キーワード: transmission electron microscopy
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23 件のレコードが見つかりました。

X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中のδNi2Si析出相の解析.pdf
X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析
ジャーナル論文
著者
佐々木 宏和 (author) (この著者で検索)
古河電気工業株式会社
;
秋谷 俊太 (author) (この著者で検索)
古河電気工業株式会社
;
三原 邦照 (author) (この著者で検索)
古河電気工業株式会社
;
大場 洋次郎 (author) (この著者で検索)
豊橋技術科学大学
;
大沼 正人 (author) (この著者で検索)
北海道大学
; ORCID SAMURAI ; ORCID SAMURAI
キーワード
atom probe tomography, transmission electron microscopy, Corson alloy
刊行年月日
更新時刻
2024-01-30 09:51:05 +0900
Impact of GdOx insertion on magnetic anisotropy and damping in double-barrier magnetic stacks.pdf
Impact of GdOx insertion on magnetic anisotropy and damping in double-barrier magnetic stacks
ジャーナル論文
著者
Junyeon Kim (author) (この著者で検索)
ORCID ;
Takayuki Nozaki (author) (この著者で検索)
ORCID ; ORCID SAMURAI ;
Shingo Tamaru (author) (この著者で検索)
ORCID ;
Tomohiro Ichinose (author) (この著者で検索)
ORCID ;
Takao Ochiai (author) (この著者で検索)
ORCID ;
Tatsuya Yamamoto (author) (この著者で検索)
ORCID ; ORCID SAMURAI ;
Kay Yakushiji (author) (この著者で検索)
ORCID ;
Shinji Yuasa (author) (この著者で検索)
ORCID
キーワード
transmission electron microscopy
刊行年月日
2025-03-01
更新時刻
2025-03-04 16:30:37 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
ジャーナル論文
著者
Yudai Yamaguchi (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
;
Yoshihiro Kudo (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shigetaka Tomiya (author) (この著者で検索)
キーワード
InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
刊行年月日
2022-09-14
更新時刻
2024-01-05 22:12:51 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs.pdf
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス論文
著者
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Katsunori Ueno (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Masahiro Horita (author) (この著者で検索)
Nagoya Univ.
;
Jun Suda (author) (この著者で検索)
Nagoya Univ.
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Co., Ltd.
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
ORCID ;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Koki Kobayashi (author) (この著者で検索)
;
Kosuke Ishikawa (author) (この著者で検索)
;
Kyosuke Sawabe (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
ORCID
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
s41467-024-45934-4.pdf
Latent ion tracks were finally observed in diamond
ジャーナル論文
著者
H. Amekura (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
A. Chettah (author) (この著者で検索)
ORCID ;
K. Narumi (author) (この著者で検索)
ORCID ;
A. Chiba (author) (この著者で検索)
;
Y. Hirano (author) (この著者で検索)
;
K. Yamada (author) (この著者で検索)
;
S. Yamamoto (author) (この著者で検索)
;
A. A. Leino (author) (この著者で検索)
ORCID ;
F. Djurabekova (author) (この著者で検索)
ORCID ;
K. Nordlund (author) (この著者で検索)
ORCID ;
N. Ishikawa (author) (この著者で検索)
;
N. Okubo (author) (この著者で検索)
;
Y. Saitoh (author) (この著者で検索)
キーワード
ion track, diamond, C60 ion, transmission electron microscopy, velocity effect
刊行年月日
2024-02-27
更新時刻
2024-03-04 16:30:07 +0900
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier.pdf
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier
ジャーナル論文
著者
Tatsuya Yamamoto (author) (この著者で検索)
;
Tomohiro Ichinose (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Takayuki Nozaki (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kay Yakushiji (author) (この著者で検索)
;
Shingo Tamaru (author) (この著者で検索)
;
Hitoshi Kubota (author) (この著者で検索)
;
Shinji Yuasa (author) (この著者で検索)
キーワード
transmission electron microscopy
刊行年月日
2024-02-09
更新時刻
2026-02-09 12:30:04 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Systematic study of FIB-induced damage for the high-quality TEM sample preparation.pdf
Systematic study of FIB-induced damage for the high-quality TEM sample preparation
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
focused ion beam, transmission electron microscopy
刊行年月日
2024-04-26
更新時刻
2024-05-07 15:32:35 +0900
Small - 2024 - Liu - Grinding‐Induced Water Solubility Exhibited by Mechanochromic Luminescent Supramolecular Fibers.pdf
Grinding‐Induced Water Solubility Exhibited by Mechanochromic Luminescent Supramolecular Fibers
ジャーナル論文
著者
Qiming Liu (author) (この著者で検索)
;
Tianyue Zhang (author) (この著者で検索)
;
Yuka Ikemoto (author) (この著者で検索)
;
Yudai Shinozaki (author) (この著者で検索)
;
Go Watanabe (author) (この著者で検索)
;
Yuta Hori (author) (この著者で検索)
;
Yasuteru Shigeta (author) (この著者で検索)
;
Takemi Midorikawa (author) (この著者で検索)
;
Koji Harano (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Yoshimitsu Sagara (author) (この著者で検索)
キーワード
supramolecular polymers, mechanochromic luminescence, grind-induced water solubility, atomic force microscopy, transmission electron microscopy
刊行年月日
2024-03-10
更新時刻
2024-08-19 16:30:14 +0900