8 records found. Displaying records 1 to 8.
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
- Conference paper
- Creator
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;Ryo Tanaka (author) (Search by this author)Fuji Electric Co., Ltd.;Shinya Takashima (author) (Search by this author)Fuji Electric Co., Ltd.;Katsunori Ueno (author) (Search by this author)Fuji Electric Co., Ltd.;Masahiro Horita (author) (Search by this author)Nagoya Univ.;Jun Suda (author) (Search by this author)Nagoya Univ.Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Masaharu Edo (author) (Search by this author)Fuji Electric Co., Ltd. - Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy
- Date published
- 2023-06-08
- Updated at
- 2024-04-19 12:30:23 +0900
Role of deformation on the hydrogen trapping in the pearlitic steel
- Journal article
- Creator
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Z.H. Li (author) (Search by this author)
https://orcid.org/0000-0002-3867-1462
(unauthenticated)
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T.T. Sasaki (author) (Search by this author)
;
R. Ueji (author) (Search by this author)
;
;Y. Kimura (author) (Search by this author)A. Shibata (author) (Search by this author)
;
T. Ohkubo (author) (Search by this author)
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K. Hono (author) (Search by this author)
- Keyword
- pearlitic steel, deformation, hydrogen, trapping site, atom probe tomography
- Date published
- 2023-11-16
- Updated at
- 2025-12-19 16:30:06 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- Journal article
- Creator
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;Simon Moore (author) (Search by this author)Mari Takahashi (author) (Search by this author)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
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Philipp Sauerschnig (author) (Search by this author)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
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;Keiji Kobayashi (author) (Search by this author);Koichi Higashimine (author) (Search by this author);Masanobu Miyata (author) (Search by this author);Takahiro Baba (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
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Michihiro Ohta (author) (Search by this author)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
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Takao Mori (author) (Search by this author)
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Tadakatsu Ohkubo (author) (Search by this author)
;
Shinya Maenosono (author) (Search by this author)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- Keyword
- thermoelectric materials, electron microscopy, atom probe tomography
- Date published
- 2024-09-09
- Updated at
- 2025-08-26 08:30:23 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
- Journal article
- Creator
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;Hirokazu Sasaki (author) (Search by this author);Syunta Akiya (author) (Search by this author);Kuniteru Mihara (author) (Search by this author);Yojiro Oba (author) (Search by this author);Masato Onuma (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2025-01-01
- Updated at
- 2025-01-08 16:31:18 +0900
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
- Journal article
- Creator
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;Kosuke Ishikawa (author) (Search by this author)Emi Kano (author) (Search by this author)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
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Jun Uzuhashi (author) (Search by this author)
;
;Kensuke Sumida (author) (Search by this author)Tetsuo Narita (author) (Search by this author)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
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Masahiro Horita (author) (Search by this author)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
;
;Junya Sahashi (author) (Search by this author)Shun Lu (author) (Search by this author)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
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Jun Suda (author) (Search by this author)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
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Tadakatsu Ohkubo (author) (Search by this author)
;
Tetsu Kachi (author) (Search by this author)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
;
Nobuyuki Ikarashi (author) (Search by this author)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- Keyword
- gallium nitride, atom probe tomography
- Date published
- 2026-06-22
- Updated at
- 2026-06-25 09:46:49 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
- Journal article
- Creator
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;Yudai Yamaguchi (author) (Search by this author);Yuya Kanitani (author) (Search by this author);Yoshihiro Kudo (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
;
Shigetaka Tomiya (author) (Search by this author)
- Keyword
- InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
- Date published
- 2022-09-14
- Updated at
- 2024-01-05 22:12:51 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- Journal article
- Creator
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;Yudai Yamaguchi (author) (Search by this author);Yuta Inaba (author) (Search by this author);Ryoji Arai (author) (Search by this author);Yuya Kanitani (author) (Search by this author);Yoshihiro Kudo (author) (Search by this author);Michinori Shiomi (author) (Search by this author);Daiji Kasahara (author) (Search by this author);Mikihiro Yokozeki (author) (Search by this author);Noriyuki Fuutagawa (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
;
;Kouichi Akahane (author) (Search by this author);Naokatsu Yamamoto (author) (Search by this author)Shigetaka Tomiya (author) (Search by this author)
- Keyword
- quantum dot, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-11
- Updated at
- 2025-04-14 16:30:23 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- Journal article
- Creator
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;Emi Kano (author) (Search by this author);Keita Kataoka (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
;Kenta Chokawa (author) (Search by this author);Hideki Sakurai (author) (Search by this author);Akira Uedono (author) (Search by this author);Tetsuo Narita (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author);Ritsuo Otsuki (author) (Search by this author);Koki Kobayashi (author) (Search by this author);Yuta Itoh (author) (Search by this author);Masahiro Nagao (author) (Search by this author)Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
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;Jun Suda (author) (Search by this author);Tetsu Kachi (author) (Search by this author)Nobuyuki Ikarashi (author) (Search by this author)
- Keyword
- gallium nitride, transmission electron microscopy, atom probe tomography
- Date published
- 2022-08-14
- Updated at
- 2024-01-05 22:13:58 +0900