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ジャーナル論文(52)
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キーワード
IMFP (24)
Auger Depth Profiling Analysis (7)
TPP-2M (7)
electron inelastic mean free path (7)
electron inelastic mean free paths (7)
inelastic mean free path (7)
energy loss function (6)
AES (4)
EPES (4)
elemental solids (4)
(more)
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66 件のレコードが見つかりました。
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
ジャーナル論文
著者
Shunichi Yoneda
(author) (
この著者で検索
)
Shunichi Yoneda
;
Ryo Murakami
(author) (
この著者で検索
)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Hiromi Tanaka
(author) (
この著者で検索
)
Hiromi Tanaka
;
Hayaru Shouno
(author) (
この著者で検索
)
Hayaru Shouno
;
Kenji Nagata
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
キーワード
X-ray photoelectron spectroscopy
,
Survey spectrum
,
Surrogate model
,
Total electron attenuation length
,
Thickness estimation
刊行年月日
2026-03-31
更新時刻
2026-04-16 15:42:06 +0900
First-principles Calculations of Optical Energy Loss Functions for 30 Compound and 5 Elemental Semiconductors
ジャーナル論文
著者
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
キーワード
Energy loss function
,
Optical constant
,
First-principles calculation
,
Compound semiconductor
,
Inelastic mean free paths
刊行年月日
2021-07-15
更新時刻
2026-02-04 12:30:04 +0900
Hard x-ray photoelectron spectroscopy (HAXPES) Cr
Kα
and XPS Al
K
α
measurements of bulk lithium metal
ジャーナル論文
著者
Hideyuki Yasufuku
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5600-8958
NIMS Researchers Directory SAMURAI
Hideyuki Yasufuku
;
Tsuyoshi Ohnishi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-2333-7752
NIMS Researchers Directory SAMURAI
Tsuyoshi Ohnishi
;
Shigenori Ueda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Yoshiyuki Yamashita
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0994-8095
NIMS Researchers Directory SAMURAI
Yoshiyuki Yamashita
;
Hiroshi Shinotsuka
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Satoshi Kawada
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4618-2746
NIMS Researchers Directory SAMURAI
Satoshi Kawada
;
Yoshitaka Matsushita
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4968-8905
NIMS Researchers Directory SAMURAI
Yoshitaka Matsushita
キーワード
Lithium
,
HAPES
,
Cr Kα
,
Al Kα
刊行年月日
2026-06-01
更新時刻
2026-01-28 12:30:04 +0900
Determining electron inelastic mean free paths by iterative Monte Carlo analysis of the backscattered electron spectrum
ジャーナル論文
著者
Jiamin Gong
(author) (
この著者で検索
)
Jiamin Gong
;
Lihao Yang
(author) (
この著者で検索
)
Lihao Yang
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Bo Da
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0785-8662
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Bo Da
;
Chuanhong Jin
(author) (
この著者で検索
)
Chuanhong Jin
;
Zejun Ding
(author) (
この著者で検索
)
Zejun Ding
キーワード
electron inelastic mean free paths
刊行年月日
2025-11-21
更新時刻
2025-12-22 11:15:22 +0900
表面電子分光法における信号の減衰は如何に記述されるか? VI. 元素における双極子行列要素平方の計算とPenn algorithmによるIMFPの計算
ジャーナル論文
著者
田沼繁夫
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
物質・材料研究機構 技術開発・共用部門
NIMS Researchers Directory SAMURAI
田沼繁夫
;
篠塚寛志
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5147-1396
物質・材料研究機構 技術開発・共用部門
NIMS Researchers Directory SAMURAI
篠塚寛志
キーワード
双極子行列要素平方
,
非弾性平均自由行程
,
IMFP
,
Penn algorithm
,
Modified Bethe equation
刊行年月日
2024-06-12
更新時刻
2024-06-17 12:30:17 +0900
Calculations of Electron Inelastic Mean Free Paths IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV
ジャーナル論文
著者
Tanuma, S.
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS 技術開発・共用部門 運営室
NIMS Researchers Directory SAMURAI
Tanuma, S.
;
Powell, C. J.
(author) (
この著者で検索
)
NIST
Powell, C. J.
;
Penn, D. R.
(author) (
この著者で検索
)
NIST
Penn, D. R.
