Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography

論文

著者

Akira Uedono ; Claudia Fleischmann ; Jean-Philippe Soulié ; Mustafa Ayyad ; Jeroen E. Scheerder ; Christoph Adelmann ; Jun Uzuhashi ; Tadakatsu Ohkubo ; Koji Michishio ; Nagayasu Oshima ; Shoji Ishibashi

キーワード

atom probe tomography, positron annihilation

刊行年月日

2024-07-10

更新時刻

2025-07-10 08:30:19 +0900