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Ogiwara, Toshiya
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence ...
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Ef...
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle In...
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Hol...
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at th...
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Auger Depth Profiling Analysis
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Ultra Low Angle Incidence Ion Beam
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GaAs/AlAs Superlattice
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HfO2/Si
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Inclined Holder
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Japanese
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Surface Analysis Society of Japan
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HfO2
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FeNi/CoFeB/FeNi Thin Film
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GaAs
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GaAs/AlAs Superlattice
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GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers
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Ogiwara, Toshiya
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Tanuma, Shigeo
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Yoshikawa, Hideki
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Kim, Kyung Joong
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Nagata, Takahiro
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Journal of Surface Analysis
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Journal of The Surface Science Society of Japan
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Journal of Surface Analysis
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