Tanuma, S.
(技術開発・共用部門 運営室, NIMS)
;
Powell, C. J.
(NIST)
;
Penn, D. R.
(NIST)
説明:
(abstract)We have made additional evaluations of the electron inelastic mean free paths ([MFPs) and of the predictive IMFP formula TPP-2 presented in papers II and III of this series. Comparisons have been made with other formulae for the IMFPs and electron attenuation lengths (ALs). We find substantial differences between our IMFP results for 27 elements and 15 inorganic compounds and the AL formulae of Seah and Dench; these differences include different dependences on electron energy and on material parameters. We present IMFP calculations for Al2O3 and GaAs from TPP-2 in which each parameter of the formula is varied in some physically reasonable range about the true value for each compound; these results show the sensitivity of the computed IMFPs to the choices of parameter values. Finally, we give a summary of sources of uncertainty in the IMFP algorithm, in the experimental optical data from which IMFPs are calculated, and of the TPP-2 formula. We conclude that TPP-2 is robust and useful for predicting IMFPs for electron energies and material parameter values in ranges for which the formula was developed and tested.
権利情報:
キーワード: IMFP, predictive IMFP formula TPP-2, Evaluations of TPP-2 formula
刊行年月日: 2004-09-15
出版者: Wiley
掲載誌:
研究助成金:
原稿種別: 著者最終稿 (Accepted manuscript)
MDR DOI: https://doi.org/10.48505/nims.4255
公開URL: https://doi.org/10.1002/sia.740200112
関連資料:
その他の識別子:
連絡先: Tanuma, Shigeo (装置開発・共用部門, NIMS) tanuma-sh@tbd.t-com.ne.jp
更新時刻: 2023-11-07 15:36:26 +0900
MDRでの公開時刻: 2023-11-07 13:30:14 +0900
| ファイル名 | サイズ | |||
|---|---|---|---|---|
| ファイル名 |
IMFP IV AMS.pdf
(サムネイル)
application/pdf |
サイズ | 2.66MB | 詳細 |