16 records found.
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
- Journal article
- Creator
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Akira Uedono (author) (Search by this author)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Claudia Fleischmann (author) (Search by this author)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
;
;Jean-Philippe Soulié (author) (Search by this author);Mustafa Ayyad (author) (Search by this author)Jeroen E. Scheerder (author) (Search by this author)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
;
;Christoph Adelmann (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
;
Koji Michishio (author) (Search by this author)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
;
;Nagayasu Oshima (author) (Search by this author)Shoji Ishibashi (author) (Search by this author)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
- Keyword
- atom probe tomography, positron annihilation
- Date published
- 2024-07-10
- Updated at
- 2025-07-10 08:30:19 +0900
SAXS・SANS及びAPTによるSi量の異なるCu-Ni-Si合金中の析出相の解析
- Journal article
- Creator
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;佐々木 宏和 (author) (Search by this author)古河電気工業株式会社;大場 洋次郎 (author) (Search by this author)豊橋技術科学大学;廣井 孝介 (author) (Search by this author)日本原子力研究開発機構;大沼 正人 (author) (Search by this author)北海道大学埋橋 淳 (author) (Search by this author)National Institute for Materials Science
;
大久保 忠勝 (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- Updated at
- 2025-11-28 16:30:03 +0900
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- Journal article
- Creator
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;Simon Moore (author) (Search by this author)Mari Takahashi (author) (Search by this author)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
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Philipp Sauerschnig (author) (Search by this author)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
;
;Keiji Kobayashi (author) (Search by this author);Koichi Higashimine (author) (Search by this author);Masanobu Miyata (author) (Search by this author);Takahiro Baba (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Michihiro Ohta (author) (Search by this author)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
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Takao Mori (author) (Search by this author)
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Tadakatsu Ohkubo (author) (Search by this author)
;
Shinya Maenosono (author) (Search by this author)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- Keyword
- thermoelectric materials, electron microscopy, atom probe tomography
- Date published
- 2024-09-09
- Updated at
- 2025-08-26 08:30:23 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
- Conference paper
- Creator
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;Ryo Tanaka (author) (Search by this author)Fuji Electric Co., Ltd.;Shinya Takashima (author) (Search by this author)Fuji Electric Co., Ltd.;Katsunori Ueno (author) (Search by this author)Fuji Electric Co., Ltd.;Masahiro Horita (author) (Search by this author)Nagoya Univ.;Jun Suda (author) (Search by this author)Nagoya Univ.Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Masaharu Edo (author) (Search by this author)Fuji Electric Co., Ltd.
- Keyword
- gallium nitride, atom probe tomography, transmission electron microscopy
- Date published
- 2023-06-08
- Updated at
- 2024-04-19 12:30:23 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- Journal article
- Creator
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;Yudai Yamaguchi (author) (Search by this author);Yuta Inaba (author) (Search by this author);Ryoji Arai (author) (Search by this author);Yuya Kanitani (author) (Search by this author);Yoshihiro Kudo (author) (Search by this author);Michinori Shiomi (author) (Search by this author);Daiji Kasahara (author) (Search by this author);Mikihiro Yokozeki (author) (Search by this author);Noriyuki Fuutagawa (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
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Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
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;Kouichi Akahane (author) (Search by this author);Naokatsu Yamamoto (author) (Search by this author)Shigetaka Tomiya (author) (Search by this author)
- Keyword
- quantum dot, atom probe tomography, transmission electron microscopy
- Date published
- 2024-04-11
- Updated at
- 2025-04-14 16:30:23 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
- Journal article
- Creator
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Shozo Hiramoto (author) (Search by this author)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
;
;Satoshi Okamoto (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
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;Akihiko Toda (author) (Search by this author);Sangwook Kim (author) (Search by this author);Chikako Moriyoshi (author) (Search by this author)Yoshihiro Kuroiwa (author) (Search by this author)
- Keyword
- atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
- Date published
- 2025-02-10
- Updated at
- 2026-02-11 08:30:29 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Jun Chen (author) (Search by this author)National Institute for Materials Science
;
Ashutosh Kumar (author) (Search by this author)
https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
;
Wei Yi (author) (Search by this author)
https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
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;Ryo Tanaka (author) (Search by this author);Shinya Takashima (author) (Search by this author);Masaharu Edo (author) (Search by this author);Kacper Sierakowski (author) (Search by this author);Michal Bockowski (author) (Search by this author);Hideki Sakurai (author) (Search by this author);Tetsu Kachi (author) (Search by this author)Takashi Sekiguchi (author) (Search by this author)
https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
- Date published
- 2022-05-14
- Updated at
- 2024-01-05 22:11:22 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
- Journal article
- Creator
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;Yohei Nomura (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
;Tatsuya Tomita (author) (Search by this author);Toru Takahashi (author) (Search by this author);Hidenori Kuwata (author) (Search by this author)Taichi Abe (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2020-11-06
- Updated at
- 2024-04-05 10:56:21 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- Journal article
- Creator
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Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
;
Kazuhiro Hono (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- Date published
- 2023-02-19
- Updated at
- 2025-02-23 22:51:16 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
- Journal article
- Creator
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;Hirokazu Sasaki (author) (Search by this author);Syunta Akiya (author) (Search by this author);Kuniteru Mihara (author) (Search by this author);Yojiro Oba (author) (Search by this author);Masato Onuma (author) (Search by this author)Jun Uzuhashi (author) (Search by this author)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (Search by this author)National Institute for Materials Science
- Keyword
- atom probe tomography
- Date published
- 2025-01-01
- Updated at
- 2025-01-08 16:31:18 +0900