Tanuma,S
(物質・材料研究機構)
;
Okamoto, N
(物質・材料研究機構)
;
Azuma, Y
;
Kimura, T
(物質・材料研究機構)
;
Goto, K
(名古屋工業大学)
Description:
(abstract)Recently Goto have done a precise measurement of transmission efficiency using a new method. Then, we have carried out the experimental determinations of IMFPs for 14 elemental solids in the 200-5000 eV energy range from absolute backscattered elastic-peak intensities taken by a novel CMA together with Monte Carlo (MC) calculations and also calculated IMFPs of the elemental solids with the Penn algorithm. At relatively high-energy region (over 200 eV), the values of energy/IMFP versus log (E) should be a straight line (Fano Plot). Then, we present an evaluation of the correction equations for surface-electron excitation proposed by Werner et. al., Oswald and Chen et. al. using Fano Plots.
Rights:
Keyword: IMFP, TPP-2M, AES, XPS
Conference: 11th Joint Vacuum Conference (2006-09-24 - 2006-09-28)
Funding:
Manuscript type: Not a journal article
MDR DOI: https://doi.org/10.48505/nims.4210
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Updated at: 2025-04-10 21:44:01 +0900
Published on MDR: 2023-07-07 13:30:20 +0900
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