S. Tanuma
(National Institute for Materials Science
)
;
H. Yoshikawa
(National Institute for Materials Science
)
;
N. Okamoto
;
K. Goto
説明:
(abstract)We have determined electron inelastic mean free paths (IMFPs) and surface-electronic excitation parameters (SEPs) of Au and Cu in the 200 – 5000 eV from their elastic peak intensity ratios without reference IMFP values. This proposed method does not require the IMFP values of the reference material. The measurements of elastic peak intensities of these elements were done with noble CMA system. The elastic peak intensities were also calculated from two parameter sets (IMFPs and SEPs for both elements) with Monte Carlo method. By comparison of these two EPI ratios as changing the parameter sets, we have estimated their IMFPs and SEPs in the 200 – 5000 eV energy range. The resulting IMFPs of Au and Cu were in good agreement with optical IMFPs over 1000 eV energy range.
権利情報:
キーワード: IMFP, elastic peak intensity, Au and Cu, EPES, electron inelastic mean free path
刊行年月日: 2018-10-19
出版者:
掲載誌:
研究助成金:
原稿種別: 出版者版 (Version of record)
MDR DOI:
公開URL: https://doi.org/10.1384/jsa.15.195
関連資料:
その他の識別子:
連絡先:
更新時刻: 2024-01-05 22:12:30 +0900
MDRでの公開時刻: 2023-11-13 14:42:30 +0900
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08 Tanuma_JSA_rev.pdf
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サイズ | 318KB | 詳細 |