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論文・データセット
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ジャーナル論文(7)
キーワード
X-ray photoelectron spectroscopy (7)
Bayesian estimation (3)
Exchange Monte Carlo method (2)
SESSA (2)
Automatic spectrum analysis (1)
Bayesian information criterion (1)
Expectation– conditional maximisation algorithm (1)
High-throughput analysis (1)
Maximum a posteriori estimation (1)
Multiple core level spectra (1)
(more)
ライセンス
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (4)
Creative Commons BY Attribution 4.0 International (3)
ファイル種別
application/pdf (7)
キーワード: X-ray photoelectron spectroscopy
全ての絞り込みを解除
7 件のレコードが見つかりました。
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
ジャーナル論文
著者
Shunichi Yoneda
(author) (
この著者で検索
)
Shunichi Yoneda
;
Ryo Murakami
(author) (
この著者で検索
)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Hiromi Tanaka
(author) (
この著者で検索
)
Hiromi Tanaka
;
Hayaru Shouno
(author) (
この著者で検索
)
Hayaru Shouno
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
キーワード
X-ray photoelectron spectroscopy
,
Survey spectrum
,
Surrogate model
,
Total electron attenuation length
,
Thickness estimation
刊行年月日
2026-03-31
更新時刻
2026-04-16 15:42:06 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
ジャーナル論文
著者
Atsushi Machida
(author) (
この著者で検索
)
Atsushi Machida
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Ryo Murakami
(author) (
この著者で検索
)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hayaru Shouno
(author) (
この著者で検索
)
Hayaru Shouno
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Masato Okada
(author) (
この著者で検索
)
Masato Okada
キーワード
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
刊行年月日
2024-05-29
更新時刻
2025-11-10 12:30:27 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
ジャーナル論文
著者
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shuichi Ogawa
(author) (
この著者で検索
)
Shuichi Ogawa
;
Akitaka Yoshigoe
(author) (
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)
Akitaka Yoshigoe
キーワード
Bayesian estimation
,
X-ray photoelectron spectroscopy
,
Statistical analysis
,
Silicon surface oxidation
刊行年月日
2024-12-03
更新時刻
2025-01-21 12:30:34 +0900
Maximum a posteriori estimation for high-throughput peak fitting in X-ray photoelectron spectroscopy
ジャーナル論文
著者
Tarojiro Matsumura
(author) (
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)
Tarojiro Matsumura
;
Naoka Nagamura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7697-8983
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Naoka Nagamura
;
Shotaro Akaho
(author) (
この著者で検索
)
Shotaro Akaho
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Yasunobu Ando
(author) (
この著者で検索
)
Yasunobu Ando
キーワード
High-throughput analysis
,
Peak fitting
,
X-ray photoelectron spectroscopy
,
Maximum a posteriori estimation
,
Expectation– conditional maximisation algorithm
刊行年月日
2024-12-31
更新時刻
2024-12-10 16:30:32 +0900
Ultraviolet Light-Induced Surface Changes of Tungsten Oxide in Air: Combined Scanning Transmission Electron Microscopy and X-ray Photoelectron Spectroscopy Analysis
ジャーナル論文
著者
Yuki Nakagawa
(author) (
この著者で検索
)
Fuclty of Engineering, Hokkaido University / 北海道大学 工学研究院
Yuki Nakagawa
;
Yasuhiro Shiratsuchi
(author) (
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)
Hokkaido University
Yasuhiro Shiratsuchi
;
Tamaki Shibayama
(author) (
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)
Fuclty of Engineering, Hokkaido University / 北海道大学 工学研究院
Tamaki Shibayama
;
Masaki Takeguchi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0282-6020
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group
NIMS Researchers Directory SAMURAI
Masaki Takeguchi
キーワード
tungsten oxide
,
photocatalysis
,
dentical-location scanning transmission electron microscopy
,
X-ray photoelectron spectroscopy
,
ultraviolet light
,
hydrocarbon decomposition
刊行年月日
2024-09-13
更新時刻
2024-09-20 08:30:15 +0900
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
ジャーナル論文
著者
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Malinda Siriwardana
(author) (
この著者で検索
)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
Malinda Siriwardana
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Hayaru Shouno
(author) (
この著者で検索
)
https://orcid.org/0000-0002-2412-0184
(unauthenticated)
The University of Electro-Communications Graduate School of Informatics and Engineering
Hayaru Shouno
;
Masato Okada
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
The University of Tokyo Graduate School of Frontier Science
Masato Okada
キーワード
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
刊行年月日
2023-07-06
更新時刻
2024-01-05 22:11:57 +0900
Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion
ジャーナル論文
著者
Shinotsuka Hiroshi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Shinotsuka Hiroshi
;
Nagata, Kenji
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
NIMS Researchers Directory SAMURAI
Nagata, Kenji
;
Murakami, Ryo
(author) (
この著者で検索
)
Murakami, Ryo
;
Tanaka, Hiromi
(author) (
この著者で検索
)
Tanaka, Hiromi
;
Shouno, Hayaru
(author) (
この著者で検索
)
Shouno, Hayaru
;
Yoshikawa, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Yoshikawa, Hideki
キーワード
Automatic spectrum analysis
,
Bayesian information criterion
,
Multiple core level spectra
,
X-ray photoelectron spectroscopy
刊行年月日
2020-10-03
更新時刻
2024-01-05 22:13:27 +0900
キーワード
X-ray photoelectron spectroscopy
(7)
Bayesian estimation
(3)
Exchange Monte Carlo method
(2)
SESSA
(2)
Automatic spectrum analysis
(1)
Bayesian information criterion
(1)
Expectation– conditional maximisation algorithm
(1)
High-throughput analysis
(1)
Maximum a posteriori estimation
(1)
Multiple core level spectra
(1)
Peak fitting
(1)
Silicon surface oxidation
(1)
Statistical analysis
(1)
Surrogate model
(1)
Survey spectrum
(1)
Thickness estimation
(1)
Total electron attenuation length
(1)
dentical-location scanning transmission electron microscopy
(1)
hydrocarbon decomposition
(1)
photocatalysis
(1)
tungsten oxide
(1)
ultraviolet light
(1)
RDEメタデータ定義
RDE送り状
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