Keyword: XPS
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10 records found.

Origin of two-dimensional MXene ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy (1).pdf
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
Journal article
Creator
Prabhat Kumar (author) (Search by this author)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
Keyword
MXene, Interface, XPS
Date published
2025-12-31
Updated at
2025-09-16 12:30:22 +0900
【無機マテリアル学会】ご執筆原稿フォーマット_増田.docx
全固体リチウムイオン電池配置でのSi負極のオペランド反応解析
Journal article
Creator
増田 卓也 (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
オペランド, in situ, XPS, AFM
Date published
Updated at
2024-12-06 17:17:59 +0900
30_39.pdf
実験室型 XPS 装置による溶液種の観察と全固体電池の実働環境計測
Journal article
Creator
遠藤 頼夢 (author) (Search by this author)
National Institute for Materials Science
;
増田 卓也 (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
オペランド, in situ, XPS
Date published
2023-08-07
Updated at
2024-12-02 16:30:52 +0900
manuscript.pdf
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
Journal article
Creator
J. W. Liu (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
T. Teraji (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
B. Da (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Y. Koide (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
binding energy calibration, carbon-related materials, XPS, diamond, Band bending
Date published
2024-09-02
Updated at
2024-09-13 12:30:32 +0900
Dataset
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
Dataset
Creator
SUMIYA, Masatomo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
XPS, SPring-8 BL15, Si
Date published
Updated at
2024-05-24 08:30:24 +0900
06_プラハ_2006-1_cor.pdf
Determination of Inelastic Mean Free Paths in Elemental Solids in the 200 to 5000 eV Energy Range by Absolute Elastic Peak Electron Spectroscopy
Conference presentation
Creator
ORCID SAMURAI ;
Okamoto, N (author) (Search by this author)
物質・材料研究機構
;
Azuma, Y (author) (Search by this author)
;
Kimura, T (author) (Search by this author)
物質・材料研究機構
;
Goto, K (author) (Search by this author)
名古屋工業大学
Keyword
IMFP, TPP-2M, AES, XPS
Date published
2006-09-24
Updated at
2023-07-07 09:23:43 +0900
GaN_H2O.jpg
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
Dataset
Creator
SUMIYA, Masatomo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
Date published
2022-12-31
Updated at
2024-01-05 22:11:14 +0900
GaN_O2.jpg
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
Dataset
Creator
SUMIYA, Masatomo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
Date published
2020-11-19
Updated at
2024-01-05 22:13:22 +0900
Figures.pdf
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
ORCID SAMURAI ;
Powell, C. J. (author) (Search by this author)
ORCID ;
Penn, D. R. (author) (Search by this author)
Keyword
IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900
Summary_of_ISO18118-2.pdf
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Journal article
Creator
ORCID SAMURAI
Keyword
XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
Date published
2005-12-28
Updated at
2024-01-05 22:11:34 +0900