キーワード: transmission electron microscopy
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15 件のレコードが見つかりました。 1件目から10件目まで表示します。

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Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
;
Keita Kataoka (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kenta Chokawa (author) (この著者で検索)
;
Hideki Sakurai (author) (この著者で検索)
;
Akira Uedono (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Ritsuo Otsuki (author) (この著者で検索)
;
Koki Kobayashi (author) (この著者で検索)
;
Yuta Itoh (author) (この著者で検索)
;
Masahiro Nagao (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Suda (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
キーワード
gallium nitride, transmission electron microscopy, atom probe tomography
刊行年月日
2022-08-14
更新時刻
2024-01-05 22:13:58 +0900
Systematic study of FIB-induced damage for the high-quality TEM sample preparation.pdf
Systematic study of FIB-induced damage for the high-quality TEM sample preparation
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
focused ion beam, transmission electron microscopy
刊行年月日
2024-04-26
更新時刻
2024-05-07 15:32:35 +0900
Atomic-scale observation of native oxides on c- and m-faced GaN surfaces.pdf
Atomic-scale observation of native oxides on c - and m -faced GaN surfaces
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Yasuo Koide (author) (この著者で検索)
; ORCID SAMURAI
キーワード
transmission electron microscopy, gallium nitride
刊行年月日
2026-04-01
更新時刻
2026-04-02 10:10:21 +0900
著者最終版.pdf
Tetracene Inclusion in Boron Nitride Nanotubes for Photoluminescence Property Modulation Based on Aggregated State Control in Their Nanocavity
ジャーナル論文
著者
Hayato Saeki (author) (この著者で検索)
ORCID ;
Takumi Ehara (author) (この著者で検索)
ORCID ;
Kiyoshi Miyata (author) (この著者で検索)
ORCID ;
Toshikazu Ono (author) (この著者で検索)
ORCID ;
Satoru Emoto (author) (この著者で検索)
;
Hiroki Ago (author) (この著者で検索)
ORCID ;
Aki Masaoka (author) (この著者で検索)
;
Yoichi Sasaki (author) (この著者で検索)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ;
Tsuyohiko Fujigaya (author) (この著者で検索)
ORCID ;
Tomohiro Shiraki (author) (この著者で検索)
ORCID
キーワード
photoluminescence, transmission electron microscopy, host-guest chemistry, boron nitride nanotubes
刊行年月日
2025-07-31
更新時刻
2025-08-04 08:57:45 +0900
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier.pdf
Magneto-transport properties in perpendicularly magnetized magnetic tunnel junctions using an Mg40Fe10O50 tunnel barrier
ジャーナル論文
著者
Tatsuya Yamamoto (author) (この著者で検索)
;
Tomohiro Ichinose (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Takayuki Nozaki (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kay Yakushiji (author) (この著者で検索)
;
Shingo Tamaru (author) (この著者で検索)
;
Hitoshi Kubota (author) (この著者で検索)
;
Shinji Yuasa (author) (この著者で検索)
キーワード
transmission electron microscopy
刊行年月日
2024-02-09
更新時刻
2026-02-09 12:30:04 +0900
s41467-024-45934-4.pdf
Latent ion tracks were finally observed in diamond
ジャーナル論文
著者
H. Amekura (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
A. Chettah (author) (この著者で検索)
ORCID ;
K. Narumi (author) (この著者で検索)
ORCID ;
A. Chiba (author) (この著者で検索)
;
Y. Hirano (author) (この著者で検索)
;
K. Yamada (author) (この著者で検索)
;
S. Yamamoto (author) (この著者で検索)
;
A. A. Leino (author) (この著者で検索)
ORCID ;
F. Djurabekova (author) (この著者で検索)
ORCID ;
K. Nordlund (author) (この著者で検索)
ORCID ;
N. Ishikawa (author) (この著者で検索)
;
N. Okubo (author) (この著者で検索)
;
Y. Saitoh (author) (この著者で検索)
キーワード
ion track, diamond, C60 ion, transmission electron microscopy, velocity effect
刊行年月日
2024-02-27
更新時刻
2024-03-04 16:30:07 +0900
Uzuhashi_2025_ECS_J._Solid_State_Sci._Technol._14_085001.pdf
Observation of Atomic-Scale Structural Changes in Al2O3/GaN Interfacial Layers Prepared with a Dummy-SiO2 Process
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Yasuo Koide (author) (この著者で検索)
キーワード
transmission electron microscopy, metal-oxide-semiconductor
刊行年月日
2025-08-01
更新時刻
2025-08-26 11:15:20 +0900
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam.pdf
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
ジャーナル論文
著者
Shuai Tang (author) (この著者で検索)
; ORCID SAMURAI ;
Yimeng Wu (author) (この著者で検索)
;
You-Hu Chen (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Lu-Chang Qin (author) (この著者で検索)
キーワード
electron emission, transmission electron microscopy, focused ion beam
刊行年月日
2025-03-06
更新時刻
2025-04-12 08:30:10 +0900
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled STEM lamella preparation via FIB-SEM.pdf
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
ジャーナル論文
著者
ORCID SAMURAI ;
Yuanzhao Yao (author) (この著者で検索)
; ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
キーワード
transmission electron microscopy, scanning electron microscopy, focused ion beam
刊行年月日
2025-08-01
更新時刻
2026-01-31 16:30:04 +0900
Physica Rapid Research Ltrs - 2024 - Kano - Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution.pdf
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano (author) (この著者で検索)
ORCID ;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Koki Kobayashi (author) (この著者で検索)
;
Kosuke Ishikawa (author) (この著者で検索)
;
Kyosuke Sawabe (author) (この著者で検索)
;
Tetsuo Narita (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tetsu Kachi (author) (この著者で検索)
;
Nobuyuki Ikarashi (author) (この著者で検索)
ORCID
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
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