84 records found. Displaying records 21 to 30.
First-principles lattice thermal conductivity calculation for HfO2 / P4_2/mnm (136) / materials id 776532
- Dataset
- Collection
- MDR lattice thermal conductivity calculation database
- Creator
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Atsushi Togo (author) (Search by this author)Center for Basic Research on Materials, National Institute for Materials Science
- Keyword
- Lattice thermal conductivity, HfO2
- Date published
- Updated at
- 2026-01-24 12:16:34 +0900
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- Journal article
- Creator
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Ogiwara, Toshiya (author) (Search by this author)
;
Nagata, Takahiro (author) (Search by this author)
;
Yoshikawa, Hideki (author) (Search by this author)
- Keyword
- Auger Depth Profiling Analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- Date published
- 2020-06-04
- Updated at
- 2022-10-03 01:48:14 +0900
Effects of oxidant selection for atomic layer deposition on impurity removal and crystallinity of as-grown Hf1− x Zr x O2 thin films
- Journal article
- Creator
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;Haoming Che (author) (Search by this author)Takashi Onaya (author) (Search by this author)
https://orcid.org/0000-0002-2710-8623
(unauthenticated)
National Institute for Materials Science
;
;Atsushi Tamura (author) (Search by this author);Masaki Ishii (author) (Search by this author);Hiroshi Taka (author) (Search by this author)Koji Kita (author) (Search by this author) - Keyword
- atomic layer deposition, ferroelectric HfO2-based thin films, oxidant, low temperature fabrication process
- Date published
- 2026-05-01
- Updated at
- 2026-07-14 10:27:45 +0900
Interface engineering of HfO 2 -based ferroelectric devices for crystal phase control and enhanced ferroelectricity using atomic-layer-deposited ZrO 2 nucleation layers
- Journal article
- Creator
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Takashi Onaya (author) (Search by this author)
https://orcid.org/0000-0002-2710-8623
(unauthenticated)
National Institute for Materials Science
;
Toshihide Nabatame (author) (Search by this author)National Institute for Materials Science
- Keyword
- atomic layer deposition, ferroelectric HfO2-based thin films, memory devices, interface engineering, crystal phase control
- Date published
- 2026-04-30
- Updated at
- 2026-07-13 17:01:06 +0900
Optical properties of hafnium-dioxide derived from reflection electron energy loss spectroscopy spectra
- Journal article
- Creator
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;J.M. Gong (author) (Search by this author);X. Liu (author) (Search by this author);L.H. Yang (author) (Search by this author);A. Sulyok (author) (Search by this author);Z. Baji (author) (Search by this author);V. Kis (author) (Search by this author);K. Tőkési (author) (Search by this author);R.G. Zeng (author) (Search by this author);G.J. Fang (author) (Search by this author);J.B. Gong (author) (Search by this author);X.D. Xiao (author) (Search by this author)B. Da (author) (Search by this author)National Institute for Materials Science
;
Z.J. Ding (author) (Search by this author)
- Keyword
- optical data
- Date published
- 2024-07-28
- Updated at
- 2024-12-07 12:30:14 +0900
Phase Identification of 850 nm Thick 7%YO1.5–93%HfO2 Films by Surface and Cross-Sectional Raman Spectroscopies
- Journal article
- Creator
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;Takanori Mimura (author) (Search by this author);Yuma Takahashi (author) (Search by this author);Takahisa Shiraishi (author) (Search by this author);Masanori Kodera (author) (Search by this author);Reijiro Shimura (author) (Search by this author);Keisuke Ishihama (author) (Search by this author);Kazuki Okamoto (author) (Search by this author);Hiroki Moriwake (author) (Search by this author);Ayako Taguchi (author) (Search by this author)Takao Shimizu (author) (Search by this author)National Institute for Materials Science
;
;Yasuhiro Fujii (author) (Search by this author);Akitoshi Koreeda (author) (Search by this author)Hiroshi Funakubo (author) (Search by this author)
- Keyword
- Raman spectroscopy, field-induced phase transition, Multiple phase, HfO2-based ferroelectric film
- Date published
- 2024-04-23
- Updated at
- 2024-12-24 13:59:01 +0900
Reliability Challenges in Equivalent-Oxide-Thickness Scaling with High-κ Er2O3 Dielectrics on Two-Dimensional MoS2 Field-Effect Transistors
- Journal article
- Creator
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;Shuhong Li (author) (Search by this author);Ryotaro Otake (author) (Search by this author);Tomonori Nishimura (author) (Search by this author)Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
Yoshiki Sakuma (author) (Search by this author)National Institute for Materials Science
;
Kosuke Nagashio (author) (Search by this author)
- Keyword
- High-κ dielectric, MoS2, 2D semiconductor
- Date published
- 2025-05-05
- Updated at
- 2026-07-29 11:45:27 +0900
2D-3D integration of hexagonal boron nitride and a high-κ dielectric for ultrafast graphene-based electro-absorption modulators
- Journal article
- Creator
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;Hitesh Agarwal (author) (Search by this author);Bernat Terrés (author) (Search by this author);Lorenzo Orsini (author) (Search by this author);Alberto Montanaro (author) (Search by this author);Vito Sorianello (author) (Search by this author);Marianna Pantouvaki (author) (Search by this author)Kenji Watanabe (author) (Search by this author)National Institute for Materials Science
;
Takashi Taniguchi (author) (Search by this author)National Institute for Materials Science
;
;Dries Van Thourhout (author) (Search by this author);Marco Romagnoli (author) (Search by this author)Frank H. L. Koppens (author) (Search by this author)
- Keyword
- Electro-absorption modulators, graphene, high speed modulator
- Date published
- 2021-02-16
- Updated at
- 2025-02-28 08:30:41 +0900
Strain Control of (001)-Polar-Axis-Oriented Epitaxial Y-Doped HfO2 Thin Films
- Journal article
- Creator
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;Yoshiki Maekawa (author) (Search by this author);Koji Hirai (author) (Search by this author);Kazuki Okamoto (author) (Search by this author)Takao Shimizu (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Funakubo (author) (Search by this author)
- Keyword
- Ferroelectric HfO2-based film, Epitaxial film, {100} Orientation control, Polar axis orientation, Pulse laser deposition
- Date published
- 2024-07-25
- Updated at
- 2024-12-24 13:58:35 +0900
Experimental formation and mechanism study for super-high dielectric constant AlOx/TiOy nanolaminates
- Journal article
- Creator
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Jiangwei Liu (author) (Search by this author)National Institute for Materials Science
;
;Masayuki Okamura (author) (Search by this author);Hisanori Mashiko (author) (Search by this author)Masataka Imura (author) (Search by this author)National Institute for Materials Science
;
Meiyong Liao (author) (Search by this author)National Institute for Materials Science
;
;Ryosuke Kikuchi (author) (Search by this author);Michio Suzuka (author) (Search by this author)Yasuo Koide (author) (Search by this author)National Institute for Materials Science
- Keyword
- super-high dielectric constant, nanolaminate, ATO
- Date published
- 2023-04-02
- Updated at
- 2024-01-05 22:11:41 +0900