Crystallographic and Electronic Structures of Nb:YTaO4 and Tb:YTaO4 Single-Crystal Scintillators
- ジャーナル論文
- 著者
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Yueshen Zhou (author) (この著者で検索)
;
;Encarnación G. Víllora (author) (この著者で検索)Ryoji Sahara (author) (この著者で検索)
;
Arkapol Saengdeejing (author) (この著者で検索)
;
Kiyoshi Shimamura (author) (この著者で検索)
- キーワード
- Single-crystal structure analysis, DFT, Tb:YTaO4, XPS, Nb:YTaO4
- 刊行年月日
- 2025-07-31
- 更新時刻
- 2025-08-01 10:06:22 +0900
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
- データセット
- 著者
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SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- XPS, SPring-8 BL15, Si
- 刊行年月日
- 更新時刻
- 2024-05-24 08:30:24 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
- データセット
- 著者
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SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
- 刊行年月日
- 2022-12-31
- 更新時刻
- 2024-01-05 22:11:14 +0900
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
- データセット
- 著者
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SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
- 刊行年月日
- 2020-11-19
- 更新時刻
- 2024-01-05 22:13:22 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ジャーナル論文
- 著者
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TANUMA, Shigeo (author) (この著者で検索)
- キーワード
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- 刊行年月日
- 2005-12-28
- 更新時刻
- 2024-01-05 22:11:34 +0900