キーワード
IMFP
,
predictive IMFP formula TPP-2
,
Evaluations of TPP-2 formula
刊行年月日
2004-09-15
更新時刻
2023-11-07 15:36:26 +0900
Estimation of Inelastic Mean Free Paths in Au and Cu from Their Elastic Peak Intensity Ratios without IMFP Values of Reference Material in The 200 – 5000 eV Energy Range
ジャーナル論文
著者
S. Tanuma
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
S. Tanuma
;
H. Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
H. Yoshikawa
;
N. Okamoto
(author) (
この著者で検索
)
N. Okamoto
;
K. Goto
(author) (
この著者で検索
)
K. Goto
キーワード
IMFP
,
elastic peak intensity
,
Au and Cu
,
EPES
,
electron inelastic mean free path
刊行年月日
2018-10-19
更新時刻
2024-01-05 22:12:30 +0900
表面電子分光法における信号の減衰は如何に記述されるか? V. 誘電関数を用いた固体における電子の非弾性散乱断面積
ジャーナル論文
著者
田沼 繁夫
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
物質・材料研究機構 技術開発・共用部門/運営室
NIMS Researchers Directory SAMURAI
田沼 繁夫
キーワード
誘電関数
,
電子の非弾性散乱断面積
,
双極子行列要素平方
,
動的散乱因子
,
一般化振動子強度
刊行年月日
更新時刻
2023-08-21 11:34:22 +0900
Calculations of Electron Inelastic Mean Free Paths III. Data for 15 Inorganic compounds over the 50 - 2000 eV Range
ジャーナル論文
著者
Tanuma, Shigeo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
物質・材料研究機構 装置開発・共用部門
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
この著者で検索
)
NIST
Powell, C. J.
;
Penn, D. R.
(author) (
この著者で検索
)
NIST
Penn, D. R.
キーワード
Inorganic compounds
,
IMFP
,
TPP-2
刊行年月日
2004-09-15
更新時刻
2023-08-03 11:15:31 +0900
Calculations of Electron Inelastic Mean Free Paths II. Data for 27 Elements over the 50 - 2000 eV Range
ジャーナル論文
著者
Tanuma, S.
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS
NIMS Researchers Directory SAMURAI
Tanuma, S.
;
Powell, C. J.
(author) (
この著者で検索
)
NIST
Powell, C. J.
;
Penn, D. R.
(author) (
この著者で検索
)
NIST
Penn, D. R.
キーワード
electron inelastic mean free paths
,
IMFPs
,
a group of 27 elements
,
TPP-2
刊行年月日
2004-09-15
更新時刻
2023-07-12 11:45:58 +0900
キーワード
IMFP
(24)
Auger Depth Profiling Analysis
(7)
TPP-2M
(7)
electron inelastic mean free path
(7)
electron inelastic mean free paths
(7)
inelastic mean free path
(7)
energy loss function
(6)
AES
(4)
EPES
(4)
elemental solids
(4)
Auger depth profiling analysis
(3)
FPA
(3)
XPS
(3)
effective attenuation length
(3)
full Penn algorithm
(3)
liquid water
(3)
relativistic full Penn algorithm
(3)
Auger electron spectroscopy
(2)
Bethe equation
(2)
EAL
(2)
ELF
(2)
Electron Inelastic Mean Free Path
(2)
Electron stopping power
(2)
Fano Plot
(2)
GaAs/AlAs Superlattice
(2)
IMFPs
(2)
ISO
(2)
InP/GaInAsP multilayer specimens
(2)
Inclined Holder
(2)
JTP equation
(2)
MED
(2)
Penn algorithm
(2)
Sample Cooling Method
(2)
Si/Ge multiple delta-doped layers
(2)
TPP-2
(2)
argon ion sputtering
(2)
compound semiconductor
(2)
dielectric function model
(2)
machine learning
(2)
mean escape depth
(2)
optical constant
(2)
organic compounds
(2)
relativistic TPP-2M
(2)
surface sensitivity
(2)
一般化振動子強度
(2)
双極子行列要素平方
(2)
10 ~ predictive equation for IMFP
(1)
11 ~ elemental solid
(1)
12 ~ relativistic Bethe equation
(1)
13 ~ Fano plot
(1)
14 ~ IMFP
(1)
41 elemental solids
(1)
Al Kα
(1)
Argon Ion Spot Beam
(1)
Au and Cu
(1)
Compound semiconductor
