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表面電子分光法における信号の減衰は如何に記述されるか? IV. 単位系,平均自由行程, 一般化振動子強度
Description/Abstract:
実用表面電子分光法において,電子の非弾性散乱は固体中における電子輸送に関連するので,その理解は大変に重要である。そこで,すでに出版した「表面電子分光法における信号の減衰は如何に記述されるか?」I, II, IIIに続いて,実際的な電子の非弾性散乱の理解および計算に必要となる...
Keyword:
IMFP
,
一般化振動子強度
,
光学的振動子強度
,
双極子振動子強度
,
平均自由行程
, and
表面電子分光
Resource Type:
Article
Author:
田沼 繁夫
Date Uploaded:
03/02/2023
Date Modified:
30/04/2024
電子分光法における表面感度と検出深さ
Description/Abstract:
The four physical parameters describing inelastic scattering of electrons, which is a measure of surface sensitivity, were described. The...
Keyword:
inelastic mean free path
,
effective attenuation length
,
information depth
,
mean escape depth
, and
surface sensitivity
Resource Type:
Article
Author:
田沼 繁夫
Date Uploaded:
01/02/2023
Date Modified:
01/05/2024
オープンサイエンス時代の研究者プロフィールサービス ―研究活動の可視化のためにやるべきことはなにか?―
Description/Abstract:
研究機関によって運営される研究者プロフィールサービスは,オープンサイエンスの進展に代表される研究活動の多様化や,Institutional Research の取り組みによって,その目的が研究成果の公開から研究活動の分析のための情報基盤へと広がってきている。本稿では,今後の...
Keyword:
CRIS
,
DOI
,
ORCID
, and
研究者プロフィールサービス
Resource Type:
Article
Author:
田辺 浩介
and
谷藤 幹子
Journal:
情報の科学と技術
Date Uploaded:
19/07/2022
Date Modified:
03/08/2022
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
Description/Abstract:
We have conducted Auger depth profiling analyses of InP/GaInAsP multilayer specimens, in which the surface roughness was caused by the ar...
Keyword:
Auger depth profiling analysis
,
InP/GaInAsP multilayer specimens
,
surface roughness
,
atomic force microscope
, and
depth resolution function
Material/Specimen:
InP/GaInAsP multilayer specimens
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
Description/Abstract:
We have investigated the dependence of the depth resolution of Auger depth profiles of InP/GaInAsP multilayer specimens on the sputtering...
Keyword:
Auger depth profiling analysis
,
InP/GaInAsP multilayer specimens
, and
argon ion sputtering
Material/Specimen:
InP/GaInAsP multilayer specimens
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting
Description/Abstract:
We have carried out the Auger depth profiling analysis of GaAs/AIAs multilayer structure using the peaks of GaMVV and A1LVV. Since the tw...
Keyword:
Auger depth profiling analysis
,
GaAs/AlAs multilayer
,
non-negative least-square curve fit
, and
peak separation
Material/Specimen:
GaAs/AlAs multilayer
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam
Description/Abstract:
It is very difficult to obtained the Auger depth profile of InP multilayer structures with argon ion sputtering because the very large su...
Keyword:
Auger Depth Profiling Analysis
,
Argon Ion Spot Beam
, and
InP/GaInAsP Multilayer Specimen
Material/Specimen:
InP/GaInAsP Multilayer
Resource Type:
Article
Author:
OGIWARA, Toshiya
,
HARADA, Tomoko
, and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Effects of Zalar Rotation and Liquid Nitrogen Cold Stage
Description/Abstract:
We have investigated the Auger depth profiling analysis of InP/GaInAsP multilayer specimens. It is difficult to obtain the Auger depth pr...
Keyword:
Auger Depth Profiling Analysis
,
InP/GaInAsP Multilayers
,
Zalar Rotation Method
, and
Sample Cooling Method
Material/Specimen:
InP/GaInAsP Multilayers
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Tanuma, Shigeo
,
Nagasawa, Yuji
, and
Ikeo, Nobuyuki
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
09/09/2021
Date Modified:
09/09/2021
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder
Description/Abstract:
We developed a 85°-high-angle inclined specimen holder which enabled the specimen surface to be irradiated by both electron and ion beams...
Keyword:
Auger Depth Profiling Analysis
,
Inclined Holder
,
GaAs/AlAs Superlattice
, and
Si/Ge multiple delta-doped layers
Material/Specimen:
GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Nagatomi, Takaharu
,
Kim, Kyung Joong
, and
Tanuma, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
08/09/2021
Date Modified:
08/09/2021
IoT データ収集システムのデータアーキテクチャ
Description/Abstract:
データ駆動型研究の進展に伴い,効率的かつ実用的なデータ収集の仕組みが求められている.物質・材料研究機構では,主に計測・プロセスデータを対象としたデータ収集システムを構築し運用を行っている.本システムでは非ネットワーク環境に置かれている実験装置の制御 PC 等に対して通信セキ...
Keyword:
データアーキテクチャ
,
IoT
,
データ収集システム
,
メタデータ
, and
XML スキーマ
Resource Type:
Article
Author:
MATSUNAMI, Shigeyuki
,
MATSUDA, Asahiko
,
CHIKYOW, Toyohiro
,
HARADA, Yoshitomo
, and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
26/08/2021
Date Modified:
26/08/2021
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The history of DICE and NIMS Digital Library
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Auger Depth Profiling Analysis
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fiber fuse
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轟 眞市
9
井上 悟
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出村 雅彦
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