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ジャーナル論文(4)
プロシーディングス論文(1)
キーワード
atom probe tomography (5)
transmission electron microscopy (3)
gallium nitride (2)
InGaN (1)
cathodoluminescence (1)
dislocation (1)
electron microscopy (1)
pipe diffusion (1)
positron annihilation (1)
thermoelectric materials (1)
(more)
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Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
ファイル種別
application/pdf (5)
キーワード: atom probe tomography
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5 件のレコードが見つかりました。
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
ジャーナル論文
著者
Simon Moore
(author) (
この著者で検索
)
Simon Moore
;
Mari Takahashi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
Mari Takahashi
;
Philipp Sauerschnig
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
Philipp Sauerschnig
;
Keiji Kobayashi
(author) (
この著者で検索
)
Keiji Kobayashi
;
Koichi Higashimine
(author) (
この著者で検索
)
Koichi Higashimine
;
Masanobu Miyata
(author) (
この著者で検索
)
Masanobu Miyata
;
Takahiro Baba
(author) (
この著者で検索
)
Takahiro Baba
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Michihiro Ohta
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
Michihiro Ohta
;
Takao Mori
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2682-1846
NIMS Researchers Directory SAMURAI
Takao Mori
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shinya Maenosono
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
Shinya Maenosono
キーワード
thermoelectric materials
,
electron microscopy
,
atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Claudia Fleischmann
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
Claudia Fleischmann
;
Jean-Philippe Soulié
(author) (
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)
Jean-Philippe Soulié
;
Mustafa Ayyad
(author) (
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)
Mustafa Ayyad
;
Jeroen E. Scheerder
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
Jeroen E. Scheerder
;
Christoph Adelmann
(author) (
この著者で検索
)
Christoph Adelmann
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Koji Michishio
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
Koji Michishio
;
Nagayasu Oshima
(author) (
この著者で検索
)
Nagayasu Oshima
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
キーワード
atom probe tomography
,
positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ryo Tanaka
(author) (
この著者で検索
)
Fuji Electric Corporation
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Fuji Electric Corporation
Shinya Takashima
;
Masaharu Edo
(author) (
この著者で検索
)
Fuji Electric Corporation
Masaharu Edo
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Takashi Sekiguchi
(author) (
この著者で検索
)
University of Tsukuba
Takashi Sekiguchi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
,
cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
ジャーナル論文
著者
Yudai Yamaguchi
(author) (
この著者で検索
)
Yudai Yamaguchi
;
Yuya Kanitani
(author) (
この著者で検索
)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
この著者で検索
)
Yoshihiro Kudo
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Shigetaka Tomiya
(author) (
この著者で検索
)
Shigetaka Tomiya
キーワード
InGaN
,
dislocation
,
pipe diffusion
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2022-09-14
更新時刻
2024-01-05 22:12:51 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス論文
著者
Ryo Tanaka
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Ryo Tanaka
;
Shinya Takashima
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Shinya Takashima
;
Katsunori Ueno
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Katsunori Ueno
;
Masahiro Horita
(author) (
この著者で検索
)
Nagoya Univ.
Masahiro Horita
;
Jun Suda
(author) (
この著者で検索
)
Nagoya Univ.
Jun Suda
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Masaharu Edo
(author) (
この著者で検索
)
Fuji Electric Co., Ltd.
Masaharu Edo
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
キーワード
atom probe tomography
(5)
transmission electron microscopy
(3)
gallium nitride
(2)
InGaN
(1)
cathodoluminescence
(1)
dislocation
(1)
electron microscopy
(1)
pipe diffusion
(1)
positron annihilation
(1)
thermoelectric materials
(1)
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