(1)
Cr Kα
(1)
Depth Resolution
(1)
Electron Stopping Power
(1)
Elemental solids
(1)
Energy dependence
(1)
Energy loss function
(1)
Evaluations of TPP-2 formula
(1)
Fano plo
(1)
First-principles calculation
(1)
GaAs/AlAs multilayer
(1)
HAPES
(1)
HAXPES
(1)
IMFP predictive formula
(1)
Improved Predictive IMFP Formula
(1)
InP/GaInAs Specimen
(1)
InP/GaInAsP Multilayer Specimen
(1)
InP/GaInAsP Multilayers
(1)
InP/GaInAsP多層膜
(1)
Inelastic mean free paths
(1)
Influence of electron exchange
(1)
Inorganic compounds
(1)
International Organization for Standardization
(1)
Jablonski-Tanuma-Powell equation
(1)
LASSO
(1)
LaTex
(1)
Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al
(1)
Lithium
(1)
Mermin ELF
(1)
Mermin model
(1)
Mermin-type ELF
(1)
Mg-Ge alloy
(1)
Modified Bethe equation
(1)
Monte Carlo simulation
(1)
Optical constant
(1)
Plasmon Energy Gain
(1)
Round Robin Test
(1)
Sample Temperature
(1)
Secondary Electron
(1)
SiO2/Si
(1)
Surrogate model
(1)
Survey spectrum
(1)
TPP
(1)
TPP-2M equation
(1)
TWA2
(1)
Thickness estimation
(1)
Total electron attenuation length
(1)
VAMAS
(1)
Virtual substrate method
(1)
X-ray photoelectron spectroscopy
(1)
X-ray photoelectron spectroscopy
(1)
XITS Math
(1)
ZAF
(1)
Zalar Rotation Method
(1)
a group of 27 elements
(1)
asymmetry parameter
(1)
atomic force microscope
(1)
attenuation length
(1)
bandgap correction
(1)
depth resolution function
(1)
dielectric function
(1)
elastic peak intensity
(1)
elastic- peak electron spectroscopy
(1)
electron backscattering correction
(1)
electron inelastic scattering
(1)
electron probe microanalyzer
(1)
electrons
(1)
energy-loss functions
(1)
experimental determination
(1)
first-principles calculation
(1)
four-point probe technique
(1)
general formula for IMFP
(1)
high-energy photoelectron spectroscopy
(1)
inelastic mean free paths
(1)
inelastic scattering
(1)
inelastic scattering effect
(1)
information depth
(1)
inorganic compounds
(1)
lnearly polarized X-rays
(1)
mass absorption coefficient
(1)
modified Bethe equation
(1)
modified Bethe equation
(1)
monolayer graphene
(1)
non-negative least-square curve fit
(1)
number of valence electrons
(1)
peak separation
(1)
plasmon lifetime
(1)
predictive IMFP formula TPP-2
(1)
predictive formula for back scattering correction
(1)
quantitative surface analysis
(1)
rare-earth elements
(1)
relative sensitivity factor
(1)
relativistic modified Bethe equation
(1)
relativistic modified Bethe equation
(1)
secondary electron
(1)
static structure factor
(1)
surface analysis
(1)
surface electron spectroscopies
(1)
surface electron spectroscopy
(1)
surface observation using a scanning electron microscope
(1)
surface plasmon energy gain
(1)
surface roughness
(1)
water
(1)
word
(1)
ナノテクノロジープラットフォーム事業の成果と課題
(1)
ナノテクノロジープラットフォーム事業の活動実績
(1)
光学的振動子強度
(1)
共用施策設計
(1)
動的散乱因子
(1)
双極子振動子強度
(1)
国際標準化
(1)
平均自由行程
(1)
施設・装置の平等な利用機会
(1)
標準化
(1)
標準化の意味
(1)
標準化の歴史
(1)
表面化学分析
(1)
表面定量
(1)
表面定量分析
(1)
表面電子分光
(1)
装置と知の共用
(1)
計測・分析
(1)
誘電関数
(1)
電子の非弾性散乱断面積
(1)
電子輸送シュミレータ
(1)
非弾性平均自由行程
(1)
RDEメタデータ定義
RDE送り状
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