キーワード: atom probe tomography

7 件のレコードが見つかりました。

Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
ORCID ;
Jun Uzuhashi (author) (この著者で検索)
ORCID SAMURAI ;
Koki Kobayashi (author) (この著者で検索)
;
Kosuke Ishikawa (author) (この著者で検索)
;
Kyosuke Sawabe (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
ORCID SAMURAI ;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
ORCID
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900

Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography.pdf
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono (author) (この著者で検索)
ORCID ;
Claudia Fleischmann (author) (この著者で検索)
ORCID ;
Jean-Philippe Soulié (author) (この著者で検索)
;
Mustafa Ayyad (author) (この著者で検索)
;
Jeroen E. Scheerder (author) (この著者で検索)
ORCID ;
Christoph Adelmann (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Koji Michishio (author) (この著者で検索)
ORCID ;
Nagayasu Oshima (author) (この著者で検索)
;
Shoji Ishibashi (author) (この著者で検索)
ORCID
キーワード
atom probe tomography, positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900

Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe-Si-B-P-Cu-C alloy.pdf
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
ジャーナル論文
著者
Shozo Hiramoto (author) (この著者で検索)
ORCID ;
Satoshi Okamoto (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ;
Akihiko Toda (author) (この著者で検索)
;
Sangwook Kim (author) (この著者で検索)
;
Chikako Moriyoshi (author) (この著者で検索)
;
Yoshihiro Kuroiwa (author) (この著者で検索)
キーワード
atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
刊行年月日
2025-02-10
更新時刻
2026-02-11 08:30:29 +0900

Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
ジャーナル論文
著者
Yudai Yamaguchi (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
;
Yoshihiro Kudo (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
ORCID SAMURAI ;
Shigetaka Tomiya (author) (この著者で検索)
キーワード
InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
刊行年月日
2022-09-14
更新時刻
2024-01-05 22:12:51 +0900

Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
ORCID SAMURAI
キーワード
atom probe tomography, focused ion beam, scanning electron microscopy, automation
刊行年月日
2023-02-19
更新時刻
2025-02-23 22:51:16 +0900

Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900

66_MT-D2024005.pdf
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
ジャーナル論文
著者
Hirokazu Sasaki (author) (この著者で検索)
;
Syunta Akiya (author) (この著者で検索)
;
Kuniteru Mihara (author) (この著者で検索)
;
Yojiro Oba (author) (この著者で検索)
;
Masato Onuma (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
ORCID SAMURAI
キーワード
atom probe tomography
刊行年月日
2025-01-01
更新時刻
2025-01-08 16:31:18 +0900