キーワード: atom probe tomography
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19 件のレコードが見つかりました。

Manuscript_2ZYT_revised_18.09.2021_RN_MS.docx
On the correlative microscopy analyses of nano-twinned domains in 2 mol % zirconia alloyed yttrium tantalate thermal barrier material
ジャーナル論文
著者
K. Gururaj (author) (この著者で検索)
;
Mainak Saha (author) (この著者で検索)
Indian Institute of Technology, Madras Metallurgical and Materials Engineering
ORCID SAMURAI ;
Sumit Kumar Maurya (author) (この著者で検索)
;
Rajat Nama (author) (この著者で検索)
;
A. Alankar (author) (この著者で検索)
;
M.B. Ponnuchamy (author) (この著者で検索)
;
K.G. Pradeep (author) (この著者で検索)
キーワード
Correlative microscopy, Ferroelastic transformation, Nanotwins, transmission Kikuchi diffraction, atom probe tomography
刊行年月日
2022-02-09
更新時刻
2024-10-08 11:52:48 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs.pdf
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス論文
著者
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Katsunori Ueno (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Masahiro Horita (author) (この著者で検索)
Nagoya Univ.
;
Jun Suda (author) (この著者で検索)
Nagoya Univ.
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Co., Ltd.
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials.pdf
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
ジャーナル論文
著者
Yohei Nomura (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tatsuya Tomita (author) (この著者で検索)
;
Toru Takahashi (author) (この著者で検索)
;
Hidenori Kuwata (author) (この著者で検索)
;
Taichi Abe (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
atom probe tomography
刊行年月日
2020-11-06
更新時刻
2024-04-05 10:56:21 +0900
66_MT-D2024005.pdf
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
ジャーナル論文
著者
Hirokazu Sasaki (author) (この著者で検索)
;
Syunta Akiya (author) (この著者で検索)
;
Kuniteru Mihara (author) (この著者で検索)
;
Yojiro Oba (author) (この著者で検索)
;
Masato Onuma (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
atom probe tomography
刊行年月日
2025-01-01
更新時刻
2025-01-08 16:31:18 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe-Si-B-P-Cu-C alloy.pdf
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
ジャーナル論文
著者
Shozo Hiramoto (author) (この著者で検索)
ORCID ;
Satoshi Okamoto (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Akihiko Toda (author) (この著者で検索)
;
Sangwook Kim (author) (この著者で検索)
;
Chikako Moriyoshi (author) (この著者で検索)
;
Yoshihiro Kuroiwa (author) (この著者で検索)
キーワード
atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
刊行年月日
2025-02-10
更新時刻
2026-02-11 08:30:29 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesised SnSe2 Nanosheets.pdf
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
ジャーナル論文
著者
Simon Moore (author) (この著者で検索)
;
Mari Takahashi (author) (この著者で検索)
ORCID ;
Philipp Sauerschnig (author) (この著者で検索)
ORCID ;
Keiji Kobayashi (author) (この著者で検索)
;
Koichi Higashimine (author) (この著者で検索)
;
Masanobu Miyata (author) (この著者で検索)
;
Takahiro Baba (author) (この著者で検索)
; ORCID SAMURAI ;
Michihiro Ohta (author) (この著者で検索)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ;
Shinya Maenosono (author) (この著者で検索)
ORCID
キーワード
thermoelectric materials, electron microscopy, atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography.pdf
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono (author) (この著者で検索)
ORCID ;
Claudia Fleischmann (author) (この著者で検索)
ORCID ;
Jean-Philippe Soulié (author) (この著者で検索)
;
Mustafa Ayyad (author) (この著者で検索)
;
Jeroen E. Scheerder (author) (この著者で検索)
ORCID ;
Christoph Adelmann (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Koji Michishio (author) (この著者で検索)
ORCID ;
Nagayasu Oshima (author) (この著者で検索)
;
Shoji Ishibashi (author) (この著者で検索)
ORCID
キーワード
atom probe tomography, positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
atom probe tomography, focused ion beam, scanning electron microscopy, automation
刊行年月日
2023-02-19
更新時刻
2025-02-23 22:51:16 +0900
X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中のδNi2Si析出相の解析.pdf
X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析
ジャーナル論文
著者
佐々木 宏和 (author) (この著者で検索)
古河電気工業株式会社
;
秋谷 俊太 (author) (この著者で検索)
古河電気工業株式会社
;
三原 邦照 (author) (この著者で検索)
古河電気工業株式会社
;
大場 洋次郎 (author) (この著者で検索)
豊橋技術科学大学
;
大沼 正人 (author) (この著者で検索)
北海道大学
; ORCID SAMURAI ; ORCID SAMURAI
キーワード
atom probe tomography, transmission electron microscopy, Corson alloy
刊行年月日
更新時刻
2024-01-30 09:51:05 +0900