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Journal article(52)
Conference presentation(11)
Book(1)
Dataset(1)
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Keyword
IMFP (24)
Auger Depth Profiling Analysis (7)
TPP-2M (7)
electron inelastic mean free path (7)
electron inelastic mean free paths (7)
inelastic mean free path (7)
energy loss function (6)
AES (4)
EPES (4)
elemental solids (4)
(more)
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International (27)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (8)
In Copyright (8)
Creative Commons BY Attribution 4.0 International (5)
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application/pdf (59)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (8)
application/octet-stream (1)
66 records found.
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
Journal article
Creator
Shunichi Yoneda
(author) (
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)
Shunichi Yoneda
;
Ryo Murakami
(author) (
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)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
Search by this author
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Hiromi Tanaka
(author) (
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)
Hiromi Tanaka
;
Hayaru Shouno
(author) (
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)
Hayaru Shouno
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
Keyword
X-ray photoelectron spectroscopy
,
Survey spectrum
,
Surrogate model
,
Total electron attenuation length
,
Thickness estimation
Date published
2026-03-31
Updated at
2026-04-16 15:42:06 +0900
First-principles Calculations of Optical Energy Loss Functions for 30 Compound and 5 Elemental Semiconductors
Journal article
Creator
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
Keyword
Energy loss function
,
Optical constant
,
First-principles calculation
,
Compound semiconductor
,
Inelastic mean free paths
Date published
2021-07-15
Updated at
2026-02-04 12:30:04 +0900
Hard x-ray photoelectron spectroscopy (HAXPES) Cr
Kα
and XPS Al
K
α
measurements of bulk lithium metal
Journal article
Creator
Hideyuki Yasufuku
(author) (
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)
https://orcid.org/0000-0001-5600-8958
NIMS Researchers Directory SAMURAI
Hideyuki Yasufuku
;
Tsuyoshi Ohnishi
(author) (
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)
https://orcid.org/0000-0002-2333-7752
NIMS Researchers Directory SAMURAI
Tsuyoshi Ohnishi
;
Shigenori Ueda
(author) (
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)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Yoshiyuki Yamashita
(author) (
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)
https://orcid.org/0000-0003-0994-8095
NIMS Researchers Directory SAMURAI
Yoshiyuki Yamashita
;
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Satoshi Kawada
(author) (
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)
https://orcid.org/0000-0003-4618-2746
NIMS Researchers Directory SAMURAI
Satoshi Kawada
;
Yoshitaka Matsushita
(author) (
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)
https://orcid.org/0000-0002-4968-8905
NIMS Researchers Directory SAMURAI
Yoshitaka Matsushita
Keyword
Lithium
,
HAPES
,
Cr Kα
,
Al Kα
Date published
2026-06-01
Updated at
2026-01-28 12:30:04 +0900
Determining electron inelastic mean free paths by iterative Monte Carlo analysis of the backscattered electron spectrum
Journal article
Creator
Jiamin Gong
(author) (
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)
Jiamin Gong
;
Lihao Yang
(author) (
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)
Lihao Yang
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Bo Da
(author) (
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)
https://orcid.org/0000-0002-0785-8662
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Bo Da
;
Chuanhong Jin
(author) (
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)
Chuanhong Jin
;
Zejun Ding
(author) (
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)
Zejun Ding
Keyword
electron inelastic mean free paths
Date published
2025-11-21
Updated at
2025-12-22 11:15:22 +0900
表面電子分光法における信号の減衰は如何に記述されるか? VI. 元素における双極子行列要素平方の計算とPenn algorithmによるIMFPの計算
Journal article
Creator
田沼繁夫
(author) (
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)
https://orcid.org/0000-0003-2628-9941
技術開発・共用部門, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
田沼繁夫
;
篠塚寛志
(author) (
Search by this author
)
https://orcid.org/0000-0001-5147-1396
技術開発・共用部門, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
篠塚寛志
Keyword
双極子行列要素平方
,
非弾性平均自由行程
,
IMFP
,
Penn algorithm
,
Modified Bethe equation
Date published
2024-06-12
Updated at
2024-06-17 12:30:17 +0900
Calculations of Electron Inelastic Mean Free Paths IV. Evaluation of calculated IMFPs and of the predictive IMFP formula TPP-2 for electron energies between 50 and 2000 eV
Journal article
Creator
Tanuma, S.
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
技術開発・共用部門 運営室, NIMS
NIMS Researchers Directory SAMURAI
Tanuma, S.
;
Powell, C. J.
(author) (
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)
NIST
Powell, C. J.
;
Penn, D. R.
