Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
- Conference paper
- Creator
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;Ryo Tanaka (author) (Search by this author)Fuji Electric Co., Ltd.;Shinya Takashima (author) (Search by this author)Fuji Electric Co., Ltd.;Katsunori Ueno (author) (Search by this author)Fuji Electric Co., Ltd.;Masahiro Horita (author) (Search by this author)Nagoya Univ.;Jun Suda (author) (Search by this author)Nagoya Univ.Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Masaharu Edo (author) (Search by this author)Fuji Electric Co., Ltd. - Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy
- Date published
- 2023-06-08
- Updated at
- 2024-04-19 12:30:23 +0900
On the correlative microscopy analyses of nano-twinned domains in 2 mol % zirconia alloyed yttrium tantalate thermal barrier material
- Journal article
- Creator
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;K. Gururaj (author) (Search by this author)Mainak Saha (author) (Search by this author)Metallurgical and Materials Engineering, Indian Institute of Technology, Madras
;
;Sumit Kumar Maurya (author) (Search by this author);Rajat Nama (author) (Search by this author);A. Alankar (author) (Search by this author);M.B. Ponnuchamy (author) (Search by this author)K.G. Pradeep (author) (Search by this author)
- Keyword
- Correlative microscopy, Ferroelastic transformation, Nanotwins, transmission Kikuchi diffraction, atom probe tomography
- Date published
- 2022-02-09
- Updated at
- 2024-10-08 11:52:48 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
- Journal article
- Creator
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;Yohei Nomura (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
;Tatsuya Tomita (author) (Search by this author);Toru Takahashi (author) (Search by this author);Hidenori Kuwata (author) (Search by this author)Taichi Abe (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2020-11-06
- Updated at
- 2024-04-05 10:56:21 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
- Journal article
- Creator
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;Hirokazu Sasaki (author) (Search by this author);Syunta Akiya (author) (Search by this author);Kuniteru Mihara (author) (Search by this author);Yojiro Oba (author) (Search by this author);Masato Onuma (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2025-01-01
- Updated at
- 2025-01-08 16:31:18 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
- Journal article
- Creator
-
Shozo Hiramoto (author) (Search by this author)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
;
;Satoshi Okamoto (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
;Akihiko Toda (author) (Search by this author);Sangwook Kim (author) (Search by this author);Chikako Moriyoshi (author) (Search by this author)Yoshihiro Kuroiwa (author) (Search by this author) - Keyword
- atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
- Date published
- 2025-02-10
- Updated at
- 2026-02-11 08:30:29 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Kazuhiro Hono (author) (Search by this author)
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy
- Date published
- 2025-02-03
- Updated at
- 2024-09-05 08:30:18 +0900
Role of deformation on the hydrogen trapping in the pearlitic steel
- Journal article
- Creator
-
Z.H. Li (author) (Search by this author)
https://orcid.org/0000-0002-3867-1462
(unauthenticated)
;
T.T. Sasaki (author) (Search by this author)
;
R. Ueji (author) (Search by this author)
;
;Y. Kimura (author) (Search by this author)A. Shibata (author) (Search by this author)
;
T. Ohkubo (author) (Search by this author)
;
K. Hono (author) (Search by this author)
- Keyword
- pearlitic steel, deformation, hydrogen, trapping site, atom probe tomography
- Date published
- 2023-11-16
- Updated at
- 2025-12-19 16:30:06 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
- Journal article
- Creator
-
Emi Kano (author) (Search by this author)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
;Koki Kobayashi (author) (Search by this author);Kosuke Ishikawa (author) (Search by this author);Kyosuke Sawabe (author) (Search by this author);Tetsuo Narita (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author)Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
;Tetsu Kachi (author) (Search by this author)Nobuyuki Ikarashi (author) (Search by this author)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-22
- Updated at
- 2024-09-20 16:30:27 +0900
X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析
- Journal article
- Creator
-
;佐々木 宏和 (author) (Search by this author)古河電気工業株式会社;秋谷 俊太 (author) (Search by this author)古河電気工業株式会社;三原 邦照 (author) (Search by this author)古河電気工業株式会社;大場 洋次郎 (author) (Search by this author)豊橋技術科学大学;大沼 正人 (author) (Search by this author)北海道大学埋橋 淳 (author) (Search by this author)
;
大久保 忠勝 (author) (Search by this author)
- Keyword
- atom probe tomography, transmission electron microscopy, Corson alloy
- Date published
- Updated at
- 2024-01-30 09:51:05 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- Journal article
- Creator
-
;Simon Moore (author) (Search by this author)Mari Takahashi (author) (Search by this author)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
;
Philipp Sauerschnig (author) (Search by this author)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
;
;Keiji Kobayashi (author) (Search by this author);Koichi Higashimine (author) (Search by this author);Masanobu Miyata (author) (Search by this author);Takahiro Baba (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Michihiro Ohta (author) (Search by this author)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
;
Takao Mori (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Shinya Maenosono (author) (Search by this author)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- Keyword
- thermoelectric materials, electron microscopy, atom probe tomography
- Date published
- 2024-09-09
- Updated at
- 2025-08-26 08:30:23 +0900