17 records found. Displaying records 1 to 10.
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Kazuhiro Hono (author) (Search by this author)
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy
- Date published
- 2025-02-03
- Updated at
- 2024-09-05 08:30:18 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- Journal article
- Creator
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;Emi Kano (author) (Search by this author);Keita Kataoka (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
;Kenta Chokawa (author) (Search by this author);Hideki Sakurai (author) (Search by this author);Akira Uedono (author) (Search by this author);Tetsuo Narita (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author);Ritsuo Otsuki (author) (Search by this author);Koki Kobayashi (author) (Search by this author);Yuta Itoh (author) (Search by this author);Masahiro Nagao (author) (Search by this author)Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
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;Jun Suda (author) (Search by this author);Tetsu Kachi (author) (Search by this author)Nobuyuki Ikarashi (author) (Search by this author)
- Keyword
- gallium nitride, transmission electron microscopy, atom probe tomography
- Date published
- 2022-08-14
- Updated at
- 2024-01-05 22:13:58 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Jun Chen (author) (Search by this author)National Institute for Materials Science
;
Ashutosh Kumar (author) (Search by this author)
https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
;
Wei Yi (author) (Search by this author)
https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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;Ryo Tanaka (author) (Search by this author);Shinya Takashima (author) (Search by this author);Masaharu Edo (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author);Hideki Sakurai (author) (Search by this author);Tetsu Kachi (author) (Search by this author)Takashi Sekiguchi (author) (Search by this author)
https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
- Date published
- 2022-05-14
- Updated at
- 2024-01-05 22:11:22 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- Journal article
- Creator
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;Yudai Yamaguchi (author) (Search by this author);Yuta Inaba (author) (Search by this author);Ryoji Arai (author) (Search by this author);Yuya Kanitani (author) (Search by this author);Yoshihiro Kudo (author) (Search by this author);Michinori Shiomi (author) (Search by this author);Daiji Kasahara (author) (Search by this author);Mikihiro Yokozeki (author) (Search by this author);Noriyuki Fuutagawa (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
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;Kouichi Akahane (author) (Search by this author);Naokatsu Yamamoto (author) (Search by this author)Shigetaka Tomiya (author) (Search by this author)
- Keyword
- quantum dot, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-11
- Updated at
- 2025-04-14 16:30:23 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
- Journal article
- Creator
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;Yohei Nomura (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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;Tatsuya Tomita (author) (Search by this author);Toru Takahashi (author) (Search by this author);Hidenori Kuwata (author) (Search by this author)Taichi Abe (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2020-11-06
- Updated at
- 2024-04-05 10:56:21 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- Date published
- 2023-02-19
- Updated at
- 2025-02-23 22:51:16 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
- Journal article
- Creator
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;Hirokazu Sasaki (author) (Search by this author);Syunta Akiya (author) (Search by this author);Kuniteru Mihara (author) (Search by this author);Yojiro Oba (author) (Search by this author);Masato Onuma (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2025-01-01
- Updated at
- 2025-01-08 16:31:18 +0900
X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析
- Journal article
- Creator
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;佐々木 宏和 (author) (Search by this author)古河電気工業株式会社;秋谷 俊太 (author) (Search by this author)古河電気工業株式会社;三原 邦照 (author) (Search by this author)古河電気工業株式会社;大場 洋次郎 (author) (Search by this author)豊橋技術科学大学;大沼 正人 (author) (Search by this author)北海道大学埋橋 淳 (author) (Search by this author)
;
大久保 忠勝 (author) (Search by this author)
- Keyword
- atom probe tomography, transmission electron microscopy, Corson alloy
- Date published
- Updated at
- 2024-01-30 09:51:05 +0900
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
- Journal article
- Creator
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;Kosuke Ishikawa (author) (Search by this author)Emi Kano (author) (Search by this author)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
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Jun Uzuhashi (author) (Search by this author)
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;Kensuke Sumida (author) (Search by this author)Tetsuo Narita (author) (Search by this author)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
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Masahiro Horita (author) (Search by this author)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
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;Junya Sahashi (author) (Search by this author)Shun Lu (author) (Search by this author)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
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Jun Suda (author) (Search by this author)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
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Tadakatsu Ohkubo (author) (Search by this author)
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Tetsu Kachi (author) (Search by this author)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
;
Nobuyuki Ikarashi (author) (Search by this author)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- Keyword
- gallium nitride, atom probe tomography
- Date published
- 2026-06-22
- Updated at
- 2026-06-25 09:46:49 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
- Journal article
- Creator
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Akira Uedono (author) (Search by this author)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
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Claudia Fleischmann (author) (Search by this author)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
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;Jean-Philippe Soulié (author) (Search by this author);Mustafa Ayyad (author) (Search by this author)Jeroen E. Scheerder (author) (Search by this author)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
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;Christoph Adelmann (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
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Tadakatsu Ohkubo (author) (Search by this author)
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Koji Michishio (author) (Search by this author)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
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;Nagayasu Oshima (author) (Search by this author)Shoji Ishibashi (author) (Search by this author)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
- Keyword
- atom probe tomography, positron annihilation
- Date published
- 2024-07-10
- Updated at
- 2025-07-10 08:30:19 +0900