(author) (
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)
NIST
Penn, D. R.
Keyword
IMFP
,
predictive IMFP formula TPP-2
,
Evaluations of TPP-2 formula
Date published
2004-09-15
Updated at
2023-11-07 15:36:26 +0900
Estimation of Inelastic Mean Free Paths in Au and Cu from Their Elastic Peak Intensity Ratios without IMFP Values of Reference Material in The 200 – 5000 eV Energy Range
Journal article
Creator
S. Tanuma
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
S. Tanuma
;
H. Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
H. Yoshikawa
;
N. Okamoto
(author) (
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)
N. Okamoto
;
K. Goto
(author) (
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)
K. Goto
Keyword
IMFP
,
elastic peak intensity
,
Au and Cu
,
EPES
,
electron inelastic mean free path
Date published
2018-10-19
Updated at
2024-01-05 22:12:30 +0900
表面電子分光法における信号の減衰は如何に記述されるか? V. 誘電関数を用いた固体における電子の非弾性散乱断面積
Journal article
Creator
田沼 繁夫
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
技術開発・共用部門/運営室, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
田沼 繁夫
Keyword
誘電関数
,
電子の非弾性散乱断面積
,
双極子行列要素平方
,
動的散乱因子
,
一般化振動子強度
Date published
Updated at
2023-08-21 11:34:22 +0900
Calculations of Electron Inelastic Mean Free Paths III. Data for 15 Inorganic compounds over the 50 - 2000 eV Range
Journal article
Creator
Tanuma, Shigeo
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
装置開発・共用部門, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
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)
NIST
Powell, C. J.
;
Penn, D. R.
(author) (
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)
NIST
Penn, D. R.
Keyword
Inorganic compounds
,
IMFP
,
TPP-2
Date published
2004-09-15
Updated at
2023-08-03 11:15:31 +0900
Calculations of Electron Inelastic Mean Free Paths II. Data for 27 Elements over the 50 - 2000 eV Range
Journal article
Creator
Tanuma, S.
(author) (
Search by this author
)
https://orcid.org/0000-0003-2628-9941
NIMS
NIMS Researchers Directory SAMURAI
Tanuma, S.
;
Powell, C. J.
(author) (
Search by this author
)
NIST
Powell, C. J.
;
Penn, D. R.
(author) (
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)
NIST
Penn, D. R.
Keyword
electron inelastic mean free paths
,
IMFPs
,
a group of 27 elements
,
TPP-2
Date published
2004-09-15
Updated at
2023-07-12 11:45:58 +0900
Keyword
IMFP
(24)
Auger Depth Profiling Analysis
(7)
TPP-2M
(7)
electron inelastic mean free path
(7)
electron inelastic mean free paths
(7)
inelastic mean free path
(7)
energy loss function
(6)
AES
(4)
EPES
(4)
elemental solids
(4)
Auger depth profiling analysis
(3)
FPA
(3)
XPS
(3)
effective attenuation length
(3)
full Penn algorithm
(3)
liquid water
(3)
relativistic full Penn algorithm
(3)
Auger electron spectroscopy
(2)
Bethe equation
(2)
EAL
(2)
ELF
(2)
Electron Inelastic Mean Free Path
(2)
Electron stopping power
(2)
Fano Plot
(2)
GaAs/AlAs Superlattice
(2)
IMFPs
(2)
ISO
(2)
InP/GaInAsP multilayer specimens
(2)
Inclined Holder
(2)
JTP equation
(2)
MED
(2)
Penn algorithm
(2)
Sample Cooling Method
(2)
Si/Ge multiple delta-doped layers
(2)
TPP-2
(2)
argon ion sputtering
(2)
compound semiconductor
(2)
dielectric function model
(2)
machine learning
(2)
mean escape depth
(2)
modified Bethe equation
(2)
optical constant
(2)
organic compounds
(2)
relativistic TPP-2M
(2)
relativistic modified Bethe equation
(2)
surface sensitivity
(2)
一般化振動子強度
(2)
双極子行列要素平方
(2)
10 ~ predictive equation for IMFP
(1)
11 ~ elemental solid
(1)
12 ~ relativistic Bethe equation
(1)
13 ~ Fano plot
(1)
14 ~ IMFP
(1)
41 elemental solids
(1)
Al Kα
(1)
Argon Ion Spot Beam
(1)
Au and Cu
(1)
Compound semiconductor
