10 records found.
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
- Article
- Creator
-
Prabhat Kumar
;
Shunsuke Tsuda
;
Koichiro Yaji
;
Shinji Isogami
- Keyword
- MXene, Interface, XPS
- Date published
- 2025-12-31
- Updated at
- 2025-09-16 12:30:22 +0900
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- Article
- Creator
-
J. W. Liu
;
T. Teraji
;
B. Da
;
Y. Koide
- Keyword
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- Date published
- 2024-09-02
- Updated at
- 2024-09-13 12:30:32 +0900
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
- Dataset
- Creator
-
SUMIYA, Masatomo
- Keyword
- XPS, SPring-8 BL15, Si
- Date published
- Updated at
- 2024-05-24 08:30:24 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
- Dataset
- Creator
-
SUMIYA, Masatomo
- Keyword
- GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
- Date published
- 2022-12-31
- Updated at
- 2024-01-05 22:11:14 +0900
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
- Dataset
- Creator
-
SUMIYA, Masatomo
- Keyword
- GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
- Date published
- 2020-11-19
- Updated at
- 2024-01-05 22:13:22 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- Article
- Creator
-
Tanuma, Shigeo
;
Powell, C. J.
;
Penn, D. R.
- Keyword
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- Date published
- 2003-02-11
- Updated at
- 2022-10-03 01:54:38 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Article
- Creator
-
TANUMA, Shigeo
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900