19 records found.
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
- Journal article
- Creator
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;Kosuke Ishikawa (author) (Search by this author)Emi Kano (author) (Search by this author)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
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Jun Uzuhashi (author) (Search by this author)
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;Kensuke Sumida (author) (Search by this author)Tetsuo Narita (author) (Search by this author)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
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Masahiro Horita (author) (Search by this author)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
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;Junya Sahashi (author) (Search by this author)Shun Lu (author) (Search by this author)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
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Jun Suda (author) (Search by this author)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
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Tadakatsu Ohkubo (author) (Search by this author)
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Tetsu Kachi (author) (Search by this author)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
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Nobuyuki Ikarashi (author) (Search by this author)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- Keyword
- gallium nitride, atom probe tomography
- Date published
- 2026-06-22
- Updated at
- 2026-06-25 09:46:49 +0900
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析
- Journal article
- Creator
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;佐々木 宏和 (author) (Search by this author)古河電気工業株式会社;大場 洋次郎 (author) (Search by this author)豊橋技術科学大学;廣井 孝介 (author) (Search by this author)日本原子力研究開発機構;大沼 正人 (author) (Search by this author)北海道大学埋橋 淳 (author) (Search by this author)National Institute for Materials Science
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大久保 忠勝 (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- Updated at
- 2025-11-28 16:30:03 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
- Journal article
- Creator
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Shozo Hiramoto (author) (Search by this author)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
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;Satoshi Okamoto (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
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Tadakatsu Ohkubo (author) (Search by this author)
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;Akihiko Toda (author) (Search by this author);Sangwook Kim (author) (Search by this author);Chikako Moriyoshi (author) (Search by this author)Yoshihiro Kuroiwa (author) (Search by this author)
- Keyword
- atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
- Date published
- 2025-02-10
- Updated at
- 2026-02-11 08:30:29 +0900
Role of deformation on the hydrogen trapping in the pearlitic steel
- Journal article
- Creator
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Z.H. Li (author) (Search by this author)
https://orcid.org/0000-0002-3867-1462
(unauthenticated)
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T.T. Sasaki (author) (Search by this author)
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R. Ueji (author) (Search by this author)
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;Y. Kimura (author) (Search by this author)A. Shibata (author) (Search by this author)
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T. Ohkubo (author) (Search by this author)
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K. Hono (author) (Search by this author)
- Keyword
- pearlitic steel, deformation, hydrogen, trapping site, atom probe tomography
- Date published
- 2023-11-16
- Updated at
- 2025-12-19 16:30:06 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
- Journal article
- Creator
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;Hirokazu Sasaki (author) (Search by this author);Syunta Akiya (author) (Search by this author);Kuniteru Mihara (author) (Search by this author);Yojiro Oba (author) (Search by this author);Masato Onuma (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2025-01-01
- Updated at
- 2025-01-08 16:31:18 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- Journal article
- Creator
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;Simon Moore (author) (Search by this author)Mari Takahashi (author) (Search by this author)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
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Philipp Sauerschnig (author) (Search by this author)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
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;Keiji Kobayashi (author) (Search by this author);Koichi Higashimine (author) (Search by this author);Masanobu Miyata (author) (Search by this author);Takahiro Baba (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Michihiro Ohta (author) (Search by this author)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
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Takao Mori (author) (Search by this author)
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Tadakatsu Ohkubo (author) (Search by this author)
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Shinya Maenosono (author) (Search by this author)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- Keyword
- thermoelectric materials, electron microscopy, atom probe tomography
- Date published
- 2024-09-09
- Updated at
- 2025-08-26 08:30:23 +0900
On the correlative microscopy analyses of nano-twinned domains in 2 mol % zirconia alloyed yttrium tantalate thermal barrier material
- Journal article
- Creator
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;K. Gururaj (author) (Search by this author)Mainak Saha (author) (Search by this author)Metallurgical and Materials Engineering, Indian Institute of Technology, Madras
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;Sumit Kumar Maurya (author) (Search by this author);Rajat Nama (author) (Search by this author);A. Alankar (author) (Search by this author);M.B. Ponnuchamy (author) (Search by this author)K.G. Pradeep (author) (Search by this author)
- Keyword
- Correlative microscopy, Ferroelastic transformation, Nanotwins, transmission Kikuchi diffraction, atom probe tomography
- Date published
- 2022-02-09
- Updated at
- 2024-10-08 11:52:48 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- Journal article
- Creator
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;Yudai Yamaguchi (author) (Search by this author);Yuta Inaba (author) (Search by this author);Ryoji Arai (author) (Search by this author);Yuya Kanitani (author) (Search by this author);Yoshihiro Kudo (author) (Search by this author);Michinori Shiomi (author) (Search by this author);Daiji Kasahara (author) (Search by this author);Mikihiro Yokozeki (author) (Search by this author);Noriyuki Fuutagawa (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
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;Kouichi Akahane (author) (Search by this author);Naokatsu Yamamoto (author) (Search by this author)Shigetaka Tomiya (author) (Search by this author)
- Keyword
- quantum dot, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-11
- Updated at
- 2025-04-14 16:30:23 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
- Journal article
- Creator
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Emi Kano (author) (Search by this author)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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;Koki Kobayashi (author) (Search by this author);Kosuke Ishikawa (author) (Search by this author);Kyosuke Sawabe (author) (Search by this author);Tetsuo Narita (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author)Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
;Tetsu Kachi (author) (Search by this author)Nobuyuki Ikarashi (author) (Search by this author)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-22
- Updated at
- 2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)Research Center for Magnetic and Spintronic Materials/Administrative Office, National Institute for Materials Science
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Jun Chen (author) (Search by this author)Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
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;Ryo Tanaka (author) (Search by this author)Fuji Electric Corporation;Shinya Takashima (author) (Search by this author)Fuji Electric Corporation;Masaharu Edo (author) (Search by this author)Fuji Electric CorporationTadakatsu Ohkubo (author) (Search by this author)Research Center for Magnetic and Spintronic Materials, National Institute for Materials Science
;
Takashi Sekiguchi (author) (Search by this author)University of Tsukuba
- Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
- Date published
- 2024-08-07
- Updated at
- 2024-08-03 08:30:15 +0900