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Surface Analysis Society of Japan
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Hol...
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle In...
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence ...
電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討- and Electron microprobe analysis of...
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Auger Depth Profiling Analysis
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Ultra Low Angle Incidence Ion Beam
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HfO2/Si
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Auger Depth Profiling analysis
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Depth Resolution
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Japanese
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English
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Surface Analysis Society of Japan
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In Copyright
8
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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Material/Specimen
HfO2
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FeNi/CoFeB/FeNi Thin Film
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GaAs
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GaAs/AlAs Superlattice
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GaP
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Date accepted
2017
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Author
Ogiwara, Toshiya
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Tanuma, Shigeo
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Yoshikawa, Hideki
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Nagata, Takahiro
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Imai, Motoharu
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https://creativecommons.org/licenses/by-nc-nd/4.0/
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Journal
Journal of Surface Analysis
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Journal of Surface Analysis
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