Crystallographic and Electronic Structures of Nb:YTaO4 and Tb:YTaO4 Single-Crystal Scintillators
- Journal article
- Creator
-
Yueshen Zhou (author) (Search by this author)
;
;Encarnación G. Víllora (author) (Search by this author)Ryoji Sahara (author) (Search by this author)
;
Arkapol Saengdeejing (author) (Search by this author)
;
Kiyoshi Shimamura (author) (Search by this author)
- Keyword
- Single-crystal structure analysis, DFT, Tb:YTaO4, XPS, Nb:YTaO4
- Date published
- 2025-07-31
- Updated at
- 2025-08-01 10:06:22 +0900
全固体リチウムイオン電池配置でのSi負極のオペランド反応解析
- Journal article
- Creator
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増田 卓也 (author) (Search by this author)National Institute for Materials Science
- Keyword
- オペランド, in situ, XPS, AFM
- Date published
- Updated at
- 2024-12-06 17:17:59 +0900
実験室型 XPS 装置による溶液種の観察と全固体電池の実働環境計測
- Journal article
- Creator
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;遠藤 頼夢 (author) (Search by this author)National Institute for Materials Science増田 卓也 (author) (Search by this author)National Institute for Materials Science
- Keyword
- オペランド, in situ, XPS
- Date published
- 2023-08-07
- Updated at
- 2024-12-02 16:30:52 +0900
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
- Dataset
- Creator
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SUMIYA, Masatomo (author) (Search by this author)National Institute for Materials Science
- Keyword
- XPS, SPring-8 BL15, Si
- Date published
- Updated at
- 2024-05-24 08:30:24 +0900
Determination of Inelastic Mean Free Paths in Elemental Solids in the 200 to 5000 eV Energy Range by Absolute Elastic Peak Electron Spectroscopy
- Conference presentation
- Creator
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Tanuma，S (author) (Search by this author)
;
;Okamoto, N (author) (Search by this author)物質・材料研究機構;Azuma, Y (author) (Search by this author);Kimura, T (author) (Search by this author)物質・材料研究機構Goto, K (author) (Search by this author)名古屋工業大学
- Keyword
- IMFP, TPP-2M, AES, XPS
- Date published
- 2006-09-24
- Updated at
- 2023-07-07 09:23:43 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
- Dataset
- Creator
-
SUMIYA, Masatomo (author) (Search by this author)National Institute for Materials Science
- Keyword
- GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
- Date published
- 2022-12-31
- Updated at
- 2024-01-05 22:11:14 +0900
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
- Dataset
- Creator
-
SUMIYA, Masatomo (author) (Search by this author)National Institute for Materials Science
- Keyword
- GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
- Date published
- 2020-11-19
- Updated at
- 2024-01-05 22:13:22 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- Journal article
- Creator
-
TANUMA, Shigeo (author) (Search by this author)
- Keyword
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- Date published
- 2005-12-28
- Updated at
- 2024-01-05 22:11:34 +0900