Keyword: atom probe tomography
Reset all filters

16 records found.

An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析.pdf
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析
Journal article
Creator
佐々木 宏和 (author) (Search by this author)
古河電気工業株式会社
;
大場 洋次郎 (author) (Search by this author)
豊橋技術科学大学
;
廣井 孝介 (author) (Search by this author)
日本原子力研究開発機構
;
大沼 正人 (author) (Search by this author)
北海道大学
;
埋橋 淳 (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
大久保 忠勝 (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography
Date published
Updated at
2025-11-28 16:30:03 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy, automation
Date published
2023-02-19
Updated at
2025-02-23 22:51:16 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
Research Center for Magnetic and Spintronic Materials/Administrative Office, National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Ryo Tanaka (author) (Search by this author)
Fuji Electric Corporation
;
Shinya Takashima (author) (Search by this author)
Fuji Electric Corporation
;
Masaharu Edo (author) (Search by this author)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (Search by this author)
Research Center for Magnetic and Spintronic Materials, National Institute for Materials Science
ORCID SAMURAI ;
Takashi Sekiguchi (author) (Search by this author)
University of Tsukuba
Keyword
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
Date published
2024-08-07
Updated at
2024-08-03 08:30:15 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
Journal article
Creator
Yudai Yamaguchi (author) (Search by this author)
;
Yuya Kanitani (author) (Search by this author)
;
Yoshihiro Kudo (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Shigetaka Tomiya (author) (Search by this author)
Keyword
InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
Date published
2022-09-14
Updated at
2024-01-05 22:12:51 +0900
Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
Journal article
Creator
Emi Kano (author) (Search by this author)
ORCID ;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Koki Kobayashi (author) (Search by this author)
;
Kosuke Ishikawa (author) (Search by this author)
;
Kyosuke Sawabe (author) (Search by this author)
;
Tetsuo Narita (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tetsu Kachi (author) (Search by this author)
;
Nobuyuki Ikarashi (author) (Search by this author)
ORCID
Keyword
gallium nitride, atom probe tomography, transmission electron microscopy
Date published
2024-04-22
Updated at
2024-09-20 16:30:27 +0900
66_MT-D2024005.pdf
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
Journal article
Creator
Hirokazu Sasaki (author) (Search by this author)
;
Syunta Akiya (author) (Search by this author)
;
Kuniteru Mihara (author) (Search by this author)
;
Yojiro Oba (author) (Search by this author)
;
Masato Onuma (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography
Date published
2025-01-01
Updated at
2025-01-08 16:31:18 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials.pdf
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
Journal article
Creator
Yohei Nomura (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tatsuya Tomita (author) (Search by this author)
;
Toru Takahashi (author) (Search by this author)
;
Hidenori Kuwata (author) (Search by this author)
;
Taichi Abe (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography
Date published
2020-11-06
Updated at
2024-04-05 10:56:21 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography.pdf
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
Journal article
Creator
Akira Uedono (author) (Search by this author)
ORCID ;
Claudia Fleischmann (author) (Search by this author)
ORCID ;
Jean-Philippe Soulié (author) (Search by this author)
;
Mustafa Ayyad (author) (Search by this author)
;
Jeroen E. Scheerder (author) (Search by this author)
ORCID ;
Christoph Adelmann (author) (Search by this author)
; ORCID SAMURAI ; ORCID SAMURAI ;
Koji Michishio (author) (Search by this author)
ORCID ;
Nagayasu Oshima (author) (Search by this author)
;
Shoji Ishibashi (author) (Search by this author)
ORCID
Keyword
atom probe tomography, positron annihilation
Date published
2024-07-10
Updated at
2025-07-10 08:30:19 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesised SnSe2 Nanosheets.pdf
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
Journal article
Creator
Simon Moore (author) (Search by this author)
;
Mari Takahashi (author) (Search by this author)
ORCID ;
Philipp Sauerschnig (author) (Search by this author)
ORCID ;
Keiji Kobayashi (author) (Search by this author)
;
Koichi Higashimine (author) (Search by this author)
;
Masanobu Miyata (author) (Search by this author)
;
Takahiro Baba (author) (Search by this author)
; ORCID SAMURAI ;
Michihiro Ohta (author) (Search by this author)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ;
Shinya Maenosono (author) (Search by this author)
ORCID
Keyword
thermoelectric materials, electron microscopy, atom probe tomography
Date published
2024-09-09
Updated at
2025-08-26 08:30:23 +0900