Keyword: atom probe tomography
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8 records found.

Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesised SnSe2 Nanosheets.pdf
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
Journal article
Creator
Simon Moore (author) (Search by this author)
;
Mari Takahashi (author) (Search by this author)
ORCID ;
Philipp Sauerschnig (author) (Search by this author)
ORCID ;
Keiji Kobayashi (author) (Search by this author)
;
Koichi Higashimine (author) (Search by this author)
;
Masanobu Miyata (author) (Search by this author)
;
Takahiro Baba (author) (Search by this author)
; ORCID SAMURAI ;
Michihiro Ohta (author) (Search by this author)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ;
Shinya Maenosono (author) (Search by this author)
ORCID
Keyword
thermoelectric materials, electron microscopy, atom probe tomography
Date published
2024-09-09
Updated at
2025-08-26 08:30:23 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography.pdf
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
Journal article
Creator
Akira Uedono (author) (Search by this author)
ORCID ;
Claudia Fleischmann (author) (Search by this author)
ORCID ;
Jean-Philippe Soulié (author) (Search by this author)
;
Mustafa Ayyad (author) (Search by this author)
;
Jeroen E. Scheerder (author) (Search by this author)
ORCID ;
Christoph Adelmann (author) (Search by this author)
; ORCID SAMURAI ; ORCID SAMURAI ;
Koji Michishio (author) (Search by this author)
ORCID ;
Nagayasu Oshima (author) (Search by this author)
;
Shoji Ishibashi (author) (Search by this author)
ORCID
Keyword
atom probe tomography, positron annihilation
Date published
2024-07-10
Updated at
2025-07-10 08:30:19 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy, automation
Date published
2023-02-19
Updated at
2025-02-23 22:51:16 +0900
66_MT-D2024005.pdf
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
Journal article
Creator
Hirokazu Sasaki (author) (Search by this author)
;
Syunta Akiya (author) (Search by this author)
;
Kuniteru Mihara (author) (Search by this author)
;
Yojiro Oba (author) (Search by this author)
;
Masato Onuma (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography
Date published
2025-01-01
Updated at
2025-01-08 16:31:18 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
Journal article
Creator
Emi Kano (author) (Search by this author)
;
Keita Kataoka (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenta Chokawa (author) (Search by this author)
;
Hideki Sakurai (author) (Search by this author)
;
Akira Uedono (author) (Search by this author)
;
Tetsuo Narita (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Ritsuo Otsuki (author) (Search by this author)
;
Koki Kobayashi (author) (Search by this author)
;
Yuta Itoh (author) (Search by this author)
;
Masahiro Nagao (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Suda (author) (Search by this author)
;
Tetsu Kachi (author) (Search by this author)
;
Nobuyuki Ikarashi (author) (Search by this author)
Keyword
gallium nitride, transmission electron microscopy, atom probe tomography
Date published
2022-08-14
Updated at
2024-01-05 22:13:58 +0900
Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
Journal article
Creator
Emi Kano (author) (Search by this author)
ORCID ;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Koki Kobayashi (author) (Search by this author)
;
Kosuke Ishikawa (author) (Search by this author)
;
Kyosuke Sawabe (author) (Search by this author)
;
Tetsuo Narita (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tetsu Kachi (author) (Search by this author)
;
Nobuyuki Ikarashi (author) (Search by this author)
ORCID
Keyword
gallium nitride, atom probe tomography, transmission electron microscopy
Date published
2024-04-22
Updated at
2024-09-20 16:30:27 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
Research Center for Magnetic and Spintronic Materials/Administrative Office, National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (Search by this author)
Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group, National Institute for Materials Science
ORCID SAMURAI ;
Ryo Tanaka (author) (Search by this author)
Fuji Electric Corporation
;
Shinya Takashima (author) (Search by this author)
Fuji Electric Corporation
;
Masaharu Edo (author) (Search by this author)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (Search by this author)
Research Center for Magnetic and Spintronic Materials, National Institute for Materials Science
ORCID SAMURAI ;
Takashi Sekiguchi (author) (Search by this author)
University of Tsukuba
Keyword
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
Date published
2024-08-07
Updated at
2024-08-03 08:30:15 +0900