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Resource type
Journal article(4)
Keyword
atom probe tomography (4)
transmission electron microscopy (3)
InGaN (1)
dislocation (1)
focused ion beam (1)
nanocrystalline soft magnetic material (1)
pipe diffusion (1)
quantum dot (1)
scanning electron microscopy (1)
(more)
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In Copyright (3)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
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application/pdf (4)
Keyword: atom probe tomography
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An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Journal article
Creator
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
Keyword
atom probe tomography
,
focused ion beam
,
scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
Journal article
Creator
Yudai Yamaguchi
(author) (
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)
Yudai Yamaguchi
;
Yuya Kanitani
(author) (
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)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
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)
Yoshihiro Kudo
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Shigetaka Tomiya
(author) (
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)
Shigetaka Tomiya
Keyword
InGaN
,
dislocation
,
pipe diffusion
,
atom probe tomography
,
transmission electron microscopy
Date published
2022-09-14
Updated at
2024-01-05 22:12:51 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
Journal article
Creator
Yudai Yamaguchi
(author) (
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)
Yudai Yamaguchi
;
Yuta Inaba
(author) (
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)
Yuta Inaba
;
Ryoji Arai
(author) (
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)
Ryoji Arai
;
Yuya Kanitani
(author) (
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)
Yuya Kanitani
;
Yoshihiro Kudo
(author) (
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)
Yoshihiro Kudo
;
Michinori Shiomi
(author) (
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)
Michinori Shiomi
;
Daiji Kasahara
(author) (
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)
Daiji Kasahara
;
Mikihiro Yokozeki
(author) (
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)
Mikihiro Yokozeki
;
Noriyuki Fuutagawa
(author) (
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)
Noriyuki Fuutagawa
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Kouichi Akahane
(author) (
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)
Kouichi Akahane
;
Naokatsu Yamamoto
(author) (
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)
Naokatsu Yamamoto
;
Shigetaka Tomiya
(author) (
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)
Shigetaka Tomiya
Keyword
quantum dot
,
atom probe tomography
,
transmission electron microscopy
Date published
2024-04-11
Updated at
2025-04-14 16:30:23 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
Journal article
Creator
Shozo Hiramoto
(author) (
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)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
Shozo Hiramoto
;
Satoshi Okamoto
(author) (
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)
Satoshi Okamoto
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Akihiko Toda
(author) (
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)
Akihiko Toda
;
Sangwook Kim
(author) (
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)
Sangwook Kim
;
Chikako Moriyoshi
(author) (
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)
Chikako Moriyoshi
;
Yoshihiro Kuroiwa
(author) (
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)
Yoshihiro Kuroiwa
Keyword
atom probe tomography
,
transmission electron microscopy
,
nanocrystalline soft magnetic material
Date published
2025-02-10
Updated at
2026-02-11 08:30:29 +0900
Keyword
atom probe tomography
(4)
transmission electron microscopy
(3)
InGaN
(1)
dislocation
(1)
focused ion beam
(1)
nanocrystalline soft magnetic material
(1)
pipe diffusion
(1)
quantum dot
(1)
scanning electron microscopy
(1)
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Collection
Resource type
Journal article(4)
Keyword
atom probe tomography (4)
transmission electron microscopy (3)
InGaN (1)
dislocation (1)
focused ion beam (1)
nanocrystalline soft magnetic material (1)
pipe diffusion (1)
quantum dot (1)
scanning electron microscopy (1)
(more)
License
In Copyright (3)
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (1)
File type
application/pdf (4)