Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation

ジャーナル論文

著者

Emi Kano (author) (この著者で検索)

Emi Kano ;

Keita Kataoka (author) (この著者で検索)

Keita Kataoka ;

Jun Uzuhashi (author) (この著者で検索)

https://orcid.org/0000-0003-2023-8158

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Jun Uzuhashi ;

Kenta Chokawa (author) (この著者で検索)

Kenta Chokawa ;

Hideki Sakurai (author) (この著者で検索)

Hideki Sakurai ;

Akira Uedono (author) (この著者で検索)

Akira Uedono ;

Tetsuo Narita (author) (この著者で検索)

Tetsuo Narita ;

Kacper Sierakowski (author) (この著者で検索)

Kacper Sierakowski ;

Michal Bockowski (author) (この著者で検索)

Michal Bockowski ;

Ritsuo Otsuki (author) (この著者で検索)

Ritsuo Otsuki ;

Koki Kobayashi (author) (この著者で検索)

Koki Kobayashi ;

Yuta Itoh (author) (この著者で検索)

Yuta Itoh ;

Masahiro Nagao (author) (この著者で検索)

Masahiro Nagao ;

Tadakatsu Ohkubo (author) (この著者で検索)

https://orcid.org/0000-0003-3548-1951

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Tadakatsu Ohkubo ;

Kazuhiro Hono (author) (この著者で検索)

https://orcid.org/0000-0001-7367-0193

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kazuhiro Hono ;

Jun Suda (author) (この著者で検索)

Jun Suda ;

Tetsu Kachi (author) (この著者で検索)

Tetsu Kachi ;

Nobuyuki Ikarashi (author) (この著者で検索)

Nobuyuki Ikarashi

キーワード

gallium nitride, transmission electron microscopy, atom probe tomography

刊行年月日

2022-08-14

更新時刻

2024-01-05 22:13:58 +0900