(1)
Cr Kα
(1)
Depth Resolution
(1)
Electron Stopping Power
(1)
Elemental solids
(1)
Energy dependence
(1)
Energy loss function
(1)
Evaluations of TPP-2 formula
(1)
Fano plo
(1)
First-principles calculation
(1)
GaAs/AlAs multilayer
(1)
HAPES
(1)
HAXPES
(1)
IMFP predictive formula
(1)
Improved Predictive IMFP Formula
(1)
InP/GaInAs Specimen
(1)
InP/GaInAsP Multilayer Specimen
(1)
InP/GaInAsP Multilayers
(1)
InP/GaInAsP多層膜
(1)
Inelastic mean free paths
(1)
Influence of electron exchange
(1)
Inorganic compounds
(1)
International Organization for Standardization
(1)
Jablonski-Tanuma-Powell equation
(1)
LASSO
(1)
LaTex
(1)
Li, Be, diamond, graphite, Na, K, Sc, Ge, In, Sn, Cs, Gd, Tb, Dy, Al
(1)
Lithium
(1)
Mermin ELF
(1)
Mermin model
(1)
Mermin-type ELF
(1)
Mg-Ge alloy
(1)
Modified Bethe equation
(1)
Monte Carlo simulation
(1)
Optical constant
(1)
Plasmon Energy Gain
(1)
Round Robin Test
(1)
Sample Temperature
(1)
Secondary Electron
(1)
SiO2/Si
(1)
Surrogate model
(1)
Survey spectrum
(1)
TPP
(1)
TPP-2M equation
(1)
TWA2
(1)
Thickness estimation
(1)
Total electron attenuation length
(1)
VAMAS
(1)
Virtual substrate method
(1)
X-ray photoelectron spectroscopy
(1)
X-ray photoelectron spectroscopy
(1)
XITS Math
(1)
ZAF
(1)
Zalar Rotation Method
(1)
a group of 27 elements
(1)
asymmetry parameter
(1)
atomic force microscope
(1)
attenuation length
(1)
bandgap correction
(1)
depth resolution function
(1)
dielectric function
(1)
elastic peak intensity
(1)
elastic- peak electron spectroscopy
(1)
electron backscattering correction
(1)
electron inelastic scattering
(1)
electron probe microanalyzer
(1)
electrons
(1)
energy-loss functions
(1)
experimental determination
(1)
first-principles calculation
(1)
four-point probe technique
(1)
general formula for IMFP
(1)
high-energy photoelectron spectroscopy
(1)
inelastic mean free paths
(1)
inelastic scattering
(1)
inelastic scattering effect
(1)
information depth
(1)
inorganic compounds
(1)
lnearly polarized X-rays
(1)
mass absorption coefficient
(1)
monolayer graphene
(1)
non-negative least-square curve fit
(1)
number of valence electrons
(1)
peak separation
(1)
plasmon lifetime
(1)
predictive IMFP formula TPP-2
(1)
predictive formula for back scattering correction
(1)
quantitative surface analysis
(1)
rare-earth elements
(1)
relative sensitivity factor
(1)
secondary electron
(1)
static structure factor
(1)
surface analysis
(1)
surface electron spectroscopies
(1)
surface electron spectroscopy
(1)
surface observation using a scanning electron microscope
(1)
surface plasmon energy gain
(1)
surface roughness
(1)
water
(1)
word
(1)
ナノテクノロジープラットフォーム事業の成果と課題
(1)
ナノテクノロジープラットフォーム事業の活動実績
(1)
光学的振動子強度
(1)
共用施策設計
(1)
動的散乱因子
(1)
双極子振動子強度
(1)
国際標準化
(1)
平均自由行程
(1)
施設・装置の平等な利用機会
(1)
標準化
(1)
標準化の意味
(1)
標準化の歴史
(1)
表面化学分析
(1)
表面定量
(1)
表面定量分析
(1)
表面電子分光
(1)
装置と知の共用
(1)
計測・分析
(1)
誘電関数
(1)
電子の非弾性散乱断面積
(1)
電子輸送シュミレータ
(1)
非弾性平均自由行程
(1)
RDE metadata def
RDE invoice schema
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Collection
Resource type
Journal article(52)
Conference presentation(11)
Book(1)
Dataset(1)
Other(1)
Keyword
IMFP (24)
Auger Depth Profiling Analysis (7)
TPP-2M (7)
electron inelastic mean free path (7)
electron inelastic mean free paths (7)
inelastic mean free path (7)
energy loss function (6)
AES (4)
EPES (4)
elemental solids (4)
(more)
License
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (27)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (8)
In Copyright (8)
Creative Commons BY Attribution 4.0 International (5)
File type
application/pdf (59)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (8)
application/octet-stream (1)