10 件のレコードが見つかりました。
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
- ジャーナル論文
- 著者
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J. W. Liu (author) (この著者で検索)National Institute for Materials Science
;
T. Teraji (author) (この著者で検索)National Institute for Materials Science
;
B. Da (author) (この著者で検索)National Institute for Materials Science
;
Y. Koide (author) (この著者で検索)National Institute for Materials Science
- キーワード
- binding energy calibration, carbon-related materials, XPS, diamond, Band bending
- 刊行年月日
- 2024-09-02
- 更新時刻
- 2024-09-13 12:30:32 +0900
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
- データセット
- 著者
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SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- XPS, SPring-8 BL15, Si
- 刊行年月日
- 更新時刻
- 2024-05-24 08:30:24 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
- データセット
- 著者
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SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
- 刊行年月日
- 2022-12-31
- 更新時刻
- 2024-01-05 22:11:14 +0900
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
- データセット
- 著者
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SUMIYA, Masatomo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
- 刊行年月日
- 2020-11-19
- 更新時刻
- 2024-01-05 22:13:22 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- ジャーナル論文
- 著者
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Tanuma, Shigeo (author) (この著者で検索)
;
Powell, C. J. (author) (この著者で検索)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (この著者で検索) - キーワード
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- 刊行年月日
- 2003-02-11
- 更新時刻
- 2022-10-03 01:54:38 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ジャーナル論文
- 著者
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TANUMA, Shigeo (author) (この著者で検索)
- キーワード
- XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
- 刊行年月日
- 2005-12-28
- 更新時刻
- 2024-01-05 22:11:34 +0900