24 件のレコードが見つかりました。
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- ジャーナル論文
- 著者
-
Jun Uzuhashi (author) (この著者で検索)
;
;Yuanzhao Yao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索) - キーワード
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2026-01-31 16:30:04 +0900
Observation of Atomic-Scale Structural Changes in Al2O3/GaN Interfacial Layers Prepared with a Dummy-SiO2 Process
- ジャーナル論文
- 著者
-
Jun Uzuhashi (author) (この著者で検索)
;
Yoshihiro Irokawa (author) (この著者で検索)
;
Toshihide Nabatame (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Yasuo Koide (author) (この著者で検索)
- キーワード
- transmission electron microscopy, metal-oxide-semiconductor
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2025-08-26 11:15:20 +0900
Systematic study of FIB-induced damage for the high-quality TEM sample preparation
- ジャーナル論文
- 著者
-
Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
- キーワード
- focused ion beam, transmission electron microscopy
- 刊行年月日
- 2024-04-26
- 更新時刻
- 2024-05-07 15:32:35 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
- プロシーディングス論文
- 著者
-
;Ryo Tanaka (author) (この著者で検索)Fuji Electric Co., Ltd.;Shinya Takashima (author) (この著者で検索)Fuji Electric Co., Ltd.;Katsunori Ueno (author) (この著者で検索)Fuji Electric Co., Ltd.;Masahiro Horita (author) (この著者で検索)Nagoya Univ.;Jun Suda (author) (この著者で検索)Nagoya Univ.Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Masaharu Edo (author) (この著者で検索)Fuji Electric Co., Ltd.
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2023-06-08
- 更新時刻
- 2024-04-19 12:30:23 +0900
Au13 Superatom Bearing Two Terpyridines at Coaxial Positions: Photoluminescence Quenching via Complexation with 3d Metal Ions
- ジャーナル論文
- 著者
-
;Naoki Kito (author) (この著者で検索);Shinjiro Takano (author) (この著者で検索);Shinya Masuda (author) (この著者で検索)Koji Harano (author) (この著者で検索)
;
Tatsuya Tsukuda (author) (この著者で検索)
- キーワード
- superatom, transmission electron microscopy, photoluminescence, nanocluster, gold
- 刊行年月日
- 2023-09-15
- 更新時刻
- 2024-01-05 22:11:46 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- ジャーナル論文
- 著者
-
;Emi Kano (author) (この著者で検索);Keita Kataoka (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Kenta Chokawa (author) (この著者で検索);Hideki Sakurai (author) (この著者で検索);Akira Uedono (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索);Ritsuo Otsuki (author) (この著者で検索);Koki Kobayashi (author) (この著者で検索);Yuta Itoh (author) (この著者で検索);Masahiro Nagao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Jun Suda (author) (この著者で検索);Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
- キーワード
- gallium nitride, transmission electron microscopy, atom probe tomography
- 刊行年月日
- 2022-08-14
- 更新時刻
- 2024-01-05 22:13:58 +0900
Latent ion tracks were finally observed in diamond
- ジャーナル論文
- 著者
-
H. Amekura (author) (この著者で検索)National Institute for Materials Science
;
A. Chettah (author) (この著者で検索)
https://orcid.org/0000-0002-9815-0992
(unauthenticated)
;
K. Narumi (author) (この著者で検索)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
;
;A. Chiba (author) (この著者で検索);Y. Hirano (author) (この著者で検索);K. Yamada (author) (この著者で検索);S. Yamamoto (author) (この著者で検索)A. A. Leino (author) (この著者で検索)
https://orcid.org/0000-0003-3504-548X
(unauthenticated)
;
F. Djurabekova (author) (この著者で検索)
https://orcid.org/0000-0002-5828-200X
(unauthenticated)
;
K. Nordlund (author) (この著者で検索)
https://orcid.org/0000-0001-6244-1942
(unauthenticated)
;
;N. Ishikawa (author) (この著者で検索);N. Okubo (author) (この著者で検索)Y. Saitoh (author) (この著者で検索) - キーワード
- ion track, diamond, C60 ion, transmission electron microscopy, velocity effect
- 刊行年月日
- 2024-02-27
- 更新時刻
- 2024-03-04 16:30:07 +0900
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier
- ジャーナル論文
- 著者
-
;Tatsuya Yamamoto (author) (この著者で検索);Tomohiro Ichinose (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Takayuki Nozaki (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
;Kay Yakushiji (author) (この著者で検索);Shingo Tamaru (author) (この著者で検索);Hitoshi Kubota (author) (この著者で検索)Shinji Yuasa (author) (この著者で検索)
- キーワード
- transmission electron microscopy
- 刊行年月日
- 2024-02-09
- 更新時刻
- 2026-02-09 12:30:04 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
- ジャーナル論文
- 著者
-
Emi Kano (author) (この著者で検索)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Koki Kobayashi (author) (この著者で検索);Kosuke Ishikawa (author) (この著者で検索);Kyosuke Sawabe (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
;Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-22
- 更新時刻
- 2024-09-20 16:30:27 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
- ジャーナル論文
- 著者
-
;Yudai Yamaguchi (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2022-09-14
- 更新時刻
- 2024-01-05 22:12:51 +0900