キーワード: atom probe tomography
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8 件のレコードが見つかりました。

Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesised SnSe2 Nanosheets.pdf
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
ジャーナル論文
著者
Simon Moore (author) (この著者で検索)
;
Mari Takahashi (author) (この著者で検索)
ORCID ;
Philipp Sauerschnig (author) (この著者で検索)
ORCID ;
Keiji Kobayashi (author) (この著者で検索)
;
Koichi Higashimine (author) (この著者で検索)
;
Masanobu Miyata (author) (この著者で検索)
;
Takahiro Baba (author) (この著者で検索)
; ORCID SAMURAI ;
Michihiro Ohta (author) (この著者で検索)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ;
Shinya Maenosono (author) (この著者で検索)
ORCID
キーワード
thermoelectric materials, electron microscopy, atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography.pdf
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono (author) (この著者で検索)
ORCID ;
Claudia Fleischmann (author) (この著者で検索)
ORCID ;
Jean-Philippe Soulié (author) (この著者で検索)
;
Mustafa Ayyad (author) (この著者で検索)
;
Jeroen E. Scheerder (author) (この著者で検索)
ORCID ;
Christoph Adelmann (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Koji Michishio (author) (この著者で検索)
ORCID ;
Nagayasu Oshima (author) (この著者で検索)
;
Shoji Ishibashi (author) (この著者で検索)
ORCID
キーワード
atom probe tomography, positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
atom probe tomography, focused ion beam, scanning electron microscopy, automation
刊行年月日
2023-02-19
更新時刻
2025-02-23 22:51:16 +0900
66_MT-D2024005.pdf
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
ジャーナル論文
著者
Hirokazu Sasaki (author) (この著者で検索)
;
Syunta Akiya (author) (この著者で検索)
;
Kuniteru Mihara (author) (この著者で検索)
;
Yojiro Oba (author) (この著者で検索)
;
Masato Onuma (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
atom probe tomography
刊行年月日
2025-01-01
更新時刻
2025-01-08 16:31:18 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
atom probe tomography, focused ion beam, scanning electron microscopy
刊行年月日
2025-02-03
更新時刻
2024-09-05 08:30:18 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
;
Keita Kataoka (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenta Chokawa (author) (この著者で検索)
;
Hideki Sakurai (author) (この著者で検索)
;
Akira Uedono (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Ritsuo Otsuki (author) (この著者で検索)
;
Koki Kobayashi (author) (この著者で検索)
;
Yuta Itoh (author) (この著者で検索)
;
Masahiro Nagao (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Suda (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
キーワード
gallium nitride, transmission electron microscopy, atom probe tomography
刊行年月日
2022-08-14
更新時刻
2024-01-05 22:13:58 +0900
Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
ORCID ;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Koki Kobayashi (author) (この著者で検索)
;
Kosuke Ishikawa (author) (この著者で検索)
;
Kyosuke Sawabe (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
ORCID
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900