Publication
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
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ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. This article provides a brief summary of this International Standard.
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- Date published
- 28/12/2005
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- 28/12/2005
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- Accepted manuscript
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- Last modified
- 01/07/2021
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Summary_of_ISO18118-2.pdf | 08/10/2020 | 135 KB | MDR Open |
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