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TANUMA, Shigeo
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先端共用施設・技術プラットフォームの展望と課題 − ナノテクノロジープラットフォーム事業をベースとして −
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auge...
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Qu...
Analysis of electron inelastic scattering in solids over wide energy range and its app...
Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
Calculations and Measurements of Electron Inelastic Mean Free Paths in Solids
Calculations of Electron Inelastic Mean Free Paths in Solids over the 10 eV to 200 keV...
Energy Dependence of Electron Stopping Powers in Elemental Solids over the 100 eV to 3...
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Usi...
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
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IMFP
5
Auger depth profiling analysis
3
EPES
2
Fano Plot
2
InP/GaInAsP multilayer specimens
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English
8
Japanese
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National Institute for Materials Science
5
Surface Science Society of Japan
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Wiley
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International
7
In Copyright
5
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
1
Material/Specimen
InP/GaInAsP multilayer specimens
2
GaAs/AlAs multilayer
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InP/GaInAsP Multilayer
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Author
TANUMA, Shigeo
13
OGIWARA, Toshiya
4
C.J. Powell
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C. J. Powell
1
D.R. Penn
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http://rightsstatements.org/vocab/InC/1.0/
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Journal
Journal of The Surface Science Society of Japan
4
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
1
SURFACE AND INTERFACE ANALYSIS
1
Surface and Interface Analysis
1