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ジャーナル論文(15)
プロシーディングス論文(1)
キーワード
atom probe tomography (16)
transmission electron microscopy (7)
gallium nitride (6)
cathodoluminescence (2)
focused ion beam (2)
scanning electron microscopy (2)
InGaN (1)
automation (1)
deformation (1)
dislocation (1)
(more)
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キーワード: atom probe tomography
全ての絞り込みを解除
16 件のレコードが見つかりました。
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
ジャーナル論文
著者
Kosuke Ishikawa
(author) (
この著者で検索
)
Kosuke Ishikawa
;
Emi Kano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Kensuke Sumida
(author) (
この著者で検索
)
Kensuke Sumida
;
Tetsuo Narita
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
Tetsuo Narita
;
Masahiro Horita
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
Masahiro Horita
;
Junya Sahashi
(author) (
この著者で検索
)
Junya Sahashi
;
Shun Lu
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
Shun Lu
;
Jun Suda
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
Jun Suda
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
刊行年月日
2026-06-22
更新時刻
2026-06-25 09:46:49 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ryo Tanaka
(author) (
この著者で検索
)
Fuji Electric Corporation
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Fuji Electric Corporation
Shinya Takashima
;
Masaharu Edo
(author) (
この著者で検索
)
Fuji Electric Corporation
Masaharu Edo
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Takashi Sekiguchi
(author) (
この著者で検索
)
University of Tsukuba
Takashi Sekiguchi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ashutosh Kumar
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
Ashutosh Kumar
;
Wei Yi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
Wei Yi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Ryo Tanaka
(author) (
この著者で検索
)
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Shinya Takashima
;
Masaharu Edo
(author) (
この著者で検索
)
Masaharu Edo
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Hideki Sakurai
(author) (
この著者で検索
)
Hideki Sakurai
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Takashi Sekiguchi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
Takashi Sekiguchi
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
キーワード
gallium nitride
,
implantation
,
atom probe tomography
,
cathodoluminescence
,
scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
ジャーナル論文
著者
Emi Kano
(author) (
この著者で検索
)
Emi Kano
;
Keita Kataoka
(author) (
この著者で検索
)
Keita Kataoka
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Kenta Chokawa
(author) (
この著者で検索
)
Kenta Chokawa
;
Hideki Sakurai
(author) (
この著者で検索
)
Hideki Sakurai
;
Akira Uedono
(author) (
この著者で検索
)
Akira Uedono
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Ritsuo Otsuki
(author) (
この著者で検索
)
Ritsuo Otsuki
;
Koki Kobayashi
(author) (
この著者で検索
)
Koki Kobayashi
;
Yuta Itoh
(author) (
この著者で検索
)
Yuta Itoh
;
Masahiro Nagao
(author) (
この著者で検索
)
Masahiro Nagao
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Jun Suda
(author) (
この著者で検索
)
Jun Suda
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
transmission electron microscopy
,
atom probe tomography
刊行年月日
2022-08-14
更新時刻
2024-01-05 22:13:58 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
ジャーナル論文
著者
Yudai Yamaguchi
(author) (
この著者で検索
)
Yudai Yamaguchi
;
Yuta Inaba
(author) (
この著者で検索
)
Yuta Inaba
;
Ryoji Arai
(author) (
この著者で検索
)
Ryoji Arai
;
Yuya Kanitani
(author) (
この著者で検索
)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
この著者で検索
)
Yoshihiro Kudo
;
Michinori Shiomi
(author) (
この著者で検索
)
Michinori Shiomi
;
Daiji Kasahara
(author) (
この著者で検索
)
Daiji Kasahara
;
Mikihiro Yokozeki
(author) (
この著者で検索
)
Mikihiro Yokozeki
;
Noriyuki Fuutagawa
(author) (
この著者で検索
)
Noriyuki Fuutagawa
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Kouichi Akahane
