4 件のレコードが見つかりました。

031101_1_5.0178995.pdf
Local defect and mid-gap state analysis of GaN using monochromated EELS combined with nanodiffraction and atomic-resolution imaging
ジャーナル論文
著者
Shunsuke Yamashita (author) (この著者で検索)
ORCID ;
Sei Fukushima (author) (この著者で検索)
;
Jun Kikkawa (author) (この著者で検索)
National Institute for Materials Science (NIMS) Center for Basic Research on Materials
ORCID SAMURAI ;
Ryoji Arai (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
ORCID ;
Koji Kimoto (author) (この著者で検索)
National Institute for Materials Science (NIMS) Center for Basic Research on Materials
ORCID SAMURAI ;
Yoshihiro Kudo (author) (この著者で検索)
キーワード
defect, GaN, EELS, 4D-STEM, HAADF-STEM, ABF-STEM, HAXPES
刊行年月日
2024-03-01
更新時刻
2024-03-19 16:56:29 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
ジャーナル論文
著者
Yudai Yamaguchi (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
;
Yoshihiro Kudo (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shigetaka Tomiya (author) (この著者で検索)
キーワード
InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
刊行年月日
2022-09-14
更新時刻
2024-01-05 22:12:51 +0900
HR-EELS2_revised.pdf
Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis
ジャーナル論文
著者
Shunsuke Yamashita (author) (この著者で検索)
Sony Semiconductor Solutions Corporation
;
Jun Kikkawa (author) (この著者で検索)
National Institute for Materials Science Center for Basic Research on Materials/Advanced Materials Characterization Field/Electron Microscopy Group
ORCID SAMURAI ;
Susumu Kusanagi (author) (この著者で検索)
Sony Semiconductor Solutions Corporation
;
Ichiro Nomachi (author) (この著者で検索)
Sony Semiconductor Solutions Corporation
;
Ryoji Arai (author) (この著者で検索)
Sony Semiconductor Solutions Corporation
;
Yuya Kanitani (author) (この著者で検索)
Sony Semiconductor Solutions Corporation
;
Koji Kimoto (author) (この著者で検索)
National Institute for Materials Science Center for Basic Research on Materials
ORCID SAMURAI ;
Yoshihiro Kudo (author) (この著者で検索)
Sony Semiconductor Solutions Corporation
キーワード
Limit of detection, Detection threshold, Physical analysis, Gallium nitride, Valence electron energy loss spectroscopy (VEELS), Low-loss spectrum
刊行年月日
2026-01-01
更新時刻
2026-04-30 12:01:11 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs-InGaAlAs Quantum Dots.pdf
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
ジャーナル論文
著者
Yudai Yamaguchi (author) (この著者で検索)
;
Yuta Inaba (author) (この著者で検索)
;
Ryoji Arai (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
;
Yoshihiro Kudo (author) (この著者で検索)
;
Michinori Shiomi (author) (この著者で検索)
;
Daiji Kasahara (author) (この著者で検索)
;
Mikihiro Yokozeki (author) (この著者で検索)
;
Noriyuki Fuutagawa (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kouichi Akahane (author) (この著者で検索)
;
Naokatsu Yamamoto (author) (この著者で検索)
;
Shigetaka Tomiya (author) (この著者で検索)
キーワード
quantum dot, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-11
更新時刻
2025-04-14 16:30:23 +0900
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