13 件のレコードが見つかりました。
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
- ジャーナル論文
- 著者
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;Kosuke Ishikawa (author) (この著者で検索)Emi Kano (author) (この著者で検索)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)
;
;Kensuke Sumida (author) (この著者で検索)Tetsuo Narita (author) (この著者で検索)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
;
Masahiro Horita (author) (この著者で検索)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
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;Junya Sahashi (author) (この著者で検索)Shun Lu (author) (この著者で検索)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
;
Jun Suda (author) (この著者で検索)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
;
Nobuyuki Ikarashi (author) (この著者で検索)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- キーワード
- gallium nitride, atom probe tomography
- 刊行年月日
- 2026-06-22
- 更新時刻
- 2026-06-25 09:46:49 +0900
Atomic-scale observation of native oxides on c - and m -faced GaN surfaces
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
Yoshihiro Irokawa (author) (この著者で検索)
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Toshihide Nabatame (author) (この著者で検索)
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;Yasuo Koide (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
- キーワード
- transmission electron microscopy, gallium nitride
- 刊行年月日
- 2026-04-01
- 更新時刻
- 2026-04-02 10:10:21 +0900
Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by Using a Monoenergetic Positron Beam
- ジャーナル論文
- 著者
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A. Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
R. Tanaka (author) (この著者で検索)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
;
S. Takashima (author) (この著者で検索)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
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;K. Ueno (author) (この著者で検索);M. Edo (author) (この著者で検索)K. Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
;S. F. Chichibu (author) (この著者で検索)J. Uzuhashi (author) (この著者で検索)
;
T. Ohkubo (author) (この著者で検索)
;
S. Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
;K. Sierakowski (author) (この著者で検索)M. Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- gallium nitride
- 刊行年月日
- 2025-08-27
- 更新時刻
- 2026-01-05 13:57:59 +0900
Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam
- プロシーディングス論文
- 著者
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;Akira Uedono (author) (この著者で検索);Ryo Tanaka (author) (この著者で検索);Shinya Takashima (author) (この著者で検索);Katsunori Ueno (author) (この著者で検索);Masaharu Edo (author) (この著者で検索);Kohei Shima (author) (この著者で検索);Shigefusa F. Chichibu (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
;Shoji Ishibashi (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索)Michal Bockowski (author) (この著者で検索)
- キーワード
- gallium nitride
- 刊行年月日
- 2025-06-04
- 更新時刻
- 2025-09-17 16:30:20 +0900
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
- ジャーナル論文
- 著者
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Takahiro Nagata (author) (この著者で検索)
;
Asahiko Matsuda (author) (この著者で検索)
;
Takashi Teramoto (author) (この著者で検索)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
;
Dominic Gerlach (author) (この著者で検索)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
;
Peng Shen (author) (この著者で検索)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)
;
Takako Kimura (author) (この著者で検索)
https://orcid.org/0009-0007-0109-4482
(unauthenticated)
;
Christian Dussarrat (author) (この著者で検索)
https://orcid.org/0009-0000-1063-6473
(unauthenticated)
;
Toyohiro Chikyow (author) (この著者で検索)
- キーワード
- gallium nitride, GaN, nitrosyl fluoride, FNO, HAXPES, defect passivation, fluorination
- 刊行年月日
- 2025-03-07
- 更新時刻
- 2025-03-26 17:26:31 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
- ジャーナル論文
- 著者
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Emi Kano (author) (この著者で検索)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Koki Kobayashi (author) (この著者で検索);Kosuke Ishikawa (author) (この著者で検索);Kyosuke Sawabe (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
;Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-22
- 更新時刻
- 2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
;
Jun Chen (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
;
;Ryo Tanaka (author) (この著者で検索)Fuji Electric Corporation;Shinya Takashima (author) (この著者で検索)Fuji Electric Corporation;Masaharu Edo (author) (この著者で検索)Fuji Electric CorporationTadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
;
Takashi Sekiguchi (author) (この著者で検索)University of Tsukuba
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
- 刊行年月日
- 2024-08-07
- 更新時刻
- 2024-08-03 08:30:15 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
- ジャーナル論文
- 著者
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Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Ryo Tanaka (author) (この著者で検索)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
;
Shinya Takashima (author) (この著者で検索)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
;
;Katsunori Ueno (author) (この著者で検索);Masaharu Edo (author) (この著者で検索)Kohei Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
Shigefusa F. Chichibu (author) (この著者で検索)
https://orcid.org/0000-0001-9558-1642
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
Kacper Sierakowski (author) (この著者で検索)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
;
Michal Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- gallium nitride
- 刊行年月日
- 2024-02-29
- 更新時刻
- 2025-03-01 12:30:45 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
- プロシーディングス論文
- 著者
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;Ryo Tanaka (author) (この著者で検索)Fuji Electric Co., Ltd.;Shinya Takashima (author) (この著者で検索)Fuji Electric Co., Ltd.;Katsunori Ueno (author) (この著者で検索)Fuji Electric Co., Ltd.;Masahiro Horita (author) (この著者で検索)Nagoya Univ.;Jun Suda (author) (この著者で検索)Nagoya Univ.Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Masaharu Edo (author) (この著者で検索)Fuji Electric Co., Ltd.
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2023-06-08
- 更新時刻
- 2024-04-19 12:30:23 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- ジャーナル論文
- 著者
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;Emi Kano (author) (この著者で検索);Keita Kataoka (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Kenta Chokawa (author) (この著者で検索);Hideki Sakurai (author) (この著者で検索);Akira Uedono (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索);Ritsuo Otsuki (author) (この著者で検索);Koki Kobayashi (author) (この著者で検索);Yuta Itoh (author) (この著者で検索);Masahiro Nagao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Jun Suda (author) (この著者で検索);Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
- キーワード
- gallium nitride, transmission electron microscopy, atom probe tomography
- 刊行年月日
- 2022-08-14
- 更新時刻
- 2024-01-05 22:13:58 +0900