(author) (
この著者で検索
)
Kouichi Akahane
;
Naokatsu Yamamoto
(author) (
この著者で検索
)
Naokatsu Yamamoto
;
Shigetaka Tomiya
(author) (
この著者で検索
)
Shigetaka Tomiya
キーワード
quantum dot
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-11
更新時刻
2025-04-14 16:30:23 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Koki Kobayashi
(author) (
この著者で検索
)
Koki Kobayashi
;
Kosuke Ishikawa
(author) (
この著者で検索
)
Kosuke Ishikawa
;
Kyosuke Sawabe
(author) (
この著者で検索
)
Kyosuke Sawabe
;
Tetsuo Narita
(author) (
この著者で検索
)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
ジャーナル論文
著者
Simon Moore
(author) (
この著者で検索
)
Simon Moore
;
Mari Takahashi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
Mari Takahashi
;
Philipp Sauerschnig
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
Philipp Sauerschnig
;
Keiji Kobayashi
(author) (
この著者で検索
)
Keiji Kobayashi
;
Koichi Higashimine
(author) (
この著者で検索
)
Koichi Higashimine
;
Masanobu Miyata
(author) (
この著者で検索
)
Masanobu Miyata
;
Takahiro Baba
(author) (
この著者で検索
)
Takahiro Baba
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Michihiro Ohta
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
Michihiro Ohta
;
Takao Mori
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2682-1846
NIMS Researchers Directory SAMURAI
Takao Mori
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shinya Maenosono
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
Shinya Maenosono
キーワード
thermoelectric materials
,
electron microscopy
,
atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Claudia Fleischmann
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
Claudia Fleischmann
;
Jean-Philippe Soulié
(author) (
この著者で検索
)
Jean-Philippe Soulié
;
Mustafa Ayyad
(author) (
この著者で検索
)
Mustafa Ayyad
;
Jeroen E. Scheerder
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
Jeroen E. Scheerder
;
Christoph Adelmann
(author) (
この著者で検索
)
Christoph Adelmann
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Koji Michishio
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
Koji Michishio
;
Nagayasu Oshima
(author) (
この著者で検索
)
Nagayasu Oshima
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
キーワード
atom probe tomography
,
positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
ジャーナル論文
著者
Yudai Yamaguchi
(author) (
この著者で検索
)
Yudai Yamaguchi
;
Yuya Kanitani
(author) (
この著者で検索
)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
この著者で検索
)
Yoshihiro Kudo
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Shigetaka Tomiya
(author) (
この著者で検索
)
Shigetaka Tomiya
キーワード
InGaN
,
dislocation
,
pipe diffusion
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2022-09-14
更新時刻
2024-01-05 22:12:51 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
ジャーナル論文
著者
Shozo Hiramoto
(author) (
この著者で検索
)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
Shozo Hiramoto
;
Satoshi Okamoto
(author) (
この著者で検索
)
Satoshi Okamoto
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Akihiko Toda
(author) (
この著者で検索
)
Akihiko Toda
;
Sangwook Kim
(author) (
この著者で検索
)
Sangwook Kim
;
Chikako Moriyoshi
(author) (
この著者で検索
)
Chikako Moriyoshi
;
Yoshihiro Kuroiwa
(author) (
この著者で検索
)
Yoshihiro Kuroiwa
キーワード
atom probe tomography
,
transmission electron microscopy
,
nanocrystalline soft magnetic material
刊行年月日
2025-02-10
更新時刻
2026-02-11 08:30:29 +0900
キーワード
atom probe tomography
(16)
transmission electron microscopy
(7)
gallium nitride
(6)
cathodoluminescence
(2)
focused ion beam
(2)
scanning electron microscopy
(2)
InGaN
(1)
automation
(1)
deformation
(1)
dislocation
(1)
electron microscopy
(1)
hydrogen
(1)
implantation
(1)
nanocrystalline soft magnetic material
(1)
pearlitic steel
(1)
pipe diffusion
(1)
positron annihilation
(1)
quantum dot
(1)
scanning transmission electron microscopy
(1)
thermoelectric materials
(1)
trapping site
(1)
RDEメタデータ定義
RDE送り状
<
1
2
>