17 件のレコードが見つかりました。
Role of deformation on the hydrogen trapping in the pearlitic steel
- ジャーナル論文
- 著者
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Z.H. Li (author) (この著者で検索)
https://orcid.org/0000-0002-3867-1462
(unauthenticated)
;
T.T. Sasaki (author) (この著者で検索)
;
R. Ueji (author) (この著者で検索)
;
;Y. Kimura (author) (この著者で検索)A. Shibata (author) (この著者で検索)
;
T. Ohkubo (author) (この著者で検索)
;
K. Hono (author) (この著者で検索)
- キーワード
- pearlitic steel, deformation, hydrogen, trapping site, atom probe tomography
- 刊行年月日
- 2023-11-16
- 更新時刻
- 2025-12-19 16:30:06 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- ジャーナル論文
- 著者
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;Yudai Yamaguchi (author) (この著者で検索);Yuta Inaba (author) (この著者で検索);Ryoji Arai (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索);Michinori Shiomi (author) (この著者で検索);Daiji Kasahara (author) (この著者で検索);Mikihiro Yokozeki (author) (この著者で検索);Noriyuki Fuutagawa (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Kouichi Akahane (author) (この著者で検索);Naokatsu Yamamoto (author) (この著者で検索)Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- quantum dot, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-11
- 更新時刻
- 2025-04-14 16:30:23 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
- ジャーナル論文
- 著者
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Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Claudia Fleischmann (author) (この著者で検索)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
;
;Jean-Philippe Soulié (author) (この著者で検索);Mustafa Ayyad (author) (この著者で検索)Jeroen E. Scheerder (author) (この著者で検索)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
;
;Christoph Adelmann (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Koji Michishio (author) (この著者で検索)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
;
;Nagayasu Oshima (author) (この著者で検索)Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
- キーワード
- atom probe tomography, positron annihilation
- 刊行年月日
- 2024-07-10
- 更新時刻
- 2025-07-10 08:30:19 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
- ジャーナル論文
- 著者
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;Yudai Yamaguchi (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2022-09-14
- 更新時刻
- 2024-01-05 22:12:51 +0900
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析
- ジャーナル論文
- 著者
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;佐々木 宏和 (author) (この著者で検索)古河電気工業株式会社;大場 洋次郎 (author) (この著者で検索)豊橋技術科学大学;廣井 孝介 (author) (この著者で検索)日本原子力研究開発機構;大沼 正人 (author) (この著者で検索)北海道大学埋橋 淳 (author) (この著者で検索)National Institute for Materials Science
;
大久保 忠勝 (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography
- 刊行年月日
- 更新時刻
- 2025-11-28 16:30:03 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- ジャーナル論文
- 著者
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;Simon Moore (author) (この著者で検索)Mari Takahashi (author) (この著者で検索)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
;
Philipp Sauerschnig (author) (この著者で検索)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
;
;Keiji Kobayashi (author) (この著者で検索);Koichi Higashimine (author) (この著者で検索);Masanobu Miyata (author) (この著者で検索);Takahiro Baba (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Michihiro Ohta (author) (この著者で検索)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
;
Takao Mori (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Shinya Maenosono (author) (この著者で検索)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- キーワード
- thermoelectric materials, electron microscopy, atom probe tomography
- 刊行年月日
- 2024-09-09
- 更新時刻
- 2025-08-26 08:30:23 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Kazuhiro Hono (author) (この著者で検索)
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy
- 刊行年月日
- 2025-02-03
- 更新時刻
- 2024-09-05 08:30:18 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- 刊行年月日
- 2023-02-19
- 更新時刻
- 2025-02-23 22:51:16 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
- ジャーナル論文
- 著者
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;Yohei Nomura (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Tatsuya Tomita (author) (この著者で検索);Toru Takahashi (author) (この著者で検索);Hidenori Kuwata (author) (この著者で検索)Taichi Abe (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography
- 刊行年月日
- 2020-11-06
- 更新時刻
- 2024-04-05 10:56:21 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
- プロシーディングス論文
- 著者
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;Ryo Tanaka (author) (この著者で検索)Fuji Electric Co., Ltd.;Shinya Takashima (author) (この著者で検索)Fuji Electric Co., Ltd.;Katsunori Ueno (author) (この著者で検索)Fuji Electric Co., Ltd.;Masahiro Horita (author) (この著者で検索)Nagoya Univ.;Jun Suda (author) (この著者で検索)Nagoya Univ.Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Masaharu Edo (author) (この著者で検索)Fuji Electric Co., Ltd.
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2023-06-08
- 更新時刻
- 2024-04-19 12:30:23 +0900