論文・データセット - MDR: NIMS Materials Data Repository

キーワード: atom probe tomography

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18 件のレコードが見つかりました。

An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf

An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy

論文
著者: Jun Uzuhashi ; Tadakatsu Ohkubo ; Kazuhiro Hono
キーワード: atom probe tomography, focused ion beam, scanning electron microscopy
刊行年月日: 2025-02-03
更新時刻: 2024-09-05 08:30:18 +0900

Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials.pdf

Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials

論文
著者: Yohei Nomura ; Jun Uzuhashi ; Tatsuya Tomita ; Toru Takahashi ; Hidenori Kuwata ; Taichi Abe ; Tadakatsu Ohkubo ; Kazuhiro Hono
キーワード: atom probe tomography
刊行年月日: 2020-11-06
更新時刻: 2024-04-05 10:56:21 +0900

Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs.pdf

Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs

プロシーディングス
著者: Ryo Tanaka ; Shinya Takashima ; Katsunori Ueno ; Masahiro Horita ; Jun Suda ; Jun Uzuhashi ; Tadakatsu Ohkubo ; Masaharu Edo
キーワード: gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日: 2023-06-08
更新時刻: 2024-04-19 12:30:23 +0900

X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中のδNi2Si析出相の解析.pdf

X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析

論文
著者: 佐々木宏和 ; 秋谷俊太 ; 三原邦照 ; 大場洋次郎 ; 大沼正人 ; 埋橋淳 ; 大久保忠勝
キーワード: atom probe tomography, transmission electron microscopy, Corson alloy
刊行年月日
更新時刻: 2024-01-30 09:51:05 +0900

Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf

Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation

論文
著者: Emi Kano ; Keita Kataoka ; Jun Uzuhashi ; Kenta Chokawa ; Hideki Sakurai ; Akira Uedono ; Tetsuo Narita ; Kacper Sierakowski ; Michal Bockowski ; Ritsuo Otsuki ; Koki Kobayashi ; Yuta Itoh ; Masahiro Nagao ; Tadakatsu Ohkubo ; Kazuhiro Hono ; Jun Suda ; Tetsu Kachi ; Nobuyuki Ikarashi
キーワード: gallium nitride, transmission electron microscopy, atom probe tomography
刊行年月日: 2022-08-14
更新時刻: 2024-01-05 22:13:58 +0900

Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf

Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells

論文
著者: Yudai Yamaguchi ; Yuya Kanitani ; Yoshihiro Kudo ; Jun Uzuhashi ; Tadakatsu Ohkubo ; Kazuhiro Hono ; Shigetaka Tomiya
キーワード: InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
刊行年月日: 2022-09-14
更新時刻: 2024-01-05 22:12:51 +0900

Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf

Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing

論文
著者: Jun Uzuhashi ; Jun Chen ; Ashutosh Kumar ; Wei Yi ; Tadakatsu Ohkubo ; Ryo Tanaka ; Shinya Takashima ; Masaharu Edo ; Kacper Sierakowski ; Michal Bockowski ; Hideki Sakurai ; Tetsu Kachi ; Takashi Sekiguchi ; Kazuhiro Hono
キーワード: gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
刊行年月日: 2022-05-14
更新時刻: 2024-01-05 22:11:22 +0900

Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf

Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM

論文
著者: Jun Uzuhashi ; Tadakatsu Ohkubo ; Kazuhiro Hono
キーワード: atom probe tomography, focused ion beam, scanning electron microscopy, automation
刊行年月日: 2023-02-19
更新時刻: 2025-02-23 22:51:16 +0900