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Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spect...
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Ef...
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at th...
Emergent dynamics of neuromorphic nanowire networks
IoT データ収集システムのデータアーキテクチャ
CASベースのRDM認証・認可機構の漸増開発とアセスメント評価
材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
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696
Collection
Research Highlights
80
MANA E-BULLETIN
15
The history of DICE and NIMS Digital Library
10
Keyword
IMFP
18
nanomechanical sensors
13
Spintronics
11
Nanosheets
10
Auger Depth Profiling Analysis
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696
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Creative Commons BY Attribution 4.0 International
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
59
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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Material/Specimen
HfO2
2
InP/GaInAsP multilayer specimens
2
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
1
C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
1
26-n-paraffin
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2005
6
2004
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4
2017
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Creator
TODOROKI, Shin-ichi
12
轟 眞市
9
INOUE, Satoru
8
田邉 浩介
2
MATSUMOTO, T.
1
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Author
International Center for Materials Nanoarchitectonics (WPI-MANA)
95
Ikumu Watanabe
28
Katsuhiko Ariga
18
Kosuke Minami
18
Tanuma, Shigeo
18
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MOTEKI, Fuma
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http://rightsstatements.org/vocab/InC/1.0/
14
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https://creativecommons.org/licenses/by-nc/4.0/
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http://opensource.org/licenses/MIT
1
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Japan Society for the Promotion of Science
62
JSPS
49
JST
30
Japan Science and Technology Agency
21
Ministry of Education, Culture, Sports, Science and Technology
13
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Journal
Physical Review B
25
Science and Technology of Advanced Materials
18
Scientific Reports
12
JOURNAL OF APPLIED PHYSICS
11
Journal of Surface Analysis
11
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