キーワード: transmission electron microscopy
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7 件のレコードが見つかりました。

Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam.pdf
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
ジャーナル論文
著者
Shuai Tang (author) (この著者で検索)
; ORCID SAMURAI ;
Yimeng Wu (author) (この著者で検索)
;
You-Hu Chen (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Lu-Chang Qin (author) (この著者で検索)
キーワード
electron emission, transmission electron microscopy, focused ion beam
刊行年月日
2025-03-06
更新時刻
2025-04-12 08:30:10 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs.pdf
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス論文
著者
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Katsunori Ueno (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Masahiro Horita (author) (この著者で検索)
Nagoya Univ.
;
Jun Suda (author) (この著者で検索)
Nagoya Univ.
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Co., Ltd.
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
Excess Ferrous Iron Promotes the Construction of Extracellular.pdf
Excess Ferrous Iron Promotes the Construction of Extracellular Electron Pathways in the Iron-corroding Bacterium <i>Desulfovibrio ferrophilus</i> IS5
ジャーナル論文
著者
Xiao Deng (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Kikkawa (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Akihiro Okamoto (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
microbially influenced corrosion, sulfate-reducing bacteria, iron sulfide nanoparticles, outer-membrane cytochrome, electrochemical analyses, transmission electron microscopy, transcriptome
刊行年月日
2026-04-15
更新時刻
2026-04-16 15:19:59 +0900
Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
ORCID ;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Koki Kobayashi (author) (この著者で検索)
;
Kosuke Ishikawa (author) (この著者で検索)
;
Kyosuke Sawabe (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
ORCID
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier.pdf
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier
ジャーナル論文
著者
Tatsuya Yamamoto (author) (この著者で検索)
;
Tomohiro Ichinose (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Takayuki Nozaki (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kay Yakushiji (author) (この著者で検索)
;
Shingo Tamaru (author) (この著者で検索)
;
Hitoshi Kubota (author) (この著者で検索)
;
Shinji Yuasa (author) (この著者で検索)
キーワード
transmission electron microscopy
刊行年月日
2024-02-09
更新時刻
2026-02-09 12:30:04 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
;
Keita Kataoka (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenta Chokawa (author) (この著者で検索)
;
Hideki Sakurai (author) (この著者で検索)
;
Akira Uedono (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Ritsuo Otsuki (author) (この著者で検索)
;
Koki Kobayashi (author) (この著者で検索)
;
Yuta Itoh (author) (この著者で検索)
;
Masahiro Nagao (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Suda (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
キーワード
gallium nitride, transmission electron microscopy, atom probe tomography
刊行年月日
2022-08-14
更新時刻
2024-01-05 22:13:58 +0900