On the correlative microscopy analyses of nano-twinned domains in 2 mol % zirconia alloyed yttrium tantalate thermal barrier material
- Journal article
- Creator
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;K. Gururaj (author) (Search by this author)Mainak Saha (author) (Search by this author)Metallurgical and Materials Engineering, Indian Institute of Technology, Madras
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;Sumit Kumar Maurya (author) (Search by this author);Rajat Nama (author) (Search by this author);A. Alankar (author) (Search by this author);M.B. Ponnuchamy (author) (Search by this author)K.G. Pradeep (author) (Search by this author) - Keyword
- Correlative microscopy, Ferroelastic transformation, Nanotwins, transmission Kikuchi diffraction, atom probe tomography
- Date published
- 2022-02-09
- Updated at
- 2024-10-08 11:52:48 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- Journal article
- Creator
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;Simon Moore (author) (Search by this author)Mari Takahashi (author) (Search by this author)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
;
Philipp Sauerschnig (author) (Search by this author)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
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;Keiji Kobayashi (author) (Search by this author);Koichi Higashimine (author) (Search by this author);Masanobu Miyata (author) (Search by this author);Takahiro Baba (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
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Michihiro Ohta (author) (Search by this author)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
;
Takao Mori (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Shinya Maenosono (author) (Search by this author)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- Keyword
- thermoelectric materials, electron microscopy, atom probe tomography
- Date published
- 2024-09-09
- Updated at
- 2025-08-26 08:30:23 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- Journal article
- Creator
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;Yudai Yamaguchi (author) (Search by this author);Yuta Inaba (author) (Search by this author);Ryoji Arai (author) (Search by this author);Yuya Kanitani (author) (Search by this author);Yoshihiro Kudo (author) (Search by this author);Michinori Shiomi (author) (Search by this author);Daiji Kasahara (author) (Search by this author);Mikihiro Yokozeki (author) (Search by this author);Noriyuki Fuutagawa (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
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;Kouichi Akahane (author) (Search by this author);Naokatsu Yamamoto (author) (Search by this author)Shigetaka Tomiya (author) (Search by this author)
- Keyword
- quantum dot, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-11
- Updated at
- 2025-04-14 16:30:23 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Jun Chen (author) (Search by this author)National Institute for Materials Science
;
Ashutosh Kumar (author) (Search by this author)
https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
;
Wei Yi (author) (Search by this author)
https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
;Ryo Tanaka (author) (Search by this author);Shinya Takashima (author) (Search by this author);Masaharu Edo (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author);Hideki Sakurai (author) (Search by this author);Tetsu Kachi (author) (Search by this author)Takashi Sekiguchi (author) (Search by this author)
https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
- Date published
- 2022-05-14
- Updated at
- 2024-01-05 22:11:22 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
- Journal article
- Creator
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Akira Uedono (author) (Search by this author)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Claudia Fleischmann (author) (Search by this author)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
;
;Jean-Philippe Soulié (author) (Search by this author);Mustafa Ayyad (author) (Search by this author)Jeroen E. Scheerder (author) (Search by this author)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
;
;Christoph Adelmann (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Koji Michishio (author) (Search by this author)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
;
;Nagayasu Oshima (author) (Search by this author)Shoji Ishibashi (author) (Search by this author)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
- Keyword
- atom probe tomography, positron annihilation
- Date published
- 2024-07-10
- Updated at
- 2025-07-10 08:30:19 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)Research Center for Magnetic and Spintronic Materials/Administrative Office, National Institute for Materials Science
;
Jun Chen (author) (Search by this author)Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
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;Ryo Tanaka (author) (Search by this author)Fuji Electric Corporation;Shinya Takashima (author) (Search by this author)Fuji Electric Corporation;Masaharu Edo (author) (Search by this author)Fuji Electric CorporationTadakatsu Ohkubo (author) (Search by this author)Research Center for Magnetic and Spintronic Materials, National Institute for Materials Science
;
Takashi Sekiguchi (author) (Search by this author)University of Tsukuba
- Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
- Date published
- 2024-08-07
- Updated at
- 2024-08-03 08:30:15 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- Date published
- 2023-02-19
- Updated at
- 2025-02-23 22:51:16 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
- Journal article
- Creator
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Shozo Hiramoto (author) (Search by this author)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
;
;Satoshi Okamoto (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
;Akihiko Toda (author) (Search by this author);Sangwook Kim (author) (Search by this author);Chikako Moriyoshi (author) (Search by this author)Yoshihiro Kuroiwa (author) (Search by this author)
- Keyword
- atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
- Date published
- 2025-02-10
- Updated at
- 2026-02-11 08:30:29 +0900
Role of deformation on the hydrogen trapping in the pearlitic steel
- Journal article
- Creator
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Z.H. Li (author) (Search by this author)
https://orcid.org/0000-0002-3867-1462
(unauthenticated)
;
T.T. Sasaki (author) (Search by this author)
;
R. Ueji (author) (Search by this author)
;
;Y. Kimura (author) (Search by this author)A. Shibata (author) (Search by this author)
;
T. Ohkubo (author) (Search by this author)
;
K. Hono (author) (Search by this author)
- Keyword
- pearlitic steel, deformation, hydrogen, trapping site, atom probe tomography
- Date published
- 2023-11-16
- Updated at
- 2025-12-19 16:30:06 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- Journal article
- Creator
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;Emi Kano (author) (Search by this author);Keita Kataoka (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
;Kenta Chokawa (author) (Search by this author);Hideki Sakurai (author) (Search by this author);Akira Uedono (author) (Search by this author);Tetsuo Narita (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author);Ritsuo Otsuki (author) (Search by this author);Koki Kobayashi (author) (Search by this author);Yuta Itoh (author) (Search by this author);Masahiro Nagao (author) (Search by this author)Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
;
;Jun Suda (author) (Search by this author);Tetsu Kachi (author) (Search by this author)Nobuyuki Ikarashi (author) (Search by this author)
- Keyword
- gallium nitride, transmission electron microscopy, atom probe tomography
- Date published
- 2022-08-14
- Updated at
- 2024-01-05 22:13:58 +0900