2019-02-01
Updated at
2024-01-29 16:48:15 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
Journal article
Creator
Yudai Yamaguchi
(author) (
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)
Yudai Yamaguchi
;
Yuya Kanitani
(author) (
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)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
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)
Yoshihiro Kudo
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Shigetaka Tomiya
(author) (
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)
Shigetaka Tomiya
Keyword
InGaN
,
dislocation
,
pipe diffusion
,
atom probe tomography
,
transmission electron microscopy
Date published
2022-09-14
Updated at
2024-01-05 22:12:51 +0900
Keyword
dislocation
(10)
ELO
(5)
HVPE
(5)
α-Ga2O3
(5)
Ga2O3
(3)
InGaN
(1)
Silicon
(1)
atom probe tomography
(1)
etching
(1)
network analysis
(1)
pipe diffusion
(1)
transmission electron microscopy
(1)
twin grain boundary
(1)
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