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ジャーナル論文(11)
プロシーディングス論文(1)
キーワード
atom probe tomography (12)
transmission electron microscopy (6)
gallium nitride (4)
cathodoluminescence (2)
InGaN (1)
automation (1)
dislocation (1)
electron microscopy (1)
focused ion beam (1)
implantation (1)
(more)
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application/pdf (12)
キーワード: atom probe tomography
全ての絞り込みを解除
12 件のレコードが見つかりました。
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
ジャーナル論文
著者
Yohei Nomura
(author) (
この著者で検索
)
Yohei Nomura
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tatsuya Tomita
(author) (
この著者で検索
)
Tatsuya Tomita
;
Toru Takahashi
(author) (
この著者で検索
)
Toru Takahashi
;
Hidenori Kuwata
(author) (
この著者で検索
)
Hidenori Kuwata
;
Taichi Abe
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5065-0939
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Taichi Abe
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
キーワード
atom probe tomography
刊行年月日
2020-11-06
更新時刻
2024-04-05 10:56:21 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
ジャーナル論文
著者
Simon Moore
(author) (
この著者で検索
)
Simon Moore
;
Mari Takahashi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
Mari Takahashi
;
Philipp Sauerschnig
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
Philipp Sauerschnig
;
Keiji Kobayashi
(author) (
この著者で検索
)
Keiji Kobayashi
;
Koichi Higashimine
(author) (
この著者で検索
)
Koichi Higashimine
;
Masanobu Miyata
(author) (
この著者で検索
)
Masanobu Miyata
;
Takahiro Baba
(author) (
この著者で検索
)
Takahiro Baba
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Michihiro Ohta
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
Michihiro Ohta
;
Takao Mori
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2682-1846
NIMS Researchers Directory SAMURAI
Takao Mori
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shinya Maenosono
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
Shinya Maenosono
キーワード
thermoelectric materials
,
electron microscopy
,
atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ryo Tanaka
(author) (
この著者で検索
)
Fuji Electric Corporation
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Fuji Electric Corporation
Shinya Takashima
;
Masaharu Edo
(author) (
この著者で検索
)
Fuji Electric Corporation
Masaharu Edo
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Takashi Sekiguchi
(author) (
この著者で検索
)
University of Tsukuba
Takashi Sekiguchi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
ジャーナル論文
著者
Shozo Hiramoto
(author) (
この著者で検索
)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
Shozo Hiramoto
;
Satoshi Okamoto
(author) (
この著者で検索
)
Satoshi Okamoto
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Akihiko Toda
(author) (
この著者で検索
)
Akihiko Toda
;
Sangwook Kim
(author) (
この著者で検索
)
Sangwook Kim
;
Chikako Moriyoshi
(author) (
この著者で検索
)
Chikako Moriyoshi
;
Yoshihiro Kuroiwa
(author) (
この著者で検索
)
Yoshihiro Kuroiwa
キーワード
atom probe tomography
,
transmission electron microscopy
,
nanocrystalline soft magnetic material
刊行年月日
2025-02-10
更新時刻
2026-02-11 08:30:29 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Claudia Fleischmann
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
Claudia Fleischmann
;
Jean-Philippe Soulié
(author) (
この著者で検索
)
Jean-Philippe Soulié
;
Mustafa Ayyad
(author) (
この著者で検索
)
Mustafa Ayyad
;
Jeroen E. Scheerder
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
Jeroen E. Scheerder
;
Christoph Adelmann
(author) (
この著者で検索
)
Christoph Adelmann
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Koji Michishio
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
Koji Michishio
;
Nagayasu Oshima
(author) (
この著者で検索
)
Nagayasu Oshima
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
キーワード
atom probe tomography
,
positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ashutosh Kumar
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
Ashutosh Kumar
;
Wei Yi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
Wei Yi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Ryo Tanaka
(author) (
この著者で検索
)
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Shinya Takashima
;
Masaharu Edo
(author) (
この著者で検索
)
Masaharu Edo
;
Kacper Sierakowski
(author) (
この著者で検索
)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Hideki Sakurai
(author) (
この著者で検索
)
Hideki Sakurai
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Takashi Sekiguchi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
Takashi Sekiguchi
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
キーワード
gallium nitride
,
implantation
,
atom probe tomography
,
cathodoluminescence
,
scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
ジャーナル論文
著者
Yudai Yamaguchi
(author) (
この著者で検索
)
Yudai Yamaguchi
;
Yuta Inaba
(author) (
この著者で検索
)
Yuta Inaba
;
Ryoji Arai
(author) (
この著者で検索
)
Ryoji Arai
;
Yuya Kanitani
(author) (
この著者で検索
)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
この著者で検索
)
Yoshihiro Kudo
;
Michinori Shiomi
(author) (
この著者で検索
)
Michinori Shiomi
;
Daiji Kasahara
(author) (
この著者で検索
)
Daiji Kasahara
;
Mikihiro Yokozeki
(author) (
この著者で検索
)
Mikihiro Yokozeki
;
Noriyuki Fuutagawa
(author) (
この著者で検索
)
Noriyuki Fuutagawa
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Kouichi Akahane
(author) (
この著者で検索
)
Kouichi Akahane
;
Naokatsu Yamamoto
(author) (
この著者で検索
)
Naokatsu Yamamoto
;
Shigetaka Tomiya
(author) (
この著者で検索
)
Shigetaka Tomiya
キーワード
quantum dot
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-11
更新時刻
2025-04-14 16:30:23 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
キーワード
atom probe tomography
,
focused ion beam
,
scanning electron microscopy
,
automation
刊行年月日
2023-02-19
更新時刻
2025-02-23 22:51:16 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス論文
著者
Ryo Tanaka
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Shinya Takashima
;
Katsunori Ueno
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Katsunori Ueno
;
Masahiro Horita
(author) (
この著者で検索
)
Nagoya Univ.
Masahiro Horita
;
Jun Suda
(author) (
この著者で検索
)
Nagoya Univ.
Jun Suda
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Masaharu Edo
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Masaharu Edo
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
ジャーナル論文
著者
Hirokazu Sasaki
(author) (
この著者で検索
)
Hirokazu Sasaki
;
Syunta Akiya
(author) (
この著者で検索
)
Syunta Akiya
;
Kuniteru Mihara
(author) (
この著者で検索
)
Kuniteru Mihara
;
Yojiro Oba
(author) (
この著者で検索
)
Yojiro Oba
;
Masato Onuma
(author) (
この著者で検索
)
Masato Onuma
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
キーワード
atom probe tomography
刊行年月日
2025-01-01
更新時刻
2025-01-08 16:31:18 +0900
キーワード
atom probe tomography
(12)
transmission electron microscopy
(6)
gallium nitride
(4)
cathodoluminescence
(2)
InGaN
(1)
automation
(1)
dislocation
(1)
electron microscopy
(1)
focused ion beam
(1)
implantation
(1)
nanocrystalline soft magnetic material
(1)
pipe diffusion
(1)
positron annihilation
(1)
quantum dot
(1)
scanning electron microscopy
(1)
scanning transmission electron microscopy
(1)
thermoelectric materials
(1)
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