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531.
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Quantitative Evaluation of the Surface Roughness Caused by Ion Sputtering
Description/Abstract:
We have conducted Auger depth profiling analyses of InP/GaInAsP multilayer specimens, in which the surface roughness was caused by the ar...
Keyword:
Auger depth profiling analysis
,
InP/GaInAsP multilayer specimens
,
surface roughness
,
atomic force microscope
, and
depth resolution function
Material/Specimen:
InP/GaInAsP multilayer specimens
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
532.
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
Description/Abstract:
We have investigated the dependence of the depth resolution of Auger depth profiles of InP/GaInAsP multilayer specimens on the sputtering...
Keyword:
Auger depth profiling analysis
,
InP/GaInAsP multilayer specimens
, and
argon ion sputtering
Material/Specimen:
InP/GaInAsP multilayer specimens
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
533.
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Using Non-Negative Least Square Curve Fitting
Description/Abstract:
We have carried out the Auger depth profiling analysis of GaAs/AIAs multilayer structure using the peaks of GaMVV and A1LVV. Since the tw...
Keyword:
Auger depth profiling analysis
,
GaAs/AlAs multilayer
,
non-negative least-square curve fit
, and
peak separation
Material/Specimen:
GaAs/AlAs multilayer
Resource Type:
Article
Author:
OGIWARA, Toshiya
and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
534.
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam
Description/Abstract:
It is very difficult to obtained the Auger depth profile of InP multilayer structures with argon ion sputtering because the very large su...
Keyword:
Auger Depth Profiling Analysis
,
Argon Ion Spot Beam
, and
InP/GaInAsP Multilayer Specimen
Material/Specimen:
InP/GaInAsP Multilayer
Resource Type:
Article
Author:
OGIWARA, Toshiya
,
HARADA, Tomoko
, and
TANUMA, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
01/10/2021
Date Modified:
01/10/2021
535.
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Effects of Zalar Rotation and Liquid Nitrogen Cold Stage
Description/Abstract:
We have investigated the Auger depth profiling analysis of InP/GaInAsP multilayer specimens. It is difficult to obtain the Auger depth pr...
Keyword:
Auger Depth Profiling Analysis
,
InP/GaInAsP Multilayers
,
Zalar Rotation Method
, and
Sample Cooling Method
Material/Specimen:
InP/GaInAsP Multilayers
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Tanuma, Shigeo
,
Nagasawa, Yuji
, and
Ikeo, Nobuyuki
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
09/09/2021
Date Modified:
09/09/2021
536.
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder
Description/Abstract:
We developed a 85°-high-angle inclined specimen holder which enabled the specimen surface to be irradiated by both electron and ion beams...
Keyword:
Auger Depth Profiling Analysis
,
Inclined Holder
,
GaAs/AlAs Superlattice
, and
Si/Ge multiple delta-doped layers
Material/Specimen:
GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Nagatomi, Takaharu
,
Kim, Kyung Joong
, and
Tanuma, Shigeo
Journal:
Journal of The Surface Science Society of Japan
Date Uploaded:
08/09/2021
Date Modified:
08/09/2021
537.
Emergent dynamics of neuromorphic nanowire networks
Description/Abstract:
Neuromorphic networks are formed by random self-assembly of silver nanowires. Silver nanowires are coated with a polymer layer after synt...
Keyword:
Emergent dynamics
,
Neuromorphic network
,
Nanowire
,
Silver nanowire
,
Topology
,
Memory
, and
Neuromorphic computing
Material/Specimen:
Silver (Ag) nanowire coated with polyvinilpirrolydone (PVP)
Resource Type:
Article
Author:
Diaz-Alvarez, Adrian
,
Higuchi, Rintaro
,
Sanz-Leon, Paula
,
Marcus, Ido
,
Shingaya, Yoshitaka
,
Stieg, Adam Z.
,
Gimzewski, James K.
,
Kuncic, Zdenka
, and
Nakayama, Tomonobu
Journal:
Scientific Reports
Date Uploaded:
27/08/2021
Date Modified:
27/08/2021
538.
IoT データ収集システムのデータアーキテクチャ
Description/Abstract:
With the development of data-driven research, an efficient and practical data collection system is required. National Institute for Mater...
Keyword:
データアーキテクチャ
,
IoT
,
データ収集システム
,
メタデータ
, and
XML スキーマ
Resource Type:
Article
Author:
MATSUNAMI, Shigeyuki
,
MATSUDA, Asahiko
,
CHIKYOW, Toyohiro
,
HARADA, Yoshitomo
, and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
26/08/2021
Date Modified:
26/08/2021
539.
CASベースのRDM認証・認可機構の漸増開発とアセスメント評価
Description/Abstract:
Research Data Management (RDM) at National Institute for Materials Science has been developed to support a whole of activities in life cy...
Keyword:
研究データ管理
and
認証・認可
Resource Type:
Article
Author:
KIKUCHI, Shinji
,
NAITO, Hiroyuki
,
KADOHIRA, Takuya
, and
TANAFUJI, Mikiko
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
25/08/2021
Date Modified:
25/08/2021
540.
材料データプラットフォームシステムDICEにおける研究データフローの構築―実践と課題
Description/Abstract:
In response to a progress of data-driven science in the materials science field, NIMS (National Institute for Materials Science) started ...
Keyword:
研究データ
,
データフロー
,
相互利用 FAIR
,
材料データプラットフォーム DICE
,
データ リポジトリ
,
メタデータスキーマ
, and
マテリアル・インフォマティクス
Resource Type:
Article
Author:
TANIFUJI, Mikiko
and
YOSHIKAWA, Hideki
Journal:
情報処理学会論文誌デジタルプラクティス
Date Uploaded:
25/08/2021
Date Modified:
25/08/2021
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609
Collection
Research Highlights
80
MANA E-BULLETIN
15
The history of DICE and NIMS Digital Library
10
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IMFP
17
nanomechanical sensors
13
Spintronics
11
Nanosheets
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Auger Depth Profiling Analysis
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530
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43
Elsevier BV
41
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38
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34
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609
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In Copyright
267
Creative Commons BY Attribution 4.0 International
206
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43
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
39
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»
Material/Specimen
HfO2
2
InP/GaInAsP multilayer specimens
2
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
1
C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
1
26-n-paraffin
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2005
6
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5
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4
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3
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Creator
TODOROKI, Shin-ichi
12
轟 眞市
9
INOUE, Satoru
8
田邉 浩介
2
MATSUMOTO, T.
1
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Creators
»
Author
International Center for Materials Nanoarchitectonics (WPI-MANA)
95
Ikumu Watanabe
28
Tanuma, Shigeo
18
Kosuke Minami
17
Yuichi Oshima
16
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MOTEKI, Fuma
1
License
http://rightsstatements.org/vocab/InC/1.0/
14
https://creativecommons.org/licenses/by/4.0/
7
https://creativecommons.org/licenses/by-nc-nd/4.0/
4
https://creativecommons.org/licenses/by-nc/4.0/
2
http://opensource.org/licenses/MIT
1
Funder
Japan Society for the Promotion of Science
42
JSPS
39
JST
23
Japan Science and Technology Agency
14
JSPS KAKENHI
8
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Journal
Physical Review B
22
JOURNAL OF APPLIED PHYSICS
10
Journal of Surface Analysis
10
Science and Technology of Advanced Materials
10
Scientific Reports
10
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