資源タイプ: データセット
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29 件のレコードが見つかりました。 1件目から10件目まで表示します。

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GaN_H2O.jpg
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
刊行年月日
2022-12-31
更新時刻
2024-01-05 22:11:14 +0900
Supporting_information_250901.pdf
Quantifying the Thresholds of the Phospholipid Surface Density for Nonspecific Protein Adsorption and Desorption at the Triacylglycerol/Water Interface
データセット
著者
ORCID SAMURAI
キーワード
Lipid droplets, triacylglycerol, oil/water interface, protein
刊行年月日
2025-09-23
更新時刻
2025-09-24 16:30:26 +0900
GaN_O2.jpg
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
刊行年月日
2020-11-19
更新時刻
2024-01-05 22:13:22 +0900
Keyun Gu IEEE-NEMS 20231214-check Liao-R.docx
Ultrahigh Responsivity of Diamond-based Solar-blind Photodetectors Using Hydrogen Plasma Treatment
データセット
著者
Keyun Gu (author) (この著者で検索)
;
Zilong Zhang (author) (この著者で検索)
;
Guo Chen (author) (この著者で検索)
;
Liwen Sang (author) (この著者で検索)
;
Jian Huang (author) (この著者で検索)
;
Yasuo Koide (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Meiyong Liao (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Diamond, photodetector
刊行年月日
2024-05-02
更新時刻
2024-10-11 14:30:31 +0900
Dataset
Electrodeposited copper film data
データセット
著者
Ryo Tamura (author) (この著者で検索)
National Institute for Materials Science
;
Ryuichi Inaba (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Mami Watanabe (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Yutaro Mori (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Makoto Urushihara (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Kenji Yamaguchi (author) (この著者で検索)
Mitsubishi Materials Corporation
;
Shoichi Matsuda (author) (この著者で検索)
National Institute for Materials Science
キーワード
Electrodeposition, copper film
刊行年月日
更新時刻
2024-10-30 16:30:48 +0900
Dataset
Machine learning prediction of coordination energies for alkali group elements in battery electrolyte solvents
データセット
著者
ORCID SAMURAI ; ORCID SAMURAI ;
IGARASHI, Yasuhiko (author) (この著者で検索)
ORCID ;
NAKAYAMA, Tomofumi (author) (この著者で検索)
ORCID ; ORCID SAMURAI ;
OKADA, Masato (author) (この著者で検索)
ORCID
キーワード
quantum chemistry, electrolyte, battery
刊行年月日
2019-11-18
更新時刻
2024-01-05 22:13:39 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
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