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論文・データセット
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資源タイプ
ジャーナル論文(16)
キーワード
atom probe tomography (16)
transmission electron microscopy (7)
gallium nitride (5)
cathodoluminescence (2)
focused ion beam (2)
scanning electron microscopy (2)
Corson alloy (1)
InGaN (1)
automation (1)
dislocation (1)
(more)
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application/pdf (16)
ファイル種別: application/pdf
資源タイプ: ジャーナル論文
キーワード: atom probe tomography
全ての絞り込みを解除
16 件のレコードが見つかりました。
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
ジャーナル論文
著者
Kosuke Ishikawa
(author) (
この著者で検索
)
Kosuke Ishikawa
;
Emi Kano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Kensuke Sumida
(author) (
この著者で検索
)
Kensuke Sumida
;
Tetsuo Narita
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
Tetsuo Narita
;
Masahiro Horita
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
Masahiro Horita
;
Junya Sahashi
(author) (
この著者で検索
)
Junya Sahashi
;
Shun Lu
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
Shun Lu
;
Jun Suda
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
Jun Suda
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
刊行年月日
2026-06-22
更新時刻
2026-06-25 09:46:49 +0900
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析
ジャーナル論文
著者
佐々木 宏和
(author) (
この著者で検索
)
古河電気工業株式会社
佐々木 宏和
;
大場 洋次郎
(author) (
この著者で検索
)
豊橋技術科学大学
大場 洋次郎
;
廣井 孝介
(author) (
この著者で検索
)
日本原子力研究開発機構
廣井 孝介
;
大沼 正人
(author) (
この著者で検索
)
北海道大学
大沼 正人
;
埋橋 淳
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
埋橋 淳
;
大久保 忠勝
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
大久保 忠勝
キーワード
atom probe tomography
刊行年月日
更新時刻
2025-11-28 16:30:03 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
ジャーナル論文
著者
Shozo Hiramoto
(author) (
この著者で検索
)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
Shozo Hiramoto
;
Satoshi Okamoto
(author) (
この著者で検索
)
Satoshi Okamoto
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Akihiko Toda
(author) (
この著者で検索
)
Akihiko Toda
;
Sangwook Kim
(author) (
この著者で検索
)
Sangwook Kim
;
Chikako Moriyoshi
(author) (
この著者で検索
)
Chikako Moriyoshi
;
Yoshihiro Kuroiwa
(author) (
この著者で検索
)
Yoshihiro Kuroiwa
キーワード
atom probe tomography
,
transmission electron microscopy
,
nanocrystalline soft magnetic material
刊行年月日
2025-02-10
更新時刻
2026-02-11 08:30:29 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
ジャーナル論文
著者
Hirokazu Sasaki
(author) (
この著者で検索
)
Hirokazu Sasaki
;
Syunta Akiya
(author) (
この著者で検索
)
Syunta Akiya
;
Kuniteru Mihara
(author) (
この著者で検索
)
Kuniteru Mihara
;
Yojiro Oba
(author) (
この著者で検索
)
Yojiro Oba
;
Masato Onuma
(author) (
この著者で検索
)
Masato Onuma
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
キーワード
atom probe tomography
刊行年月日
2025-01-01
更新時刻
2025-01-08 16:31:18 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
ジャーナル論文
著者
Simon Moore
(author) (
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)
Simon Moore
;
Mari Takahashi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
Mari Takahashi
;
Philipp Sauerschnig
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
Philipp Sauerschnig
;
Keiji Kobayashi
(author) (
この著者で検索
)
Keiji Kobayashi
;
Koichi Higashimine
(author) (
この著者で検索
)
Koichi Higashimine
;
Masanobu Miyata
(author) (
この著者で検索
)
Masanobu Miyata
;
Takahiro Baba
(author) (
この著者で検索
)
Takahiro Baba
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Michihiro Ohta
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
Michihiro Ohta
;
Takao Mori
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2682-1846
NIMS Researchers Directory SAMURAI
Takao Mori
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shinya Maenosono
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
Shinya Maenosono
キーワード
thermoelectric materials
,
electron microscopy
,
atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
ジャーナル論文
著者
Yudai Yamaguchi
(author) (
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)
Yudai Yamaguchi
;
Yuta Inaba
(author) (
この著者で検索
)
Yuta Inaba
;
Ryoji Arai
(author) (
この著者で検索
)
Ryoji Arai
;
Yuya Kanitani
(author) (
この著者で検索
)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
この著者で検索
)
Yoshihiro Kudo
;
Michinori Shiomi
(author) (
この著者で検索
)
Michinori Shiomi
;
Daiji Kasahara
(author) (
この著者で検索
)
Daiji Kasahara
;
Mikihiro Yokozeki
(author) (
この著者で検索
)
Mikihiro Yokozeki
;
Noriyuki Fuutagawa
(author) (
この著者で検索
)
Noriyuki Fuutagawa
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Kouichi Akahane
(author) (
この著者で検索
)
Kouichi Akahane
;
Naokatsu Yamamoto
(author) (
この著者で検索
)
Naokatsu Yamamoto
;
Shigetaka Tomiya
(author) (
この著者で検索
)
Shigetaka Tomiya
キーワード
quantum dot
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-11
更新時刻
2025-04-14 16:30:23 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Koki Kobayashi
(author) (
この著者で検索
)
Koki Kobayashi
;
Kosuke Ishikawa
(author) (
この著者で検索
)
Kosuke Ishikawa
;
Kyosuke Sawabe
(author) (
この著者で検索
)
Kyosuke Sawabe
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ryo Tanaka
(author) (
この著者で検索
)
Fuji Electric Corporation
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Fuji Electric Corporation
Shinya Takashima
;
Masaharu Edo
(author) (
この著者で検索
)
Fuji Electric Corporation
Masaharu Edo
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Takashi Sekiguchi
(author) (
この著者で検索
)
University of Tsukuba
Takashi Sekiguchi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Claudia Fleischmann
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
Claudia Fleischmann
;
Jean-Philippe Soulié
(author) (
この著者で検索
)
Jean-Philippe Soulié
;
Mustafa Ayyad
(author) (
この著者で検索
)
Mustafa Ayyad
;
Jeroen E. Scheerder
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
Jeroen E. Scheerder
;
Christoph Adelmann
(author) (
この著者で検索
)
Christoph Adelmann
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Koji Michishio
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
Koji Michishio
;
Nagayasu Oshima
(author) (
この著者で検索
)
Nagayasu Oshima
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
キーワード
atom probe tomography
,
positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
キーワード
atom probe tomography
,
focused ion beam
,
scanning electron microscopy
刊行年月日
2025-02-03
更新時刻
2024-09-05 08:30:18 +0900
キーワード
atom probe tomography
(16)
transmission electron microscopy
(7)
gallium nitride
(5)
cathodoluminescence
(2)
focused ion beam
(2)
scanning electron microscopy
(2)
Corson alloy
(1)
InGaN
(1)
automation
(1)
dislocation
(1)
electron microscopy
(1)
implantation
(1)
nanocrystalline soft magnetic material
(1)
pipe diffusion
(1)
positron annihilation
(1)
quantum dot
(1)
scanning transmission electron microscopy
(1)
thermoelectric materials
(1)
RDEメタデータ定義
RDE送り状
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1
2
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