15 件のレコードが見つかりました。
Characterizing the effects of temperature on the thermal vibration properties of individual nanowires
- ジャーナル論文
- 著者
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Ovidiu Cretu (author) (この著者で検索)
;
Han Zhang (author) (この著者で検索)
;
Koji Harano (author) (この著者で検索)
;
Koji Kimoto (author) (この著者で検索)
- キーワード
- thermal vibration, nanowire, transmission electron microscopy
- 刊行年月日
- 2025-10-07
- 更新時刻
- 2025-10-07 08:30:40 +0900
Latent ion tracks were finally observed in diamond
- ジャーナル論文
- 著者
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H. Amekura (author) (この著者で検索)National Institute for Materials Science
;
A. Chettah (author) (この著者で検索)
https://orcid.org/0000-0002-9815-0992
(unauthenticated)
;
K. Narumi (author) (この著者で検索)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
;
;A. Chiba (author) (この著者で検索);Y. Hirano (author) (この著者で検索);K. Yamada (author) (この著者で検索);S. Yamamoto (author) (この著者で検索)A. A. Leino (author) (この著者で検索)
https://orcid.org/0000-0003-3504-548X
(unauthenticated)
;
F. Djurabekova (author) (この著者で検索)
https://orcid.org/0000-0002-5828-200X
(unauthenticated)
;
K. Nordlund (author) (この著者で検索)
https://orcid.org/0000-0001-6244-1942
(unauthenticated)
;
;N. Ishikawa (author) (この著者で検索);N. Okubo (author) (この著者で検索)Y. Saitoh (author) (この著者で検索) - キーワード
- ion track, diamond, C60 ion, transmission electron microscopy, velocity effect
- 刊行年月日
- 2024-02-27
- 更新時刻
- 2024-03-04 16:30:07 +0900
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
;Yuanzhao Yao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索)
- キーワード
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2026-01-31 16:30:04 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
- ジャーナル論文
- 著者
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Shozo Hiramoto (author) (この著者で検索)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
;
;Satoshi Okamoto (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
;Akihiko Toda (author) (この著者で検索);Sangwook Kim (author) (この著者で検索);Chikako Moriyoshi (author) (この著者で検索)Yoshihiro Kuroiwa (author) (この著者で検索)
- キーワード
- atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
- 刊行年月日
- 2025-02-10
- 更新時刻
- 2026-02-11 08:30:29 +0900
Atomic-scale observation of native oxides on c - and m -faced GaN surfaces
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
Yoshihiro Irokawa (author) (この著者で検索)
;
Toshihide Nabatame (author) (この著者で検索)
;
;Yasuo Koide (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
- キーワード
- transmission electron microscopy, gallium nitride
- 刊行年月日
- 2026-04-01
- 更新時刻
- 2026-04-02 10:10:21 +0900
Systematic study of FIB-induced damage for the high-quality TEM sample preparation
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
- キーワード
- focused ion beam, transmission electron microscopy
- 刊行年月日
- 2024-04-26
- 更新時刻
- 2024-05-07 15:32:35 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- ジャーナル論文
- 著者
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;Emi Kano (author) (この著者で検索);Keita Kataoka (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Kenta Chokawa (author) (この著者で検索);Hideki Sakurai (author) (この著者で検索);Akira Uedono (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索);Ritsuo Otsuki (author) (この著者で検索);Koki Kobayashi (author) (この著者で検索);Yuta Itoh (author) (この著者で検索);Masahiro Nagao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Jun Suda (author) (この著者で検索);Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
- キーワード
- gallium nitride, transmission electron microscopy, atom probe tomography
- 刊行年月日
- 2022-08-14
- 更新時刻
- 2024-01-05 22:13:58 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
- ジャーナル論文
- 著者
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;Yudai Yamaguchi (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2022-09-14
- 更新時刻
- 2024-01-05 22:12:51 +0900
Impact of GdOx insertion on magnetic anisotropy and damping in double-barrier magnetic stacks
- ジャーナル論文
- 著者
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Junyeon Kim (author) (この著者で検索)
https://orcid.org/0000-0001-5460-1432
(unauthenticated)
;
Takayuki Nozaki (author) (この著者で検索)
https://orcid.org/0000-0002-9678-8319
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)
;
Shingo Tamaru (author) (この著者で検索)
https://orcid.org/0000-0001-7105-4805
(unauthenticated)
;
Tomohiro Ichinose (author) (この著者で検索)
https://orcid.org/0000-0002-8158-1606
(unauthenticated)
;
Takao Ochiai (author) (この著者で検索)
https://orcid.org/0009-0006-6626-2195
(unauthenticated)
;
Tatsuya Yamamoto (author) (この著者で検索)
https://orcid.org/0000-0002-1640-1947
(unauthenticated)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Kay Yakushiji (author) (この著者で検索)
https://orcid.org/0000-0002-1616-1613
(unauthenticated)
;
Shinji Yuasa (author) (この著者で検索)
https://orcid.org/0000-0003-1093-9057
(unauthenticated)
- キーワード
- transmission electron microscopy
- 刊行年月日
- 2025-03-01
- 更新時刻
- 2025-03-04 16:30:37 +0900
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
- ジャーナル論文
- 著者
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;Shuai Tang (author) (この著者で検索)Jie Tang (author) (この著者で検索)
;
;Yimeng Wu (author) (この著者で検索);You-Hu Chen (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Masaki Takeguchi (author) (この著者で検索)
;
Lu-Chang Qin (author) (この著者で検索)
- キーワード
- electron emission, transmission electron microscopy, focused ion beam
- 刊行年月日
- 2025-03-06
- 更新時刻
- 2025-04-12 08:30:10 +0900