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Calculations of Electron Inelastic Mean Free Paths in Solids over the 10 eV to 200 keV Energy Range with the Relativistic Full Penn Algorithm
Description/Abstract:
We have calculated IMFPs for 41 elemental solids and 30 semiconductors at equal energy intervals on a logarithmic scale corresponding to ...
Keyword:
Fano Plot
,
IMFP
,
Mermin-type ELF
,
relativistic full Penn algorithm
, and
relativistic modified Bethe equation
Resource Type:
Presentation
Author:
Shinotsuka, H
,
TANUMA, Shigeo
,
Powell, C. J.
, and
Penn, D. R.
Date Uploaded:
29/06/2023
Calculations and Measurements of Electron Inelastic Mean Free Paths in Solids
Description/Abstract:
We have calculated IMFPs for 41 elemental solids, 44 inorganic compounds and 12 organic compounds at equal energy intervals on a logarith...
Keyword:
ELF
,
EPES
,
FPA
,
Fano Plot
,
IMFP
, and
Mermin ELF
Resource Type:
Presentation
Author:
TANUMA, Shigeo
Date Uploaded:
29/06/2023
TWA2 表面分析化学 2005年度のプロジェクトの概要と進捗
Description/Abstract:
VAMAS TWA2 表面化学分析における標準化は表面電子分光の装置仕様・校正法など基礎についてのものが多く,ほとんどのものはこのVAMAS活動により(個々人が)開発した手法,理論,データベース等に有用性が確認された後,ISOに提案され国際規格となっている.また,産業界にお...
Keyword:
TWA2
,
VAMAS
, and
表面化学分析
Resource Type:
Presentation
Author:
田沼 繁夫
Date Uploaded:
29/06/2023
Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
Description/Abstract:
It is very important to know details of the interactions of low-energy electron with liquid water for many biological applications. There...
Keyword:
IMFP
and
liquid water
Resource Type:
Presentation
Author:
TANUMA, Shigeo
,
SHINOTSUKA, Hiroshi
,
DA, Bo
,
YOSHIKAWA, Hideki
, and
パウエル
Date Uploaded:
29/06/2023
DataCiteのメタデータの変更点を追ってみる
Description/Abstract:
JOSS2023のE2セッション「メタデータの系譜を探る:研究データの相互運用性の向上に向けて」での発表資料
Keyword:
DOI
,
DataCite
, and
メタデータ
Resource Type:
Presentation
Author:
田辺浩介
Date Uploaded:
29/06/2023
Date Modified:
29/06/2023
Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation Lengths for Surface Electron Spectroscopies
Description/Abstract:
While the IMFP is a basic material parameter, the EAL, MED, and ID depend not only on the IMFP but also on the instrumental configuration...
Keyword:
EAL
,
EPES
,
IMFP
,
elemental solids
,
inorganic compounds
, and
water
Resource Type:
Presentation
Author:
田沼 繁夫
,
後藤啓典
,
吉川 英樹
,
パウエル
,
Penn, D. R.
,
Da, B.
,
Ueda, R.
, and
Shinotsuka, H
Date Uploaded:
29/06/2023
DataCiteを選んだ理由 ~Materials Data RepositoryにおけるDataCite DOIの活用~
Description/Abstract:
JOSS2023のD3セッション「ジャーナル論文だけじゃない!日本の全ての研究成果物のPID(永続的識別子)登録を目指して」での発表資料
Keyword:
DOI
,
DataCite
,
MDR
, and
オープンサイエンス
Resource Type:
Presentation
Author:
田辺浩介
Date Uploaded:
29/06/2023
Date Modified:
29/06/2023
Analysis of electron inelastic scattering in solids over wide energy range and its application to surface chemical analysis
Description/Abstract:
We have, then, calculated IMFPs for 41 elemental solids and 30 semiconductors from 10 eV to 200 keV. These calculations were made with op...
Keyword:
EPES
,
HAXPES
,
IMFP
,
MED
,
electron inelastic scattering
,
energy loss function
, and
relativistic modified Bethe equation
Resource Type:
Presentation
Author:
TANUMA, Shigeo
Date Uploaded:
29/06/2023
電子分光法における表面定量分析の標準化の歩み
Description/Abstract:
AESやXPSに代表される表面電子分光法における定量化は, 1982年のVAMAS プロジェクト TWA-2 SCAの設立と1991年のISO TC201SCAの設立が2つの大きな転換点といえる。前者では,個々人の定量研究から国際共同研究を通して,定量の信頼性や正確性・遡及...
Keyword:
ISO
,
国際標準化
,
標準化の意味
,
標準化の歴史
, and
表面定量分析
Resource Type:
Presentation
Author:
田沼 繁夫
Date Uploaded:
26/06/2023
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
Description/Abstract:
We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:
Auger depth profiling analysis
,
HfO2/Si
, and
Ultra low angle incidence ion beam
Resource Type:
Dataset
Data origin:
experiments
Author:
OGIWARA, Toshiya
,
NAGATA, Takahiro
, and
YOSHIKAWA, Hideki
Date Uploaded:
23/06/2023
Date Modified:
18/07/2023
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Anisotropic permanent magnets fabricated by hot extrusion using a commercial Nd14Fe76Co3.4B6Ga0.6 (at%) powder (MQU-F™)
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