Tanuma,S
(物質・材料研究機構)
;
Okamoto, N
(物質・材料研究機構)
;
Azuma, Y
;
Kimura, T
(物質・材料研究機構)
;
Goto, K
(名古屋工業大学)
説明:
(abstract)Recently Goto have done a precise measurement of transmission efficiency using a new method. Then, we have carried out the experimental determinations of IMFPs for 14 elemental solids in the 200-5000 eV energy range from absolute backscattered elastic-peak intensities taken by a novel CMA together with Monte Carlo (MC) calculations and also calculated IMFPs of the elemental solids with the Penn algorithm. At relatively high-energy region (over 200 eV), the values of energy/IMFP versus log (E) should be a straight line (Fano Plot). Then, we present an evaluation of the correction equations for surface-electron excitation proposed by Werner et. al., Oswald and Chen et. al. using Fano Plots.
権利情報:
会議: 11th Joint Vacuum Conference (2006-09-24 - 2006-09-28)
研究助成金:
原稿種別: 論文以外のデータ
MDR DOI: https://doi.org/10.48505/nims.4210
公開URL:
関連資料:
その他の識別子:
連絡先:
更新時刻: 2023-07-07 09:23:43 +0900
MDRでの公開時刻: 2023-07-07 13:30:20 +0900
| ファイル名 | サイズ | |||
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06_プラハ_2006-1_cor.pdf
(サムネイル)
application/pdf |
サイズ | 3.87MB | 詳細 |