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Resource type
Article(17)
Proceedings(1)
Keyword
atom probe tomography (18)
transmission electron microscopy (8)
gallium nitride (5)
cathodoluminescence (2)
focused ion beam (2)
scanning electron microscopy (2)
Correlative microscopy (1)
Corson alloy (1)
Ferroelastic transformation (1)
InGaN (1)
(more)
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In Copyright (9)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (6)
Creative Commons BY Attribution 4.0 International (3)
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application/pdf (16)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (2)
Keyword: atom probe tomography
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18 records found.
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析
Article
Creator
佐々木 宏和 ; 大場 洋次郎 ; 廣井 孝介 ; 大沼 正人 ;
埋橋 淳
;
大久保 忠勝
Keyword
atom probe tomography
Date published
Updated at
2025-11-28 16:30:03 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
Article
Creator
Shozo Hiramoto
; Satoshi Okamoto ;
Jun Uzuhashi
;
Tadakatsu Ohkubo
; Akihiko Toda ; Sangwook Kim ; Chikako Moriyoshi ; Yoshihiro Kuroiwa
Keyword
atom probe tomography
,
transmission electron microscopy
,
nanocrystalline soft magnetic material
Date published
2025-02-10
Updated at
2026-02-11 08:30:29 +0900
Role of deformation on the hydrogen trapping in the pearlitic steel
Article
Creator
Z.H. Li
;
T.T. Sasaki
;
R. Ueji
; Y. Kimura ;
A. Shibata
;
T. Ohkubo
;
K. Hono
Keyword
pearlitic steel
,
deformation
,
hydrogen
,
trapping site
,
atom probe tomography
Date published
2023-11-16
Updated at
2025-12-19 16:30:06 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
Article
Creator
Hirokazu Sasaki ; Syunta Akiya ; Kuniteru Mihara ; Yojiro Oba ; Masato Onuma ;
Jun Uzuhashi
;
Tadakatsu Ohkubo
Keyword
atom probe tomography
Date published
2025-01-01
Updated at
2025-01-08 16:31:18 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
Article
Creator
Simon Moore ;
Mari Takahashi
;
Philipp Sauerschnig
; Keiji Kobayashi ; Koichi Higashimine ; Masanobu Miyata ; Takahiro Baba ;
Jun Uzuhashi
;
Michihiro Ohta
;
Takao Mori
;
Tadakatsu Ohkubo
;
Shinya Maenosono
Keyword
thermoelectric materials
,
electron microscopy
,
atom probe tomography
Date published
2024-09-09
Updated at
2025-08-26 08:30:23 +0900
On the correlative microscopy analyses of nano-twinned domains in 2 mol % zirconia alloyed yttrium tantalate thermal barrier material
Article
Creator
K. Gururaj ;
Mainak Saha
; Sumit Kumar Maurya ; Rajat Nama ; A. Alankar ; M.B. Ponnuchamy ; K.G. Pradeep
Keyword
Correlative microscopy
,
Ferroelastic transformation
,
Nanotwins
,
transmission Kikuchi diffraction
,
atom probe tomography
Date published
2022-02-09
Updated at
2024-10-08 11:52:48 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
Article
Creator
Yudai Yamaguchi ; Yuta Inaba ; Ryoji Arai ; Yuya Kanitani ; Yoshihiro Kudo ; Michinori Shiomi ; Daiji Kasahara ; Mikihiro Yokozeki ; Noriyuki Fuutagawa ;
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Kazuhiro Hono
; Kouichi Akahane ; Naokatsu Yamamoto ; Shigetaka Tomiya
Keyword
quantum dot
,
atom probe tomography
,
transmission electron microscopy
Date published
2024-04-11
Updated at
2025-04-14 16:30:23 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
Article
Creator
Emi Kano
;
Jun Uzuhashi
; Koki Kobayashi ; Kosuke Ishikawa ; Kyosuke Sawabe ; Tetsuo Narita ; Kacper Sierakowski ; Michal Bockowski ;
Tadakatsu Ohkubo
; Tetsu Kachi ;
Nobuyuki Ikarashi
Keyword
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
Date published
2024-04-22
Updated at
2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
Article
Creator
Jun Uzuhashi
;
Jun Chen
; Ryo Tanaka ; Shinya Takashima ; Masaharu Edo ;
Tadakatsu Ohkubo
; Takashi Sekiguchi
Keyword
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
Date published
2024-08-07
Updated at
2024-08-03 08:30:15 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
Article
Creator
Akira Uedono
;
Claudia Fleischmann
; Jean-Philippe Soulié ; Mustafa Ayyad ;
Jeroen E. Scheerder
; Christoph Adelmann ;
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Koji Michishio
; Nagayasu Oshima ;
Shoji Ishibashi
Keyword
atom probe tomography
,
positron annihilation
Date published
2024-07-10
Updated at
2025-07-10 08:30:19 +0900
Keyword
atom probe tomography
(18)
transmission electron microscopy
(8)
gallium nitride
(5)
cathodoluminescence
(2)
focused ion beam
(2)
scanning electron microscopy
(2)
Correlative microscopy
(1)
Corson alloy
(1)
Ferroelastic transformation
(1)
InGaN
(1)
Nanotwins
(1)
automation
(1)
deformation
(1)
dislocation
(1)
electron microscopy
(1)
hydrogen
(1)
implantation
(1)
nanocrystalline soft magnetic material
(1)
pearlitic steel
(1)
pipe diffusion
(1)
positron annihilation
(1)
quantum dot
(1)
scanning transmission electron microscopy
(1)
thermoelectric materials
(1)
transmission Kikuchi diffraction
(1)
trapping site
(1)
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